Particle & Particle Systems Characterization
Particle & Particle Systems Characterization, Vol.15, No.2 Entire volume, number list
ISSN: 0934-0866 (Print)
In this Issue (7 articles)
66 - 66 |
World Congress on Particle Technology 3 Scarlett B |
67 - 74 |
A review of elastic light scattering theories Wriedt T |
75 - 80 |
A device for phase shift measurement in an advanced phase Doppler velocimeter Evenstad J, Naqwi AA |
81 - 89 |
Comparative mass flux measurements in sprays using a patternator and the phase-Doppler technique Dullenkopf K, Willmann M, Wittig S, Schone F, Stieglmeier M, Tropea C, Mundo C |
90 - 99 |
A dissymmetry ratio optical technique as applied to scattering pattern recognition of differently shaped soot aggregates di Stasio S, Massoli P |
100 - 107 |
Pseudo-3D shape description for facetted materials Pons MN, Vivier H, Rolland T |
108 - 111 |
Conversion factors to convert particle size distributions measured by one method to those measured by another method Austin LG |