S1 - S1 |
Sixth International Conference on Silicon Epitaxy and Heterostructures Preface Xie YH, Liu JL, Bauer M |
S2 - S5 |
Low temperature growth of Ge1-xSnx buffer layers for tensile-strained Ge layers Shimura Y, Tsutsui N, Nakatsuka O, Sakai A, Zaima S |
S6 - S11 |
Multiscale simulation for epitaxial silicon carbide growth by chlorides route Masi M, Fiorucci A, Camarda M, La Magna A, La Via F |
S12 - S17 |
Analysis of silicon germanium vapor phase epitaxy kinetics Tomasini P, Machkaoutsan V, Thomas SG |
S18 - S22 |
Si1-xGex growth using Si3H8 by low temperature chemical vapor deposition Takeuchi S, Nguyen ND, Goosens J, Caymax M, Loo R |
S23 - S29 |
Antimony surfactant for epitaxial growth of SiGe buffer layers at high deposition temperatures Storck P, Vorderwestner M, Kondratyev A, Talalaev R, Amamchyan A, Woelk E |
S30 - S34 |
Formation and characterization of hybrid nanodot stack structure for floating gate application Miyazaki S, Makihara K, Ikeda M |
S35 - S37 |
Study of the effects of growth temperature and time on the alignment of Si quantum dots on hafnium oxide coated single wall carbon nanotubes Olmedo M, Martinez-Morales AA, Liu G, Yengel E, Ozkan CS, Lau CN, Ozkan M, Liu JL |
S38 - S43 |
Observation of discrete dopant potential and its application to Si single-electron devices Tabe M, Moraru D, Ligowski M, Anwar M, Yokoi K, Jablonski R, Mizuno T |
S44 - S47 |
B atomic layer doping of Ge Yamamoto Y, Kopke K, Kurps R, Murota J, Tillack B |
S48 - S52 |
Use of p- and n-type vapor phase doping and sub-melt laser anneal for extension junctions in sub-32 nm CMOS technology Nguyen ND, Rosseel E, Takeuchi S, Everaert JL, Yang L, Goossens J, Moussa A, Clarysse T, Richard O, Bender H, Zaima S, Sakai A, Loo R, Lin JC, Vandervorst W, Caymax M |
S53 - S56 |
Enabling Moore's Law beyond CMOS technologies through heteroepitaxy Thomas SG, Tomasini P, Bauer M, Vyne B, Zhang Y, Givens M, Devrajan J, Koester S, Lauer I |
S57 - S61 |
Electrical characteristics of thermal CVD B-doped Si films on highly strained Si epitaxially grown on Ge(100) by plasma CVD without substrate heating Sugawara K, Sakuraba M, Murota J |
S62 - S64 |
Heavy atomic-layer doping of nitrogen in Si1-xGex film epitaxially grown on Si(100) by ultraclean low-pressure CVD Kawashima T, Sakuraba M, Tillack B, Murota J |
S65 - S67 |
Antimony doped Si Esaki diodes without post growth annealing Oehme M, Kirfel O, Werner J, Kaschel M, Kasper E, Schulze J |
S68 - S71 |
Optimization of external poly base sheet resistance in 0.13 mu m quasi self-aligned SiGe:C HBTs You S, Van Huylenbroeck S, Nguyen ND, Sibaja-Hernandez A, Venegas R, Van Wichelen K, Decoutere S, De Meyer K |
S72 - S75 |
Simulation of a nanoscale strained Si NMOSFET with a silicon-carbon alloy stressor Huang J, Chang ST, Wang WC, Lee CC |
S76 - S79 |
Analysis of SiGe/Si quantum dot superlattices grown by low-pressure chemical vapor deposition for thin solar cells Lee ML, Dezsi G, Venkatasubramanian R |
S80 - S82 |
Epitaxially grown emitters for thin film silicon solar cells result in 16% efficiency Van Nieuwenhuysen K, Payo MR, Kuma-Filipek I, Van Hoeymissen J, Beaucarne G, Poortmans J |
S83 - S87 |
Germanium for silicon photonics Ishikawa Y, Wada K |
S88 - S91 |
Short-channel epitaxial germanium pMOS transistors Eneman G, De Jaeger B, Wang G, Mitard J, Hellings G, Brunco DP, Simoen E, Loo R, Caymax M, Claeys C, De Meyer K, Meuris M, Heyns MM |
S92 - S95 |
Influence of induced stress on enrichment kinetic during local Ge condensation of SiGe/SOI mesas Dechoux N, Damlencourt JF, Rivallin P, Brianceau P, Bernasconi S, Benevent V, Vallee C, Barbe JC, Billon T, Bensahel D |
S96 - S103 |
High permittivity materials for oxide gate stack in Ge-based metal oxide semiconductor capacitors Molle A, Baldovino S, Spiga S, Fanciulli M |
S104 - S112 |
Quest of electric field controlled spintronics in MnGe Wang KL, Xiu FX |
S113 - S117 |
Effect of thickness on structural and magnetic properties of Mn5Ge3 films grown on Ge(111) by solid phase epitaxy Spiesser A, Olive-Mendez SF, Dau MT, Michez LA, Watanabe A, Le Thanh V, Glachant A, Derrien J, Barski A, Jamet M |
S118 - S122 |
Structural properties of epitaxial SrHfO3 thin films on Si (001) Sawkar-Mathur M, Marchiori C, Fompeyrine J, Toney MF, Bargar J, Chang JP |
S123 - S127 |
Interface analysis of Ge ultra thin layers intercalated between GaAs substrates and oxide stacks Molle A, Lamagna L, Spiga S, Fanciulli M, Brammertz G, Meuris M |
S128 - S132 |
Chemical vapor deposition of large area few layer graphene on Si catalyzed with nickel films Liu W, Chung CH, Miao CQ, Wang YJ, Li BY, Ruan LY, Patel K, Park YJ, Woo J, Xie YH |
S133 - S135 |
Stability of silicon germanium stressors Tomasini P, Machkaoutsan V, Thomas SG, Loo R, Caymax M, Verheyen P |
S136 - S139 |
Effect of isochronal hydrogen annealing on surface roughness and threading dislocation density of epitaxial Ge films grown on Si Kobayashi S, Nishi Y, Saraswat KC |
S140 - S142 |
Heavy B atomic-layer doping in Si epitaxial growth on Si(100) using electron-cyclotron-resonance plasma CVD Nosaka T, Sakuraba M, Tillack B, Murota J |
S143 - S146 |
Numerical studies of temperature profile and hydrodynamic phenomena during excimer laser assisted heteroepitaxial growth of patterned silicon and germanium bi-layers Conde JC, Chiussi S, Martin E, Gontad F, Fornarini L, Leon B |
S147 - S150 |
Structural change of direct silicon bonding substrates by interfacial oxide out-diffusion annealing Kato T, Nakamura Y, Kikkawa J, Sakai A, Toyoda E, Izunome K, Nakatsuka O, Zaima S, Imai Y, Kimura S, Sakata O |
S151 - S153 |
Determination of substitutional carbon content in rapid thermal chemical vapour deposited Si-1 (-) (x) (-) yGexCy on Si (100) using Raman spectroscopy Wasyluk J, Perova TS, Meyer F |
S154 - S158 |
Effective mass and subband structure of strained Si in a PMOS inversion layer with external stress Chang ST, Huang J, Tang M, Lin CY |
S159 - S161 |
Extended study of the step-bunching mechanism during the homoepitaxial growth of SiC Camarda M, La Magna A, Severino A, La Via F |
S162 - S164 |
Ion energy and dose dependence of strain relaxation for thin SiGe buffer layers using Si+ implantation Hoshi Y, Sawano K, Yamada A, Arimoto K, Usami N, Nakagawa K, Shiraki Y |
S165 - S169 |
High-quality 6 inch (111) 3C-SiC films grown on off-axis (111) Si substrates Severino A, Bongiorno C, Piluso N, Italia M, Camarda M, Mauceri M, Condorelli G, Di Stefano MA, Cafra B, La Magna A, La Via F |
S170 - S173 |
Giant growth of single crystalline Ge on insulator by seeding lateral liquid-phase epitaxy Tanaka T, Tanaka M, Itakura M, Sadoh T, Miyao M |
S174 - S178 |
Al-induced low-temperature crystallization of Si-1 (-) Ge-x(x) (0 < x < 1) by controlling layer exchange process Kurosawa M, Sadoh T, Miyao M |
S179 - S181 |
Formation of single-crystalline Ge stripes on quartz substrates by SiGe mixing-triggered liquid-phase epitaxy Toko K, Tanaka T, Sadoh T, Miyao M |
S182 - S185 |
Liquid-phase epitaxial growth of Ge island on insulator using Ni-imprint-induced Si crystal as seed Toko K, Sakane T, Tanaka T, Sadoh T, Miyao M |
S186 - S189 |
Fabrication of double-dot single-electron transistor in silicon nanowire Jo M, Kaizawa T, Arita M, Fujiwara A, Ono Y, Inokawa H, Choi JB, Takahashi Y |
S190 - S195 |
Kinetic investigation of the electrochemical synthesis of vertically-aligned periodic arrays of silicon nanorods on (001)Si substrate Cheng SL, Chen CY, Lee SW |
S196 - S199 |
Composition redistribution of self-assembled Ge islands on Si (001) during annealing Lee SW, Chang HT, Lee CH, Cheng SL, Liu CW |
S200 - S203 |
Novel chemical precursors and novel CVD strategies enabling low temperature epitaxy of Si and Si:C alloys Bauer M, Thomas SG |
S204 - S207 |
Optical and structural investigation of Si nanoclusters in amorphous hydrogenated silicon Shcherbyna YS, Torchynska TV |
S208 - S211 |
Surface phonons and exciton-polariton coupling in SiC nanocrystals Polupan G, Torchynska TV |
S212 - S216 |
Multiple energy transfer in porous silicon/Rh6G/RhB nanocomposite evidenced by photoluminescence and its polarization memory Chouket A, Elhouichet H, Koyama H, Gelloz B, Oueslati M, Koshida N |
S217 - S221 |
Controlling dislocation positions in silicon germanium (SiGe) buffer layers by local oxidation Hu Q, Seo I, Zhang ZN, Lee SH, Kim HM, Kim SH, Kim YS, Lee HH, Xie YH, Kim KB, Yoon TS |
S222 - S225 |
Heavy carbon atomic-layer doping at Si-1 (-) Ge-x(x)/Si heterointerface Hirano T, Sakuraba M, Tillack B, Murota J |
S226 - S230 |
Formation processes of Ge3N4 films by radical nitridation and their electrical properties Kato K, Kondo H, Sakashita M, Zaima S |
S231 - S233 |
Impact of Si cap layer growth on surface segregation of P incorporated by atomic layer doping Chiba Y, Sakuraba M, Tillack B, Murota J |
S234 - S236 |
Influence of the modulation doping to the mobility of two-dimensional electron gases in Si/SiGe Werner J, Oehme M, Kasper E, Schulze J |
S237 - S240 |
Metal-oxide-semiconductor SiGe/Si quantum dot infrared photodetectors with delta doping in different positions Lin CH, Liu CW |
S241 - S245 |
Strain engineering of nanoscale Si MOS devices Huang J, Chang ST, Hsieh BF, Liao MH, Wang WC, Lee CC |
S246 - S249 |
The gap state density of micro/nano-crystalline silicon active layer on flexible substrate Lee MH, Chang ST, Lee CC, Huang JJ, Hu GK, Huang YS |
S250 - S254 |
TCAD simulation of hydrogenated amorphous silicon-carbon/microcrystalline-silicon/hydrogenated amorphous silicon-germanium PIN solar cells Chang ST, Tang M, He RY, Wang WC, Pei Z, Kung CY |
S255 - S258 |
Si/Ge/Si double heterojunction solar cells Lin CH |
S259 - S261 |
Simulation of nanorod structures for an amorphous silicon-based solar cell Tang M, Chang ST, Chen TC, Pei ZW, Wang WC, Huang J |
S262 - S265 |
Self-assembled Ge/Si hetero-nanocrystals for nonvolatile memory application Li B, Liu JL |
S266 - S269 |
Long range Mn segregation and intermixing during subsequent deposition of Ge capping layers on Mn5Ge3/Ge(111) hetero structures Dau MT, Spiesser A, LeGiang T, Michez LA, Olive-Mendez SF, Le Thanh V, Petit M, Raimundo JM, Glachant A, Derrien J |
S270 - S272 |
Phosphorus doping of silicon at substrate temperatures above 600 degrees C Thompson PE, Jernigan GG, Simons D, Chi P, Jonker BT, van 't Erve OMJ |
S273 - S277 |
Molecular beam epitaxial growth of ferromagnetic Heusler alloys for group-IV semiconductor spintronic devices Miyao M, Hamaya K, Sadoh T, Itoh H, Maeda Y |
S278 - S280 |
Epitaxial growth of a full-Heusler alloy CO2FeSi on silicon by low-temperature molecular beam epitaxy Yamada S, Yamamoto K, Ueda K, Ando Y, Hamaya K, Sadoh T, Miyao M |
S281 - S284 |
Investigation of the electrical properties of the alkaline-earth oxides BaO, SrO and Ba0.7Sr0.30 on Si(001) as alternative gate dielectrics Cosceev A, Muller-Sajak D, Pfnur H, Hofmann KR |