1819 - 1825 |
Adsorption and Decomposition of Diethylsilane and Diethylgermane on Si(100) - Surface-Reactions for an Atomic Layer Epitaxial Approach to Column-IV Epitaxy Kellerman BK, Mahajan A, Russell NM, Ekerdt JG, Banerjee SK, Tasch AF, Campion A, White JM, Bonser DJ |
1826 - 1830 |
Matrix Effect of Bombardment-Induced Gibbsian Segregation on Cu Depletion at a Cuxni100-X Subsurface Zheng LP, Li RS, Xia XQ, Li MQ, Li MY |
1831 - 1836 |
GaN Patterned Film Synthesis - Carbon Depletion by Hydrogen-Atoms Produced from NH3 Activated by Electron-Impact Hubner A, Lucas SR, Partlow WD, Choyke WJ, Schaefer JA, Yates JT |
1837 - 1846 |
Sulfur Layer Formation on GaAs(100) by Thermal and Photochemical H2S Dissociation Nooney MG, Liberman V, Martin RM |
1847 - 1852 |
Importance of the Surface Oxide Layer in the Reduction of Outgassing from Stainless-Steels Ishikawa Y, Yoshimura T |
1853 - 1860 |
H2O Adsorption-Kinetics on Si(111)7X7 and Si(111)7X7 Modified by Laser Annealing Wise ML, Okada LA, Sneh O, George SM |
1861 - 1866 |
Molecular-Dynamics Simulations of Fluorine Molecules Interacting with a Si(100)(2X1) Surface at 1000 K Schoolcraft TA, Diehl AM, Steel AB, Garrison BJ |
1867 - 1871 |
Thermal-Stimulated and Electron-Stimulated Chemistry of a Cyclotriphosphazene Lubricant on a Magnetic Disk with a Hard Carbon Overcoat Lin JL, Yates JT |
1872 - 1878 |
Modeling of Water Outgassing from Metal-Surfaces .3.) Li MX, Dylla HF |
1879 - 1884 |
Synchrotron-Radiation-Induced Reactions of a Condensed Layer of Silicon Alkoxide on Si Kinashi K, Niwano M, Sawahata JI, Shimoshikiryo F, Miyamoto N |
1885 - 1892 |
Photodecomposition of Poly(Methylmethacrylate) Thin-Films by Monochromatic Soft-X-Ray Radiation Tinone MC, Tanaka K, Ueno N |
1893 - 1900 |
X-Ray Photoelectron-Spectroscopy and Transmission Electron-Microscopy Studies of the NiAl/Al2O3 Interfacial Chemical Compatibility Silvain JF, Bihr JC, Alnot M, Lambert J, Ehrhardt JJ |
1901 - 1906 |
Optical-Emission Study of Reaction-Mechanisms in the Deposition of Nitrogen-Containing Amorphous Hydrogenated Carbon-Films Durrant SF, Rangel EC, Demoraes MA |
1907 - 1912 |
A Study of the Interaction Between Thermally Deposited Aluminum Films and Fluoropolymer Substrates Du YZ, Gardella JA |
1913 - 1916 |
Surface Dielectric Function of CdTe(110) Obtained by Polarized Surface Differential Reflectivity Data Cricenti A, Felici AC |
1917 - 1923 |
Characterization of Substrate-Temperature and Damage in Diamond Growth Plasmas by Multichannel Spectroellipsometry Wakagi M, Hong BG, Nguyen HV, Collins RW, Drawl W, Messier R |
1924 - 1929 |
Formation of Secondary Phases in Evaporated Cuins2 Thin-Films - A Surface Analytical Study Scheer R, Lewerenz HJ |
1930 - 1934 |
In-Situ Diagnostic for Etch Uniformity Buie MJ, Pender JT, Soniker J, Brake ML, Elta M |
1935 - 1940 |
Mass-Spectrometric Studies of Remote Helium Plasma Dissociation of Silane Jasinski JM |
1941 - 1944 |
In-Situ Production of Very-Low-Density Microporous Polymeric Foams Falconer JW, Nazarov W, Horsfield CJ |
1945 - 1958 |
Excimer-Laser Ablation Mass-Spectrometry of Inorganic Solids - Chemical, Matrix, and Sampling Effects on Polyatomic Ion Yields Gibson JK |
1959 - 1966 |
Quantitative-Analysis of Borophosphosilicate Glass-Films on Silicon Using Infrared External Reflection-Absorption Spectroscopy Franke JE, Zhang LZ, Niemczyk TM, Haaland DM, Radigan KJ |
1967 - 1969 |
Photoemission-Studies of K-Promoted Nitridation and Oxidation of the InP(100) Surface Using Synchrotron-Radiation Zhao TX, Ji H, Liang Q, Wang XP, Xu PS, Lu ED, Wu JX, Hsu CC |
1970 - 1976 |
Competitive Halogenation of Silicon Surfaces in HBr/Cl-2 Plasmas Studied Ray Photoelectron-Spectroscopy and in-Situ, Real-Time, Pulsed Laser-Induced Thermal-Desorption Cheng CC, Guinn KV, Herman IP, Donnelly VM |
1977 - 1983 |
Morphology Study of the Thermal-Oxidation of Rough Silicon Surfaces Liu Q, Spanos L, Zhao C, Irene EA |
1984 - 1989 |
Measurements of Reflected Electron-Energy-Loss Spectrometry and X-Ray Photoelectron-Spectroscopy Spectra for Derivations of the Energy-Loss Function and Source Function for Au 4F Photoelectrons Yoshikawa H, Irokawa Y, Shimizu R |
1990 - 1993 |
Surface Type Conversion of CuInSe2 with H2S Plasma Exposure - A Photoemission Investigation Nelson AJ, Frigo SP, Rosenberg R |
1994 - 1998 |
N-15 Hydrogen Depth Profiling Measurements of Candidate Superconducting Supercollider Beam Pipe Materials Ruckman MW, Strongin M, Lanford WA, Turner WC |
1999 - 2004 |
Study of Ion Mixing During Auger Depth Profiling of Ge-Si Multilayer System .2. Low Ion Energy (0.2-2 keV) Range Menyhard M, Barna A, Biersack JP, Jarrendahl K, Sundgren JE |
2005 - 2012 |
Methods to Enhance Absorption Signals in Infrared Reflectance Spectroscopy - A Comparison Using Optical Simulations Katiyar M, Abelson JR |
2013 - 2017 |
Local-Density of States Analysis by Auger-Electron Spectroscopy Zhou HJ, Wang YQ, Ho W |
2018 - 2022 |
Boron-Nitride Thin-Film Deposition from Solid Borane Ammonia Using an Electron-Cyclotron-Resonance Microwave Plasma Source Eddy CR, Sartwell BD |
2023 - 2029 |
Remote Plasma and Ultraviolet-Ozone Modification of Polystyrene Callen BW, Ridge ML, Lahooti S, Neumann AW, Sodhi RN |
2030 - 2034 |
Compositionally Gradient (Ti1-xAlx)N Coatings Made by Plasma-Enhanced Chemical-Vapor-Deposition Lee SH, Lee JJ |
2035 - 2043 |
Electron Cyclotron-Resonance Plasma Reactor for SiO2 Etching - Process Diagnostics, End-Point Detection, and Surface Characterization Wan ZM, Liu J, Lamb HH |
2044 - 2050 |
Generation and Behavior of Particulates in a Radio-Frequency Excited CH4 Plasma Yeon CK, Whang KW |
2051 - 2057 |
Negative-Ions in a Ccl2F2 Radio-Frequency Discharge Stoffels E, Stoffels WW, Vender D, Kroesen GM, Dehoog FJ |
2058 - 2066 |
The Chemistry of a Ccl2F2 Radio-Frequency Discharge Stoffels WW, Stoffels E, Haverlag M, Kroesen GM, Dehoog FJ |
2067 - 2073 |
Effect of Wall Charging on an Oxygen Plasma Created in a Helicon Diffusion Reactor Used for Silica Deposition Charles C, Boswell RW |
2074 - 2085 |
Characterization of a Slot Antenna Microwave Plasma Source for Hydrogen Plasma Cleaning Korzec D, Werner F, Brockhaus A, Engemann J, Schneider TP, Nemanich RJ |
2086 - 2092 |
Magnetically Confined Inductively-Coupled Plasma-Etching Reactor Lai C, Brunmeier B, Woods RC |
2093 - 2098 |
Online Studies of Plasma Surface Interactions Between a Radio-Frequency Plasma-Jet and 3 W/O Boron-Doped Graphite Samples Avni R, Erin J, Morvan D, Mabillerouger I, Amouroux J, Winter J, Nickel H |
2099 - 2104 |
Control of Radio-Frequency-Plasma Process to Improve the Reproducibility of Silicon Oxynitride Thin-Film Preparation Diatezua DM, Thiry PA, Caudano R |
2105 - 2109 |
Electron-Cyclotron-Resonance Plasma Generation Using a Planar Ring-Cusp Magnetic-Field and a Reentrant Coaxial Cavity Yasui T, Tahara H, Yoshikawa T |
2110 - 2122 |
Formation of C-N Thin-Films by Ion-Beam Deposition Boyd KJ, Marton D, Todorov SS, Albayati AH, Kulik J, Zuhr RA, Rabalais JW |
2123 - 2127 |
Effect of Residual-Gas on Cu Film Deposition by Partially-Ionized Beam Koh SK, Jin ZG, Lee JY, Jung HJ, Kim KH, Choi DJ |
2128 - 2132 |
Cluster Beam Deposition - Optimization of the Cluster Beam Source Gatz P, Hagena OF |
2133 - 2137 |
Structuring of Various Materials Using Cluster Ions Henkes PR, Krevet B |
2138 - 2141 |
Simple Method for Fe+ Ion Production in a Microwave Ion-Source Matsuo T, Miyake K |
2142 - 2145 |
Effect of Ni on Graphite Thin-Film Formation from Organic Materials by Chemical-Vapor-Deposition Yudasaka M, Kikuchi R, Matsui T, Tasaka K, Ohki Y, Yoshimura S, Ota E |
2146 - 2150 |
Etching of InP Surface Oxide with Atomic-Hydrogen Produced by Electron-Cyclotron-Resonance Hofstra PG, Robinson BJ, Thompson DA, Mcmaster SA |
2151 - 2156 |
Magnetic-Field in 2-Dimensional Magnetrons Murphy MJ, Cameron DC |
2157 - 2160 |
Ferromagnetic-Resonance in Ni Films Biased DC Sputter-Deposited on MgO(001) Maruyama H, Qiu H, Nakai H, Hashimoto M |
2161 - 2169 |
Monte-Carlo Calculations of Gas Rarefaction in a Magnetron Sputtering Discharge Turner GM |
2170 - 2176 |
Preparation of Al-Ni Alloy-Films by Alternate Sputter-Deposition Ho JK, Lin KL |
2177 - 2182 |
Characterization and Analysis of ZnO-Al Deposited by Reactive Magnetron Sputtering Zafar S, Ferekides CS, Morel DL |
2183 - 2188 |
Flux Distributions and Deposition Profiles from Hexagonal Collimators During Sputter-Deposition Lin Z, Cale TS |
2189 - 2193 |
Microstructural and Morphological Effects on the Tribological Properties of Electron Enhanced Magnetron-Sputtered Hard Coatings Schneider JM, Voevodin AA, Rebholz C, Matthews A |
2194 - 2198 |
Magnetic-Properties of Ion-Beam Sputter-Deposited NiFe Ultrathin Films Ueno M, Tanoue S |
2199 - 2209 |
Role of Oxygen Partial-Pressure on the Properties of Doped Silicon Oxycarbide Microcrystalline Layers Produced by Spatial Separation Techniques Martins R, Vieira M, Ferreira I, Fortunato E |
2210 - 2213 |
Structures of Fe/TiC Multilayers Prepared by Ion-Beam Sputtering at Room-Temperature Liu CH, Li WZ, Li HD, Li YH |
2214 - 2220 |
Crystallization of Pb(Zr,Ti)O-3 Films Prepared by Radio-Frequency Magnetron Sputtering with a Stoichiometric Oxide Target Basit NA, Kim HK |
2221 - 2227 |
Influence of Angular-Distribution on the Deposition Rate of Species Sputtered from a Multicomponent Target in Different Configurations - Applications to Mixed-Valence Copper Oxides Lecoeur P, Mercey B, Murray H |
2228 - 2232 |
Creation of Extreme High-Vacuum with a Turbomolecular Pumping System - A Baking Approach Cho BL, Lee ST, Chung SM |
2233 - 2240 |
Unstable Arc Operation and Cathode Spot Motion in a Magnetically Filtered Vacuum-Arc Deposition System Zhitomirsky VN, Boxman RL, Goldsmith S |
2241 - 2254 |
Model of an 80 K Liner Vacuum-System for the 4.2 K Cold Bore of the Superconducting Super Collider 20 TeV Proton Collider Turner WC |
2255 - 2260 |
Spherical-Aberration Correction of Electrostatic Lenses Using Spherical Meshes Kato M, Sekine T |
2261 - 2265 |
Spectroscopic Studies of a Solenoid Filtered Vacuum-Arc Wang ZH, Mckenzie DR, Martin PJ, Netterfield RP |
2266 - 2270 |
Instability of the Spatial Electron Current Distribution in Hot Cathode Ionization Gauges as a Source of Sensitivity Changes Jousten K, Rohl P |
2271 - 2274 |
The Dependence of the Characteristics of a Rotating-Disk Vacuum Gauge on Disk Sizes and Rotor Speed Chew AD, Chambers A, Pert GJ, Troup AP |
2275 - 2277 |
Hydrogen in Thin-Films of Cuins2 Solar-Cell Material Dzionk C, Hessler S, Lewerenz HJ, Mahnke HE, Metzner H, Steiger J |
2278 - 2280 |
Photoelectron-Spectroscopy of Shallow Core Levels Using He II(40.8 eV) Excitation Comedi D, Zanatta AR, Alvarez F, Chambouleyron I |
2281 - 2284 |
Removing Sulfur from Gold Using Ultraviolet Ozone Cleaning Worley CG, Linton RW |
2285 - 2287 |
Quantitative Spectral Measurement of Air Leaks into Plasma Reactors Barna GG |