1 - 7 |
Raman and Rutherford Backscattering Analyses of Cubic SiC Thin-Films Grown on Si by Vertical Chemical-Vapor-Deposition Feng ZC, Tin CC, Williams J |
8 - 13 |
Characterization of a DC Titanium Tetraisopropoxide/H-2/N-2 Plasma Using Emission-Spectroscopy Kulakowskapawlak B, Zyrnicki W |
14 - 19 |
Optical and Structural-Properties of SiOx and Sinx Materials Dehan E, Templeboyer P, Henda R, Pedroviejo JJ, Scheid E |
20 - 30 |
Relation Between Solution Chemistry and Morphology of SnO2-Based Thin-Films Deposited by a Pyrosol Process Smith A, Laurent JM, Smith DS, Bonnet JP, Clemente RR |
31 - 37 |
Thin Oxide-Films on Indium - Impedance Spectroscopy Investigation of Reductive Decomposition Omanovic S, Metikoshukovic M |
38 - 47 |
Electron-Phonon Interaction and Low-Field Drift Mobility in a Polar Semiconductor Quantum-Well Leon H, Garciamoliner F, Velasco VR |
48 - 51 |
The Tribological Properties of Ceramic Coatings Modified by Molybdenum Films Under Oil-Lubricated Conditions Wei JJ, Zhang XS, Xue QJ |
52 - 57 |
Microstructure and Residual-Stress of Very Thin Mo Films Adams DP, Parfitt LJ, Bilello JC, Yalisove SM, Rek ZU |
58 - 61 |
X-Ray Photoelectron-Spectroscopy Analysis of Thermal and Plasma-Treated Steel Substrates and Their Interface Formed with an Aluminum Layer Lahmar A, Scudeller Y, Danes F, Bardon JP |
62 - 68 |
Optical-Recording Characteristics of Sb2Se3 Thin-Films Using a CW-Ar+ Laser Jayakumar S, Balasubramanian C, Narayandass SK, Mangalaraj D, Vallabhan CP |
69 - 77 |
Neutron and X-Ray Reflectivity Study of Ba Salts of Alternating Bilayers of Deuterated and Hydrogenated Stearic-Acid Wiesler DG, Feigin LA, Majkrzak CF, Ankner JF, Berzina TS, Troitsky VI |
78 - 82 |
Transformation of Amorphous Si0.9Ge0.1 and Si Films by Laser Annealing Wode SA, Dettmer K, Kessler FR |
83 - 88 |
Thin-Film Microstructure Modeling Through Line-Segment Simulation Friedrich LJ, Dew SK, Brett M, Smy T |