1 - 8 |
Performance Modeling of the Ballard-Mark-IV Solid Polymer Electrolyte Fuel-Cell .1. Mechanistic Model Development Amphlett JC, Baumert RM, Mann RF, Peppley BA, Roberge PR, Harris TJ |
9 - 15 |
Performance Modeling of the Ballard-Mark-IV Sold Polymer Electrolyte Fuel-Cell .2. Empirical-Model Development Amphlett JC, Baumert RM, Mann RF, Peppley BA, Roberge PR, Harris TJ |
16 - 19 |
Chemical-Stability of Solutions of Niobium-V in Molten NaCl-KCl at 750-Degrees-C Arurault L, Bouteillon J, Poignet JC |
20 - 26 |
In-Situ Raman-Study on Electrochemical Li-Intercalation into Graphite Inaba M, Yoshida H, Ogumi Z, Abe T, Mizutani Y, Asano M |
26 - 33 |
In-Situ Spectroelectrochemical Studies on the Sulfur-Dioxide Reduction in Dimethylsulfoxide Kim BS, Park SM |
34 - 40 |
Spectroelectrochemical Studies on the Reduction of Thionyl Chloride Kim BS, Park SM |
40 - 45 |
Electrochemical Oxidation of Ethanol in Aqueous Carbonate Solutions Park SM, Chen NC, Doddapaneni N |
46 - 51 |
X-Ray-Absorption Studies of the Effect of Plasticizers on Ion-Pair Dissociation in a Poly(Ethylene Oxide) Potassium-Salt Complex Yang XQ, Lee HS, Hanson LK, Mcbreen J, Xu ZS, Skotheim TA, Okamoto Y, Lu F |
51 - 58 |
The Electrochemical-Behavior of the Al3Ta Intermetallic Compound and Pitting in 2-Phase Al-Ta Alloys Buchheit RG, Zavadil KR, Scully JR, Knight TO |
58 - 63 |
Hydrogen Sensing with Thin-Filmed Copper Dicyanoanthraquinone Diimine Electrodes Wang CM, Wang WY, Lin HL, Liu LK |
64 - 69 |
Current Distribution at the Electrodes in Zinc Electrowinning Cells Bouzek K, Borve K, Lorentsen OA, Osmundsen K, Rousar I, Thonstad J |
70 - 74 |
Residual-Stress Measurements in Electrolytic Copper-Nickel Compositionally Modulated Multilayers Celis JP, Vanacker K, Callewaert K, Vanhoutte P |
74 - 81 |
An X-Ray Photoelectron Spectroscopic Study of the Passive Film Formed on Pure Mo and Mosi2 in 4M HCl Halada GP, Clayton CR, Herman H, Sampath S, Tiwari R |
81 - 87 |
Fabrication of Gold Bumps Using Gold Sulfite Plating Honma H, Hagiwara K |
87 - 91 |
The Effects of Aeration and Accumulation of Carbonate Ions on the Mechanical-Properties of Electroless Copper Coatings Matsuoka M, Yoshida Y, Iwakura C |
91 - 96 |
The Electrochemical-Behavior of Electroless-Plated Ni-P Alloys in Concentrated NaOH Solution Lo PH, Tsai WT, Lee JT, Hung MP |
97 - 101 |
Optimization of Porosity and Thickness of a Battery Electrode by Means of a Reaction-Zone Model Newman J |
L1 - L2 |
Ambient-Temperature, Rechargeable, All-Solid Lithium Polypyrrole Polymer Battery Kakuda S, Momma T, Osaka T, Appetecchi GB, Scrosati B |
L3 - L5 |
Layered Polyaniline Composites with Cation-Exchanging Properties for Positive Electrodes of Rechargeable Lithium Batteries Morita M, Miyazaki S, Ishikawa M, Matsuda Y, Tajima H, Adachi K, Anan F |
L6 - L8 |
A New Charge Storage Mechanism for Electrochemical Capacitors Zheng JP, Jow TR |
L8 - L11 |
The Effect of the Hydrostatic-Pressure on the Ionic-Conductivity in a Perovskite Lanthanum Lithium Titanate Inaguma Y, Yu JD, Shan YJ, Itoh M, Nakamura T |
102 - 111 |
The Wavelength and Potential Dependency of Spatially-Resolved Photoelectrochemical Measurements on TiO2 Preusser S, Stimming U, Tokunaga S |
112 - 119 |
An Analytical Description of the Consequences of Abandoning the Principles of Detailed Balance and Microscopic Reversibility in Semiconductor Photoelectrochemistry Shreve GA, Lewis NS |
120 - 124 |
Chemical-Reactions in Phases at Different Electric Potentials Alberty RA |
125 - 129 |
Proton Deficiency in a Phosphoric-Acid Fuel-Cell Aragane J, Urushibata H, Murahashi T |
130 - 135 |
Electrolytic Carbonylation of Methanol over the Cucl2 Anode in the Gas-Phase Otsuka K, Yagi T, Yamanaka I |
136 - 142 |
A New Oscillatory Electrochemical Phenomenon Observed in the Electropolymerization of Pyrrole in Mecn+n(Bu)(4)PF6 on an Iron Electrode Studied by the Ring-Disk-Electrode Technique Petitjean J, Aeiyach S, Ferreira CA, Lacaze PC, Takenouti H |
142 - 148 |
Electrochemical Impedance Study of Platinum-Electrode in Fused Na2SO4 10-Mole Percent NaVO3 Melts Zheng XJ, Rapp RA |
148 - 153 |
Preparation of Perovskite-Type Oxides of Cobalt by the Malic-Acid Aided Process and Their Electrocatalytic Surface-Properties in Relation to Oxygen Evolution Tiwari SK, Chartier P, Singh RN |
154 - 156 |
Hydrogen-Atom Direct-Entry Mechanism into Metal Membranes Zheng G, Popov BN, White RE |
157 - 160 |
Humidity Dependence of Carbon-Monoxide Oxidation Rate in a Nafion-Based Electrochemical-Cell Lee SB, Cocco A, Keyvani D, Maclay GJ |
161 - 165 |
Theoretical-Analysis of the Electromotive-Force of a Cell Incorporating a Composition Gradient Solid-Electrolyte Mukhopadhyay S, Jacob KT |
166 - 169 |
Preparation and Characterization of Copper-Films Deposited in Hydrogen Remote Plasma by Copper(II) Acetylacetonate Aoki T, Wickramanayaka S, Wrobel AM, Nakanishi Y, Hatanaka Y |
170 - 176 |
The Band Model and the Etching Mechanism of Silicon in Aqueous KOH Chen LC, Chen MJ, Lien CH, Wan CC |
177 - 182 |
The Processing Windows for Selective Copper Chemical-Vapor-Deposition from Cu(Hexafluoroacetylacetonate)Trimethylvinylsilane Chiou JC, Juang KC, Chen MC |
183 - 185 |
The Oxidation of Chemically Vapor-Deposited Silicon-Nitride and Silicon-Nitride Coated Graphite Fergus JW, Worrell WL |
186 - 190 |
PECVD Silicon-Nitride as a Gate Dielectric for Amorphous-Silicon Thin-Film-Transistor - Process and Device Performance Kuo Y |
191 - 195 |
Soft Cleaning by in Vacuo Ultraviolet-Radiation Combined with Molecular-Hydrogen Gas Before Molecular-Beam Epitaxial Layer Growth Lippert G, Thieme HJ, Osten HJ |
195 - 201 |
Hydrogen in Porous Silicon - Vibrational Analysis of Sihx Species Ogata Y, Niki H, Sakka T, Iwasaki M |
202 - 206 |
Effect of Stress in the Deposited Silicon-Nitride Films on Boron-Diffusion of Silicon Osada K, Zaitsu Y, Matsumoto S, Yoshida M, Arai E, Abe T |
206 - 211 |
Electrical Characterization and Surface-Analysis of Dry Etch-Induced Damage on Si After Etching in on ECR Source Sung KT, Pang SW, Cole MW, Pearce N |
211 - 216 |
Sensitive Light-Scattering as a Semiquantitative Method for Studying Photoresist Stripping Rotondaro AL, Meuris M, Schmidt HF, Heyns MM, Claeys C, Hellemans L, Snauwaert J |
216 - 226 |
Postchemical-Mechanical Planarization Cleanup Process for Interlayer Dielectric Films Roy SR, Ali I, Shinn G, Furusawa N, Shah R, Peterman S, Witt K, Eastman S, Kumar P |
226 - 231 |
Experimental-Study of Diffusion and Interface Segregation of P in an LPCVD Si-Carbon Emitter Structure Theunissen MJ, Martens MC, Clegg JB, Zalm PT, Vandenhoudt DE |
232 - 236 |
Silicon-Carbide Wafer Bonding Tong QY, Gosele U, Yuan C, Steckl AJ, Reiche M |
237 - 243 |
Selective Etching of Phosphosilicate Gloss Th Low-Pressure Vapor HF Watanabe H, Ohnishi S, Honma I, Kitajima H, Ono H, Wilhelm RJ, Sophie AJ |
244 - 248 |
Chemical-Vapor-Deposition of (Ba,Sr)TiO3 Yoshida M, Yamaguchi H, Sakuma T, Miyasaka Y, Lesaicherre PY, Ishitani A |
249 - 254 |
Solid-State Hydrogen Sensors Using Palladium-Nickel Alloys - Effect of Alloy Composition on Sensor Response Hughes RC, Schubert WT, Buss RJ |
254 - 259 |
Effects of Cu on CdTe/CdS Heterojunction Solar-Cells with Au/Cu Contacts Chou HC, Rohatgi A, Thomas EW, Kamra S, Bhat AK |
259 - 266 |
A Gas-Phase and Surface Kinetics Model for Silicon Epitaxial-Growth with Sih2Cl2 in an Rtcvd Reactor Hierlemann M, Kersch A, Werner C, Schafer H |
267 - 272 |
Influences of Interfacial Misfit Stress on Modulated Microstructures of InGaAsP/InP Heterostructures Lee JW, Kim TI, Tsakalakos T |
273 - 282 |
SiO2/Si Interface Structures and Reliability Characteristics Hasegawa E, Ishitani A, Akimoto K, Tsukiji M, Ohta N |
282 - 285 |
Ionic Contamination in Metal-Oxide-Semiconductor Al/SiO2/3C-SiC Capacitors Raynaud C, Autran JL, Briot JB, Balland B, Becourt N, Jaussaud C |
285 - 289 |
Boron Incorporation in Epitaxial Silicon Using Si2H6 and B2H6 in an Ultrahigh-Vacuum Rapid Thermal Chemical-Vapor-Deposition Reactor Sanganeria MK, Violette KE, Ozturk MC, Harris G, Maher DM |
290 - 297 |
Single-Walled Tubes and Encapsulation of Nanocrystals into Carbon Clusters Seraphin S |
298 - 302 |
Effect of SiO2 Surface-Treatment on the Solid-Phase Crystallization of Amorphous-Silicon Films Shimizu T, Ishihara S |
303 - 311 |
Low-Temperature Diffusion of Alkali-Earth Cations in Thin, Vitreous SiO2-Films Williams CK, Hamaker RW, Ganesan SG, Kuehn RT, Swartzel KR, Osullivan J |
312 - 319 |
Residue-Free Reactive Ion Etching of Silicon-Carbide in Fluorinated Plasmas .2. 6H-SiC Yih PH, Steckl AJ |
L11 - L13 |
Surface-Reaction of Fluoroalkyl-Functional Silanes on SnO2 Tada H |
L14 - L16 |
Anodic Passivation of P-InP(100) in (NH4)(2)S-X Solution Gao LJ, Bardwell JA, Lu ZH, Graham MJ, Norton PR |
L16 - L18 |
A Novel-Approach to Combine Scanning Electrochemical Microscopy and Scanning Photoelectrochemical Microscopy Casillas N, James P, Smyrl WH |
L19 - L21 |
X-Ray Diffuse-Scattering for the in-Situ Study of Electrochemically Induced Pitting on Metal-Surfaces Melendres CA, Feng YP, Lee DD, Sinha SK |