Journal of Process Control

Journal of Process Control, Vol.22, No.2 Entire volume, number list

ISSN: 0959-1524 (Print)

In this Issue (15 articles)

359 - 374	Model-reference robust tuning of 2DoF PI controllers for first- and second-order plus dead-time controlled processes Alfaro VM, Vilanova R
375 - 389	A new approach for nonlinear process identification using orthonormal bases and ordinal splines MacArthur JW
390 - 396	Improved switching for multiple model adaptive controller in noisy environment Bashivan P, Fatehi A
397 - 403	Nonparametric profile monitoring in multi-dimensional data spaces Hung YC, Tsai WC, Yang SF, Chuang SC, Tseng YK
404 - 411	New spatial basis functions for the model reduction of nonlinear distributed parameter systems Deng H, Jiang M, Huang CQ
412 - 422	Lyapunov-based control of non isothermal continuous stirred tank reactors using irreversible thermodynamics Hoang H, Couenne F, Jallut C, Le Gorrec Y
423 - 435	Multiple-model based predictive control of nonlinear hybrid systems based on global optimization using the Bernstein polynomial approach Patil BV, Bhartiya S, Nataraj PSV, Nandola NN
436 - 449	Fault diagnosis using pattern classification based on one-dimensional adaptive rank-order morphological filter Li H, Xiao DY
450 - 462	Designing priors for robust Bayesian optimal experimental design Tulsyan A, Forbes JF, Huang BA
463 - 469	Norm-bounded integrity conditions of uncertain multivariable linear time-invariant systems under decentralized control with integral action Firouzbahrami M, Nobakhti A
470 - 476	Robustness of fuzzy PID controller due to its inherent saturation Duan XG, Li HX, Deng H
477 - 487	Dimension reduction method of independent component analysis for process monitoring based on minimum mean square error Wang JC, Zhang YB, Cao H, Zhu WZ
488 - 493	Local self-optimizing control of constrained processes Hu WH, Umar LM, Xiao GX, Kariwala V
494 - 507	How to verify optimal controls computed by direct shooting methods? - A tutorial Hannemann-Tamas R, Marquardt W
508 - 517	Deterministic and stochastic model based run-to-run control for batch processes with measurement delays of uncertain duration Chen JH, Munoz J, Cheng N