Journal of Vacuum Science & Technology B

Journal of Vacuum Science & Technology B, Vol.12, No.3 Entire volume, number list

ISSN: 1071-1023 (Print)

In this Issue (216 articles)

1319 - 1327	Photoluminescence of Molecular-Beam Epitaxial Grown Al0.48In0.52As Ferguson IT, Cheng TS, Torres CM, Murray R
1328 - 1332	Thin-Film Induced Stress in GaAs Ridge-Wave-Guide Structures Integrated with Sputter-Deposited ZnO Films Kim HK, Kleemeier W, Li YB, Langer DW, Cassidy DT, Bruce DM
1333 - 1339	Comparison of Multipolar and Magnetic-Mirror Electron-Cyclotron-Resonance Sources for CH4 H-2 Dry-Etching of III-V Semiconductors Pearton SJ, Abernathy CR, Kopf RF, Ren F, Hubson WS
1340 - 1350	Comparison of Advanced Plasma Sources for Etching Applications .4. Plasma-Induced Damage in a Helicon and a Multipole Electron-Cyclotron-Resonance Source Blayo N, Tepermeister I, Benton JL, Higashi GS, Boone T, Onuoha A, Klemens FP, Ibbotson DE, Sawin HH
1351 - 1361	High-Frequency Reactive Ion Etching of Silylated Photoresist Kalpakjian KM, Lieberman MA, Oldham WG
1362 - 1366	Resist Heating Effect in Electron-Beam Lithography Yasuda M, Kawata H, Murata K, Hashimoto K, Hirai Y, Nomura N
1367 - 1371	Workpiece Charging in Electron-Beam Lithography Ingino J, Owen G, Berglund CN, Browning R, Pease RF
1372 - 1376	Fabrication of a Multilevel Structure for Nanophysics in 2-Dimensional Electron Gases Soh YA, Snider GL, Rooks MJ, Craighead HG, Parpia J
1377 - 1383	Anneal Technique to Recover the Electrical Characteristics of the Packaged Bipolar Junction Transistors Damaged by Co-60 Radiation Changliao KS, Huang CJ
1384 - 1389	Ion-Assisted Etching of Si with Cl2 - The Effect of Flux Ratio Coburn JW
1390 - 1393	Arsenic Gas-Phase Doping of Polysilicon Ransom CM, Jackson TN, Degelormo JF, Kotecki D, Graimann C, Sadana DK
1394 - 1401	Auger Depth Profiles of Tin/Ti Films in Submicron Contact Holes - A Comparison of Collimated and Uncollimated Deposition Processes Hoener CF, Pylant E, Boden EG, Wang SQ
1402 - 1406	Electron-Spectroscopy for Chemical-Analysis on Surface Germylation Process Yoshida Y, Kubota S, Koezuka H, Fujioka H
1407 - 1409	Carbon-Filament Source for P-Type Doping in Molecular-Beam Epitaxy Mak A, Johnson SR, Lavoie C, Mackenzie J, Nissen MK, Rogers D, Tiedje T
1410 - 1412	Reactive Ion Etching of InP via Holes Hur KY, Guerin BJ, Kazior TE
1413 - 1415	Scanning-Tunneling-Microscopy Observation of the Growth Evolution of Gold-Films Evaporated on Highly Oriented Pyrolitic Graphite Hammiche A, Webb RP, Wilson IH
1416 - 1418	Photoluminescence Studies of Interstitial Zn in InP Due to Rapid Thermal Annealing Hsu JK, Juang C, Lee BJ, Chi GC
1419 - 1421	Formation of Ohmic Contacts to N-GaAs Using (NH4)2S Surface Passivation Fischer V, Kim TJ, Holloway PH, Ristolainen E, Schoenfeld D
1422 - 1426	Some Preliminary-Observations of the Rapid Thermal-Oxidation of Porous Silicon, and the Rapid Thermal Nitriding of Oxidized Porous Silicon Shieh SY, Evans JW
1439 - 1439	1993 International-Conference on Scanning-Tunneling-Microscopy - Preface Bai C, Colton RJ, Kuk Y
1441 - 1446	Near-Field Optics - Light for the World of Nano Pohl DW, Novotny L
1447 - 1455	Real-Space Imaging of Electron-Scattering Phenomena at Metal-Surfaces Avouris P, Lyo IW, Walkup RE, Hasegawa Y
1456 - 1460	Structural Refinement and Measurement of Biomolecules Using Novel Software Algorithms and Methodologies Williams PM, Davies MC, Jackson DE, Roberts CJ, Tendler SJ
1461 - 1464	Topographical Structure of Pbr322 DNA Studied by Scanning Tunneling Microscope and Atomic-Force Microscope Zhang PC, Bai C, Cheng YJ, Fang Y, Wang ZH, Huang XT
1465 - 1469	Atomic-Force Microscopy of Plasmid DNA and DNA-Polymerase Li MQ, Hansma HG, Hong GF, Yao XW, Hansma PK
1470 - 1473	Imaging of Neurons by Atomic-Force Microscopy Umemura K, Arakawa H, Ikai A
1474 - 1477	Exploring Intermediate Filament Structure with the Scanning Force Microscope - Comparison with Transmission Electron-Microscopy Data Karrasch S, Heins S, Aebi U, Engel A
1478 - 1481	Scanning-Tunneling-Microscopy Atomic-Force Microscopy Studies of Bacteriophage-T4 and Its Tail Fibers Ikai A, Imai K, Yoshimura K, Tomitori M, Nishikawa O, Kokawa R, Kobayashi M, Yamamoto M
1482 - 1485	Exploring Native Nuclear-Pore Complex Structure and Conformation by Scanning Force Microscopy in Physiological Buffers Goldie KN, Pante N, Engel A, Aebi U
1486 - 1489	Direct Observation of Human Liver Ferritin by Scanning-Tunneling-Microscopy Mosca A, Paleari R, Arosio P, Cricenti A, Scarselli MA, Genorosi R, Selci S, Rovida E
1490 - 1493	Scanning-Tunneling-Microscopy of Proteins of the Immunoglobulin Super Family Roccaserra J, Thimonier J, Chauvin JP, Barbet J
1494 - 1495	Sample Preparation for Scanning-Tunneling-Microscopy Imaging of Proteins - Characterization of Gold Surfaces Chemically-Modified with a Disulfide Reagent Cricenti A, Scarselli MA, Paleari R, Mosca A
1497 - 1499	Investigation of C-Phycocyanin from Blue-Green-Alga Spirulina-Platensis with Scanning Tunneling Microscope Zhang YZ, Ma Z, Chu X, Hu TM, Zhou BC, Pang SJ, Tseng CK
1500 - 1503	Biological-Materials Studied with Dynamic Force Microscopy Anselmetti D, Dreier M, Luthi R, Richmond T, Meyer E, Frommer J, Guntherodt HJ
1504 - 1507	Scanning Force Microscopy of Escherichia-Coli Ompf Porin in Buffer Solution Schabert FA, Hoh JH, Karrasch S, Hefti A, Engel A
1508 - 1511	Imaging of Uncoated Tobacco Mosaic-Virus by Scanning-Tunneling-Microscopy Guckenberger R, Arce FT, Hillebrand A, Hartmann T
1512 - 1516	Tunneling Microscopy Verification of an X-Ray Scattering-Derived Molecular-Model of Tyrosine-Based Melanin Zajac GW, Gallas JM, Alvaradoswaisgood AE
1517 - 1520	Conformational Differences in 2 Mutant Hinge IgG4 Antibodies Observed by Scanning-Tunneling-Microscopy Kreusel KM, Adair JR, Eeley NR, Davies MC, Jackson DE, Roberts CJ, Tendler SJ, Williams PM
1521 - 1525	Scanning Tunneling Investigation of DNA Structures Involved in Gene-Regulation Pasero P, Blettry C, Marilley M, Jordan B, Granjeaud S, Dayez M, Humbert A
1526 - 1529	Visualization and Identification of Intracellular Structures by Force Modulation Microscopy and Drug-Induced Degradation Fritz M, Radmacher M, Petersen N, Gaub HE
1530 - 1534	Imaging of Cell with Atomic-Force Microscopy Operated at a Tapping Mode Shibataseki T, Watanabe W, Masai J
1535 - 1538	Atomic-Force and Scanning Electron-Microscopy of Xenopus-Laevis Oocytes Solletti JM, Kasas S, Bertrand D, Weisenhorn AL
1539 - 1542	Probing by in-Situ Scanning-Tunneling-Microscopy the Influence of an Organic Additive on Si Etching in NaOH Allongue P, Bertagna V, Kieling V, Gerischer H
1543 - 1546	In-Situ Observation of Anodic-Dissolution Process of N-GaAs in HCl Solution by Electrochemical Atomic-Force Microscope Koinuma M, Uosaki K
1547 - 1550	Ex-Situ Scanning-Tunneling-Microscopy Investigations of the Modification of Titanium Surface Due to Corrosion Processes Ejov AA, Savinov SV, Yaminsky IV, Pan J, Leygraf C, Thierry D
1551 - 1554	In-Situ Characterization of the Liquid-Solid Interface by Scanning-Tunneling-Microscopy Kim JC, Khang YH, Shim TE, Lee DH, Jeon D, Kuk Y
1555 - 1558	Friction Force Microscopy of Heavy-Ion Irradiated Mica Hagen T, Grafstrom S, Ackermann J, Neumann R, Trautmann C, Vetter J, Angert N
1559 - 1564	Analysis of Lateral Force Effects on the Topography in Scanning Force Microscopy Grafstrom S, Ackermann J, Hagen T, Neumann R, Probst O
1565 - 1568	Real-Time Imaging of Enzymatic Degradation of Starch Granules by Atomic-Force Microscopy Thomson NH, Miles MJ, Ring SG, Shewry PR, Tatham AS
1569 - 1571	Imaging of Surface Electrostatic Features in Phase-Separated Phospholipid Monolayers by Scanning Maxwell Stress Microscopy Inoue T, Yokoyama H
1572 - 1576	Measurement of Si Wafer and SiO2 Layer Microroughness by Large-Sample Atomic-Force Microscope Yasutake M, Wakiyama S, Kato Y
1577 - 1580	2-Directional Dynamic-Mode Force Microscopy - Detection of Directional Force Gradient Watanabe S, Hane K, Ito M, Goto T
1581 - 1585	Scanning Force Microscope Using a Piezoelectric Microcantilever Itoh T, Suga T
1586 - 1590	Magnetic Force Microscopy on High-Tc Superconductors Moser A, Hug HJ, Fritz O, Parashikov I, Guntherodt HJ
1591 - 1595	Application of MHz-Frequency Detection to Noncontact Scanning Force Microscopy Hug HJ, Moser A, Weller D, Parashikov I, Tonin A, Hidber HR, Guntherodt HJ
1596 - 1599	Observation and Surface Modification of Electropolymerized Poly(N-Methylpyrrole) Using Atomic-Force Microscopy Yano T, Nagahara LA, Hashimoto K, Fujishima A
1600 - 1603	Charge Deposition and Imaging on a Fluoride Thin-Film Using the Scanning Force Microscope Umeda N, Makino K, Takahashi T, Takayanagi A
1604 - 1608	Structural Study of Langmuir-Blodgett-Films by Scanning Surface-Potential Microscopy Fujihira M, Kawate H
1609 - 1613	Atomic-Force Microscopy and Friction Force Microscopy of Chemically-Modified Surfaces Fujihira M, Morita Y
1614 - 1617	Atomic-Force Microscopy Study of the Fractal Shape of Residual Barium Cuprate Copper-Oxide Flux on the Surface of Y2Ba4Cu7O15 and YBa2Cu4O8 Single-Crystals Lang HP, Karpinski J, Kaldis E, Ramseyer JP, Guntherodt HJ
1618 - 1622	Study of Magnetic Characteristics of Tips for Magnetic Force Microscopy Sueoka K, Sai F, Parker K, Arnoldussen T
1623 - 1626	Atomic-Force Microscopy Study of Surface-Morphology of GaAs Grown by Atomic Layer Epitaxy Using Trimethylgallium and Arsine Park SJ, Ha JS, Ro JR, Sim JK, Lee EH, Jeon C
1627 - 1630	Atomic-Force Microscopy Studies of Contact-Electrified Charges on Silicon-Oxide Film Sugawara Y, Fukano Y, Uchihashi T, Okusako T, Morita S, Yamanishi Y, Oasa T, Okada T
1631 - 1634	Effect of Mg(Oh)2 on YBa2Cu3O7 Thin-Film on MgO Substrate Studied by Atomic-Force Microscope Kim BI, Hong JW, Jeong GT, Moon SH, Lee DH, Shim TU, Khim ZG
1635 - 1637	Study on the Stick-Slip Phenomenon on a Cleaved Surface of the Muscovite Mica Using an Atomic-Force Lateral Force Microscope Fujisawa S, Sugawara Y, Morita S, Ito S, Mishima S, Okada T
1638 - 1641	Atomic-Force Microscopy of Ammonium-Perchlorate Yoo MS, Yoon SW, Delozanne A
1642 - 1645	Normal and Lateral Forces in Scanning Force Microscopy Ascoli C, Dinelli F, Frediani C, Petracchi D, Salerno M, Labardi M, Allegrini M, Fuso F
1646 - 1647	Piezoelectric Sliding Pushing Micropositioner in a Scanning Tunneling Microscope Yao XW, Xu L, Zhang LP, Hu J, Ge GQ, Gong PR, Xu YL, Lu SL, Li MQ
1648 - 1651	Atomic-Force Detection System with a Differential Heterodyne Interferometer Using an Optical-Fiber Array Nakatani N, Oshio T
1652 - 1654	Observation of Lattice-Defects Using Scanning-Tunneling-Microscopy Spectroscopy at Low-Temperatures Endo T, Yamada H, Sumomogi T, Kino T, Kusunoki N, Morita S
1655 - 1657	New Method to Measure DL/Dv and D2L Dv2 of the Tunneling Current-Voltage Characteristics Yamada H, Sumomogi T, Endo T
1658 - 1661	Scanning-Tunneling-Microscopy Scanning Electron-Microscopy Combined Instrument Asenjo A, Buendia A, Gomezrodriguez JM, Baro AM
1662 - 1664	Improved Scanning Tunneling Microscope Feedback Performance by Means of Separate Actuators Tapson J, Greene JR, Ball A
1665 - 1668	Capacitive Sensors Coupled to a Scanning Tunneling Microscope Piezoscanner for Accurate Measurements of the Tip Displacements Desogus S, Lanyi S, Nerino R, Picotto GB
1669 - 1672	Surface-Roughness Observation by Scanning-Tunneling-Microscopy Using a Monolithic Parallel Spring Zhang HC, Sasaki A, Fukaya J, Aoyama H
1673 - 1676	Progress in Noncontract Dynamic Force Microscopy Luthi R, Meyer E, Howald L, Haefke H, Anselmetti D, Dreier M, Ruetsche M, Bonner T, Overney RM, Frommer J, Guntherodt HJ
1677 - 1680	Combined Scanning Tunneling and Force Microscopy Anselmetti D, Baratoff A, Guntherodt HJ, Gerber C, Michel B, Rohrer H
1681 - 1685	Comparison Measurement in the 100-Nanometer Range with a Crystalline Lattice Using a Dual Tunneling-Unit Scanning Tunneling Microscope Kawakatsu H, Higuchi T, Kougami H, Kawai M, Watanabe M, Hoshi Y, Nishioki N
1686 - 1697	Detecting and Controlling Forces in Atomic-Force Microscopy with Multi-Degrees-of-Freedom Kawakatsu H, Saito T, Kougami H, Blanalt P, Kawai M, Watanabe M
1690 - 1693	Local Probing Instrumentation at Advanced Technologies Center - Surface and Force Devices with Tunneling Sensor Moiseev YN, Panov VI, Savinov SV, Pyaminsky IV
1694 - 1697	Mica Etch Pits as a Height Calibration Source for Atomic-Force Microscopy Nagahara LA, Hashimoto K, Fujishima A, Snowdenlfft D, Price PB
1698 - 1701	Calibration, Drift Elimination, and Molecular-Structure Analysis Jorgensen JF, Madsen LL, Garnaes J, Carneiro K, Schaumburg K
1702 - 1704	Hysteresis Correction of Scanning Tunneling Microscope Images Jorgensen JF, Carneiro K, Madsen LL, Conradsen K
1705 - 1707	Ultrahigh-Vacuum Atomic-Force Microscope with Sample Cleaving Mechanism Ohta M, Sugawara Y, Morita S, Nagaoka H, Mishima S, Okada T
1708 - 1711	Newly Developed Low-Temperature Scanning Tunneling Microscope and Its Application to the Study of Superconducting Materials Gao F, Dai CC, Chen ZB, Huang GZ, Bai CL, Tao HG, Yin B, Yang QS, Zhao ZX
1712 - 1715	Fabrication of Diamond Tips by the Microwave Plasma Chemical-Vapor-Deposition Technique Liu N, Ma Z, Chu X, Hu T, Xue Z, Jiang X, Pang S
1716 - 1721	Cross-Section X-Scanning Force Microscopy Analysis of Different Hard Coatings and Thin-Films Pischow KA, Adamik M, Barna PB, Korhonen AS
1722 - 1726	Scanning Tunneling Microscope Observation of the Cleavage Fracture Surfaces of Titanium Aluminide Zhang Y, Chu WY, Wang YB, Qiao LJ, Xiao CM, Wang ZH, Bai CL
1727 - 1733	Studies of Tin Nucleation and Growth by Scanning-Tunneling-Microscopy in Water Song JP, Pryds NH, Glejbol K, Morch KA, Carneiro K
1734 - 1737	Surface Characterization of Sputtered Niobium Films by Scanning-Tunneling-Microscopy Lacquaniti V, Maggi S, Monticone E, Picotto GB
1738 - 1741	Microhardness Measurements by Scanning Tunneling Microscope Barbato G, Desogus S, Germak A, Picotto GB, Xhomo E
1742 - 1746	Deposition of Au on a Sulfur Covered Mo(100) Surface - Adsorbate Adsorbate Interaction and Growth Dunphy JC, Chapelier C, Ogletree DF, Salmeron MB
1747 - 1750	Structure of Au on Ag(110) Studied by Scanning-Tunneling-Microscopy Chiang S, Rousset S, Fowler DE, Chambliss DD
1751 - 1753	Scanning-Tunneling-Microscopy Tip-Dependent Image-Contrast of S Pt(111) by Controlled Atom-Transfer Mcintyre BJ, Sautet P, Dunphy JC, Salmeron M, Somorjai GA
1754 - 1757	Study of Ion-Bombardment Induced Vacancy Islands on Au(100) by Scanning-Tunneling-Microscopy Gauthier S, Samson Y, Girard JC, Rousset S, Klein J
1758 - 1763	Scanning-Tunneling-Microscopy Studies of Metal-Surfaces - Surface-Reactions, Discrimination of Chemically Different Elements, and Surface Alloying Besenbacher F, Laegsgaard E, Nielsen LP, Ruan L, Stensgaard I
1764 - 1767	Electromigration Kinetics of Gold on a Carbon Thin-Film Surface Studied by Scanning-Tunneling-Microscopy and Scanning Tunneling Potentiometry Besold J, Kunze R, Matz N
1768 - 1771	Scanning-Tunneling-Microscopy of Co on Pt(111) Grutter P, Durig UT
1772 - 1775	Scanning-Tunneling-Microscopy Study of S Adsorption on Ni(111) Ruan L, Stensgaard I, Besenbacher F, Laegsgaard E
1776 - 1779	Scanning-Tunneling-Microscopy Study of Model Catalysts Obtained by Cluster Beam Deposition of Palladium Onto Highly Oriented Pyrolithic Graphite Aires FJ, Sautet P, Rousset JL, Fuchs G, Melinon P
1780 - 1782	Scanning Tunneling Microscope and Atomic-Force Microscope Study of Epitaxially Grown Palladium Crystallites on Graphite Kojima I, Kurahashi M
1783 - 1788	Growth of Iron on Iron Whiskers Stroscio JA, Pierce DT
1789 - 1792	Scanning-Tunneling-Microscopy Study of the Growth of Cr-Fe(001) - Correlation with Exchange Coupling of Magnetic Layers Stroscio JA, Pierce DT, Unguris J, Celotta RJ
1793 - 1796	Scanning-Tunneling-Microscopy Investigation of Bainite in Steel Yan JJ, Yu HB, Ge Z, Huang Y, Fang HS, Wang JJ, Yang ZG, Deng XR
1797 - 1800	Observation of the Relaxation Processes That Follow Atom Removal from the Au(111) Surface with the Scanning Tunneling Microscope Hasegawa Y, Avouris P
1801 - 1804	Atomic-Force Microscope and Scanning Tunneling Microscope Studies of Superlattices and Density Waves in Fe Doped NbSe2, TaSe2, TaS2 and in Nbse3 Doped with Fe, Co, Cr, and V Coleman RV, Dai Z, Gong CG, Xue Q
1805 - 1808	Adsorbates in Ambient Operated Scanning-Tunneling-Microscopy - Their Appearance, Mobility During Scanning, and Role in Surface-Diffusion Measurements Campbell PA, Davis PR, Walmsley DG
1809 - 1812	Vibrational and Structural Studies of Oxygen-Adsorption on the Ag(110) Surface Hashizume T, Rowe JE, Malic RA, Motai K, Cho K, Kishimoto J, Sakurai T
1813 - 1816	Atomic-Force Microscope Study of Thin-Plate Martensites in an Fe-Ni-C Alloy Yamamoto M, Nishikawa K, Noda Y, Saburi T, Hayakawa M, Oka M, Kurumizawa T
1817 - 1823	Scanning-Tunneling-Microscopy of Silver and Gold Metal Liquid-Like Films Smith KW, Rigby SJ, Turner RJ, Walmsley DG, Mcgarvey JJ
1823 - 1826	Microstructure of Nanosize Hydrogenated Crystalline Silicon Studied by Scanning-Tunneling-Microscopy Bai CL, Wang ZH, Dai CC, Zhang PC, He YL
1827 - 1831	Microstructure Study by Scanning-Tunneling-Microscopy of Glassy Carbons Heat-Treated at Different Temperatures Lei HN, Metrot A, Troyon M
1832 - 1834	2-Dimensional Ordered Si3N4 Nanoparticles Observed by a Scanning Tunneling Microscope Zheng ZJ, Zuo DL, Li DH
1835 - 1838	Nanometer Characterization of Single-Point Diamond-Turned Mirrors on the Micrometer and Submicrometer Scale Yu J, Hou L, Ma WS, Cao JL, Yu JY, Yao JE
1839 - 1842	Nanoscale Lithography on Langmuir-Blodgett-Films of Behinic Acid Garnaes J, Bjornholm T, Zasadzinski JA
1843 - 1846	Atomic-Force Microscopy Study of Pd Clusters on Graphite and Mica Nie HY, Shimizu T, Tokumoto H
1847 - 1850	Nanostructure Fabrication via Direct Writing with Atoms Focused in Laser Fields Scholten RE, Mcclelland JJ, Palm EC, Gavrin A, Celotta RJ
1851 - 1855	Scanning Tunneling Microscope and Tunneling Stabilized Magnetic Force Microscope Characterization of Magnetic Nanocrystalline Materials Nogues J, Rodell B, Rao KV
1856 - 1859	Diamond-Coated Tips and Their Applications Liu N, Ma Z, Chu X, Hu T, Xue Z, Pang S
1860 - 1865	Atomic-Force Microscopy and Friction Force Microscopy of Langmuir-Blodgett-Films for Microlithography Fujihira M, Takano H
1866 - 1868	Tunneling-Electron-Induced Adsorption of Pyridine on a Hydrogen-Terminated Silicon Surface Komiyama M, Kirino M
1869 - 1871	Construction of Model Supported Metal-Catalysts for Scanning-Tunneling-Microscopy Examinations - Platinum Ultrafine Particles on Silica and on Alumina Komiyama M, Kirino M, Kurokawa H
1872 - 1878	Formation of Nanometer-Sized Au Dots on Si Substrate in Air Hosaka S, Koyanagi H, Kikukawa A, Maruyama Y, Imura R
1876 - 1880	Micromachining of Metal-Surfaces by Scanning Probe Microscope Sumomogi T, Endo T, Kuwahara K, Kaneko R, Miyamoto T
1881 - 1886	Surface Characterization of Flexible Magnetic Disk with Scanning Probe Microscopy Masai J, Shibataseki T, Seki K, Mori K, Yamauchi H, Sasaki K, Yoshiyama R, Yamamoto M
1886 - 1889	Surface-Structure of YBa2Cu3O7-X Probed by Reversed-Bias Scanning-Tunneling-Microscopy Edwards HL, Markert JT, Delozanne AL
1890 - 1893	Manipulation of Rectangular Arrangement of Se-Ring-Type Molecules on Graphite (Highly Oriented Pyrolytic-Graphite) Surfaces Czajka R, Kasuya A, Horiguchi N, Nishina Y
1894 - 1897	Nanofabrication and Rapid Imaging with a Scanning Tunneling Microscope Rubel S, Trochet M, Ehrichs EE, Smith WF, Delozanne AL
1898 - 1900	Scanning-Tunneling-Microscopy Study of ZnS Particles Generated from a Controlled Chemical-Reaction Wang DW, Liu YQ, Xu GZ, Bai CL
1901 - 1905	Time-Resolved Atomic-Scale Modification of Silicon with a Scanning Tunneling Microscope Grey F, Huang DH, Kobayashi A, Snyder EJ, Uchida H, Aono M
1906 - 1909	Interaction of C-60 with the Au(111) 23X-Root-3 Reconstruction Altman EI, Colton RJ
1910 - 1913	Formation of Crystalline Islands of C-60 on Si(111) Chen DM, Xu H, Creager WN, Burnett P
1914 - 1917	Scanning-Tunneling-Microscopy of Liquid-Crystals, Perylene-Tetracarboxylic-Dianhydride and Phthalocyanine Freund J, Probst O, Grafstrom S, Dey S, Kowalski J, Neumann R, Wortge M, Zuputlitz G
1918 - 1922	Scanning-Tunneling-Microscopy Study of C-60 Adsorption on 2H-MoS2 (0001) Surface Chen T, Sarid D
1923 - 1926	Observation of the Bottom Surface of Contact Holes by Hopping Scanning Atomic-Force Microscopy with a ZnO Whisker Tip Kado H, Yamamoto S, Yokoyama K, Tohda T, Umetani Y, Yano K
1927 - 1929	Molecular Mechanics Calculation and Scanning Tunneling Microscopic Research of Polyaniline Doped with Perchlorate Bai C, Zhu CF, Zhang PC, Yu T, Wang FS
1930 - 1931	Scanning-Tunneling-Microscopy Investigation of Monolayer of Metal-Complexes Adsorbed on Highly Oriented Pyrolytic-Graphite Miyamura K, Kimura M, Okumura A, Gohshi Y
1932 - 1935	Electronic States of C-60 Molecules on Si(001)2X1 and Si(111)7X7 Surfaces Yamaguchi T
1936 - 1941	Crystallization Process of Langmuir-Blodgett-Films of Octadecylthiobenzoquinone Garnaes J, Bjornholm T, Jorgensen M, Zasadzinski JA
1942 - 1946	Scanning-Tunneling-Microscopy of Ordered C-60 and C-70 Layers on Au(111), Cu(111), Ag(110), and Au(110) Surfaces Gimzewski JK, Modesti S, David T, Schlittler RR
1947 - 1951	Scanning-Tunneling-Microscopy Study of the Adsorption of C-60 Molecules on Si(100)-(2X1) Surfaces Chen D, Gallagher MJ, Sarid D
1952 - 1956	Nanostructures or Submicrostructures from Gas-Solid Reactions as Probed by Atomic-Force Microscopy Kaupp G
1957 - 1962	Imaging Molecular Adsorbates - Resolution Effects and Determination of Adsorption Parameters Chiang S, Hallmark VM, Meinhardt KP, Hafner K
1963 - 1966	Epitaxy and Scanning-Tunneling-Microscopy Image-Contrast of Copper Phthalocyanine on Graphite and MoS2 Ludwig C, Strohmaier R, Petersen J, Gompf B, Eisenmenger W
1967 - 1972	Inhomogeneities of Phase-Separated Langmuir-Blodgett-Films Studied by Atomic-Force Microscopy Chi LF, Fuchs H, Johnston RR, Ringsdorf H
1973 - 1976	Elasticity, Wear, and Friction Properties of Thin Organic Films Observed with Atomic-Force Microscopy Overney RM, Bonner T, Meyer E, Reutschi M, Luthi R, Howald L, Frommer J, Guntherodt HJ, Fujihara M, Takano H
1977 - 1980	Structural Study of a Poly(Methylmethacrylate) Langmuir-Blodgett-Film on a Graphite Surface by Scanning Tunneling Microscope Ha JS, Roh HS, Jung SD, Park SJ, Kim JJ, Lee EH
1981 - 1983	Investigation of Molecular Chains Structure of Polyimide Langmuir-Blodgett-Films by Atomic-Force Microscopy Yang XM, Min GW, Gu N, Lu ZH, Wei Y
1984 - 1987	Scanning Tunneling Microscope Investigation of Semiconductor Nanometer Particles Min GW, Yang XM, Lu ZH, Yu W
1988 - 1991	Scanning Probe Microscopy and Spectroscopy Study of the Organic Salt (Et)2Khg(SCN)4 Dubois JG, Gerritsen JW, Vankempen H, Campos CE, Tibbitts TT, Brooks JS, Tokumoto M, Kinoshita N, Tanaka Y
1992 - 1999	C-60 Adsorption on the Si(100)2X1 and Cu(111)1X1 Surfaces Hashizume T, Sakurai T
2000 - 2003	Observation of Vacuum-Deposited Naphthalocyanine Molecules Using Scanning-Tunneling-Microscopy Maniavannan A, Nagahara LA, Yanagi H, Fujishima A
2004 - 2007	Scanning-Tunneling-Microscopy Studies of Self-Assembled Monolayers of Alkanethiols on Gold Stranick SJ, Kamna MM, Krom KR, Parikh AN, Allara DL, Weiss PS
2008 - 2011	Scanning-Tunneling-Microscopy Study of the Reaction of Alcl(3) with the Si(111) Surface Uesugi K, Takiguchi T, Yoshimura M, Yao T
2012 - 2014	Local Atomic Structures Near the Domain Boundary Between the Al-Root-3X-Root-3 and the 7X7 Phases on Si(111) - Substitutional Defects Yoshimura M, Takaoka K, Yao T, Sueyoshi T, Sato T, Iwatsuki M
2015 - 2017	Scanning-Tunneling-Microscopy at Low-Temperatures on the C(4X2)/(2X1) Phase-Transition of Si(100) Badt D, Wengelnik H, Neddermeyer H
2018 - 2021	Scanning-Tunneling-Microscopy Study of Solid-Phase Epitaxy Processes of Argon Ion-Bombarded Silicon Surface and Recovery of Crystallinity by Annealing Uesugi K, Yoshimura M, Yao T, Sato T, Sueyoshi T, Iwatsuki M
2022 - 2025	Scanning-Tunneling-Microscopy Scanning Tunneling Spectroscopy Study of Ge and Si Dimers on Si Substrates Tomitori M, Watanabe K, Kobayashi M, Nishikawa O
2026 - 2029	Restructuring Process of the Si(111) Surface upon Ag Deposition Studied by in-Situ High-Temperature Scanning-Tunneling-Microscopy Shibata A, Kimura Y, Takayanagi K
2030 - 2032	Scanning-Tunneling-Microscopy of Argon-Ion Bombarded GaAs (001) Surfaces Ohkouchi S, Ikoma N, Tanaka I
2033 - 2036	Surface-Structures of InP and InAs Thermally Cleaned in an Arsenic Flux Ohkouchi S, Ikoma N, Tanaka I
2037 - 2039	Atomic-Force Microscopy Studies of Polysilicon Growth During Deposition on Silicon Vatel O, Andre E, Chollet F, Dumas P, Salvan F
2040 - 2043	Early Stages of Cu Growth on Boron Segregated Si(111) Surfaces - A Scanning-Tunneling-Microscopy Study Roge TP, Thibaudau F, Mathiez P, Dumas P, Salvan F
2044 - 2048	Scanning-Tunneling-Microscopy of Alkali Metal-Induced Structures on the Si(111) Surface Jeon D, Hashizume T, Sakurai T
2049 - 2051	Strain Relief and Ordering of (2Xn)-Bi Structure on Si(100) Park C, Bakhtizin RZ, Hashizume T, Sakurai T
2052 - 2054	Atomic-Structure of Bi on the Si(111) Surface Bakhtizin RZ, Park C, Hashizume T, Sakurai T
2055 - 2059	Scanning-Tunneling-Microscopy Spectroscopy Study of V2O5 Surface with Oxygen Vacancies Oshio T, Sakai Y, Ehara S
2060 - 2063	Scanning Probe Microscopy on the Surface of Si(111) Meyer E, Howald L, Luthi R, Haefke H, Ruetschi M, Bonner T, Overney R, Frommer J, Hofer R, Guntheroidt HJ
2064 - 2066	Photon Spectroscopy, Mapping, and Topography of 85-Percent Porous Silicon Dumaks P, Gu M, Syrykh C, Hallimaoui A, Salvan F, Gimzewski JK, Schlittler RR
2067 - 2069	Nanostructuring of Porous Silicon Using Scanning-Tunneling-Microscopy Dumas P, Gu M, Syrykh C, Hallimaoui A, Salvan F, Gimzewski JK
2070 - 2073	Reconstructed Structures in Metal Si(100) Surfaces at High-Temperature Observed by Scanning-Tunneling-Microscopy Ichinokawa T, Itoh H, Schmid A, Winau D
2074 - 20777	Evolution of Visible Photoluminescence and Surface-Morphology of Ultrathin Porous Si Films Imaged by Scanning-Tunneling-Microscopy Enachescu M, Hartmann E, Koch F
2078 - 2081	Dynamic Observation of Silicon Homoepitaxial Growth by High-Temperature Scanning-Tunneling-Microscopy Hasegawa T, Kohno M, Hosaka S, Hosoki S
2082 - 2085	Ag on Si(001)(2X1) Formation of a 2X3 Superstructure Winau D, Itoh H, Schmid AK, Ichinokawa T
2086 - 2089	Growth Mode and Surface-Structures on the Pb/Si(001) System Observed by Scanning-Tunneling-Microscopy Itoh H, Tanabe H, Winau D, Schmid AK, Ichinokawa T
2090 - 2093	Au on the Si(001) Surface - Room-Temperature Growth Lin XF, Nogami J
2094 - 2096	Structure of Nickel Silicide on Si(001) - An Atomic View Khang Y, Kahng SJ, Mang KM, Jeon D, Lee JH, Kim YN, Kuk Y
2097 - 2099	Adsorption of Bi on Si(001) Surface - An Atomic View Noh HP, Park C, Jeon D, Cho K, Hashizume T, Kuk Y, Sakurai T
2100 - 2103	Cross-Sectional Scanning-Tunneling-Microscopy of Semiconductor Vertical-Cavity Surface-Emitting Laser Structure Zheng JF, Ogletree DF, Walker J, Salmeron M, Weber ER
2104 - 2106	Si Donors (Si(Ga)) in GaAs Observed by Scanning-Tunneling-Microscopy Zheng JF, Liu X, Weber ER, Ogletree DF, Salmeron
2107 - 2110	Fine-Structure of the GaAs(001) Surface Haga Y, Miwa S, Morita E
2111 - 2114	Scanning-Tunneling-Microscopy and Spectroscopy of MOS(2) Thin-Films Prepared by an Intercalation Exfoliation Method Manivannan A, Santiago Y, Cabrera CR
2115 - 2117	Spiral Growth of GaAs by Metalorganic Vapor-Phase Epitaxy Hsu CC, Lu YC, Xu JB, Wong TK, Wilson IH
2118 - 2121	Wigner Glass on the Magnetite (001) Surface Observed by Scanning-Tunneling-Microscopy with a Ferromagnetic Tip Wiesendanger R, Shvets IV, Coey JM
2122 - 2124	Tunneling Through an Epitaxial Oxide Film - Al2O3 on NiAl(110) Bertrams T, Brodde A, Neddermeyer H
2125 - 2128	Potential Distribution Measurement of Thin InGaAs Resistors Using Scanning Tunneling Potentiometry Tanimoto M, Arai K
2129 - 2132	Laser-Frequency Mixing in a Scanning Force Microscope and Its Application to Detect Local Conductivity Volcker M, Krieger W, Walther H
2133 - 2135	Progress Toward Spin-Sensitive Scanning-Tunneling-Microscopy Using Optical Orientation in GaAs Jansen R, Vanderwielen MC, Prins MW, Abraham DL, Vankempen H
2136 - 2139	Local Transformation of C(60) Fullerite into a New Amorphous Phase of Carbon Using a Scanning Tunneling Microscope Lang HP, Wiesendanger R, Thommengeiser V, Hofer R, Guntherodt HJ
2140 - 2143	Spatial Variation of 1/F Current Noise in Scanning Tunneling Microscopes Maeda K, Sugita S, Kurita H, Uota M, Uchida S, Hinomaru M, Mera Y
2144 - 2147	Matteucci Effect of an Amorphous Alloy Tip Used for High-Density Magnetic Recording with a Scanning Tunneling Microscope Tsuji S, Watanuki O
2148 - 2152	Inelastic Processes in Time-Dependent Tunneling in a Scanning Tunneling Microscope Junction Miskovsky NM, Park SH, Cutler PH, Sullivan TE
2153 - 2155	Internal Structure of C(60) on Au(110) as Observed by Low-Temperature Scanning-Tunneling-Microscopy Gaisch R, Berndt R, Schneider WD, Gimzewski JK, Reihl B, Schlittler RR, Tschudy M
2156 - 2160	Proposal to Study the Thermopower Produced by a Vacuum-Tunneling Junction Xu J, Koslowski B, Moller R, Lauger K, Dransfeld K, Wilson IH
2161 - 2163	Calculation of Current Contrasts in 2-Terminals Atomic Switches Vigneron JP, Derycke I
2164 - 2166	Microscopic Theory of Scanning Tunneling Microscope for Finite Electric-Field and Current Hirose K, Tsukada M
2167 - 2170	Effects of the Tip Shape on Scanning Tunneling Microscope Images - 1st-Principles Calculations Watanabe S, Aono M, Tsukada M
2171 - 2174	Studies on the Scanning-Tunneling-Microscopy Images of Adsorbates with the Method of Exciton Dynamics and Their Application Li YP, Huang XT, Zhang HF, Huang WH
2175 - 2178	Current Characteristics for the Scanning Tunneling Microscope Stamp AP, Mcintosh GC, Liu XW
2179 - 2183	Interpretation of Atomic-Force Microscopy Images - The Mica (001) Surface with a Diamond Tip Apex Tang H, Joachim C, Devillers J
2184 - 2188	Simulation and Visualization of Scanning Probe Microscope Imaging Pingali GS, Jain R, Kong LC
2189 - 2192	Theory of Scanning-Tunneling-Microscopy Liu XW, Stamp AP
2193 - 2199	Corrugation Reversal in Scanning-Tunneling-Microscopy Chen CJ
2200 - 2204	Theory of Scanning-Tunneling-Microscopy of Oxygen-Adsorbed Ag(110) and Cu(110) Surfaces Schimizu T, Tsukada M
2205 - 2208	Theory of Scanning-Tunneling-Microscopy and Spectroscopy on Hydrogen-Adsorbed Si(100) Surface Uchiyama T, Tsukada M
2209 - 2210	Influence of a Ferromagnetic Tip on the Abrikosov Vortex Lattice in NbSe2 Studied by Low-Temperature Scanning-Tunneling-Microscopy Behler S, Pan SH, Bernasconi M, Jess P, Hug HJ, Fritz O, Guntherodt HJ
2211 - 2214	Measurement of Nanomechanical Properties of Metals Using the Atomic-Force Microscope Hues SM, Draper CF, Colton RJ
2215 - 2218	Atomic-Force Microscope for Chemical Sensing Nakagawa T, Ogawa K, Kurumizawa T
2219 - 2221	Accounting for the Stiffnesses of the Probe and Sample in Scanning Probe Microscopy Burnham NA
2222 - 2226	Direct Observation of the Atomic-Force Microscopy Tip Using Inverse Atomic-Force Microscopy Imaging Montelius L, Tegenfeldt JO, Vanheeren P
2227 - 2230	Friction Force Microscopy on Clean Surfaces of NaCl, NaF, and AgBr Howald L, Luthi R, Meyer E, Gerth G, Haefke HG, Overney R, Guntherodt HJ
2231 - 2236	Study and Control of Molecule Surface Interaction at the Atomic-Level - Sb4 on Si(001) Mo YW
2237 - 2242	Investigation of Scanning-Tunneling-Microscopy Tunneling Barrier Signals in Air and Water Song JP, Morch KA, Carneiro K, Tholen AR
2243 - 2246	Electric-Field Influence on the Observation of Molecules with a Scanning Tunneling Microscope Horber JK, Haberle W, Ruppersberg P, Niksch M, Smith DP, Binnig G
2247 - 2250	Systematic Studies on the Growth-Process of Superconducting YBa2Cu3O7-Delta and Bi2Sr2Cuoy Thin-Films by Scanning-Tunneling-Microscopy Zhu X, Xiong GC, Liu R, Li YJ, Lian GJ, Gan ZZ
2251 - 2253	Measurement and Manipulation of Van-der-Waals Forces in Atomic-Force Microscopy Hutter JL, Bechhoefer J