Thin Solid Films

Thin Solid Films, Vol.424, No.1 Entire volume, number list

ISSN: 0040-6090 (Print)

In this Issue (29 articles)

1 - 1	Thin films: stress, strain and structure-property relations -Preface Yeadon M, Zeng KY, Hoon HH, Twesten RD, Abothu R
2 - 8	Quantitative characterization of self-assembled coherent islands Liu CP, Gibson JM
9 - 14	Morphological evolution driven by strain induced surface diffusion Zhang YW, Bower AF, Liu P
15 - 22	On the island nucleation process in LPOMVPE In0.2Ga0.8As/GaAs multilayers grown on GaAs and AlAs buffers Gartstein E, Mogilyanski D, Golan R, Fekete D
23 - 27	Effects of hydrostatic pressure on Raman scattering in Ge quantum dot superlattices Qin L, Shen ZX, Teo KL, Peng CS, Zhou JM, Tung CH, Tang SH
28 - 32	In situ ultrahigh vacuum transmission electron microscopy studies of palladium silicide island formation on silicon(111) 7x7 surface Takeguchi M, Liu J, Zhang Q, Tanaka M, Furuya K
33 - 39	Effects of stress on the interfacial reactions of metal thin films on (001)Si Cheng SL, Lo HM, Cheng LW, Chang SM, Chen LJ
40 - 44	Study of step instability on Si surfaces Minoda H
45 - 49	Motion and conversion energies of adatom and adatom clusters on gold (001) surface Takano J, Doyama M, Kogure Y
50 - 55	Quantitative characterization of the composition, thickness and orientation of thin films in the analytical electron microscope Williams DB, Watanabe M, Papworth AJ, Li JC
56 - 60	Thin films of iron oxide by low pressure MOCVD using a novel precursor: tris(t-butyl-3-oxo-butanoato)iron(III) Shalini K, Subbanna GN, Chandrasekaran S, Shivashankar SA
61 - 65	Optical property of Eu in strontium barium niobate optical thin film grown by pulsed laser deposition Liu H, Li ST, Fernandez FE, Liu GK
66 - 69	Determination of optical constants of Cd1-xZnxTe thin films by spectroscopic ellipsometry Prabakar K, Sridharan M, Narayandass SK, Mangalaraj D, Gopal V
70 - 74	Ferroelectric and dielectric properties of sol-gel derived BaxSr1-xTiO3 thin films Adikary SU, Chan HLW
75 - 78	Determination of the nature of principal scattering mechanism in well-annealed vacuum deposited thin films of the ternary thermoelectric material Bi-2(Te0.8Se0.2)(3) Das VD, Mallik RC
79 - 83	Structure of post-annealed ferroelectric PbZrxTi1-xO3 and SrBi2Ta2O9 thin films Gao JX, Liu EJ, Zhang ZB, Cao JQ, Zeng AP
84 - 87	Landau-Khalatnikov simulations for the effects of external stresses on the ferroelectric properties of Pb(Zr,Ti)O-3 thin films Song TK, Kim JS, Kim MH, Lim W, Kim YS, Lee J
88 - 92	Plastic deformation of copper thin foils Nozaki N, Doyama M, Kogure Y
93 - 98	Sputter deposited nanocrystalline Ni-25Al alloy thin films and Ni/Ni3Al multilayers Banerjee R, Thompson GB, Anderson PM, Fraser HL
99 - 102	Nanometric-layered CrN/TiN thin films: mechanical strength and thermal stability Zeng XT, Zhang S, Sun CQ, Liu YC
103 - 106	Effects of energetic particle bombardment on residual stress, microstrain and grain size of plasma-assisted PVD Cr thin films Hsieh JH, Li C, Wu W, Hochman RF
107 - 114	Interfacial structure, residual stress and adhesion of diamond coatings deposited on titanium Fu YQ, Du HJ, Sun CQ
115 - 119	A shaft-loaded blister test for elastic response and delamination behavior of thin film-substrate system Xu XJ, Shearwood C, Liao K
120 - 124	Mechanical integrity and adhesion of thin films for applications in electronics packaging and cell biology Duan J, Wan KT, Chian KS
125 - 129	Steel surface treatment by a dual process of ion nitriding and thermal shock Feugeas JN, Gomez BJ, Nachez L, Lesage J
130 - 138	Time evolution of Cr and N on AISI 304 steel surface during pulsed plasma ion nitriding Feugeas JN, Gomez BJ, Sanchez G, Ferron J, Craievich A
139 - 142	2 MeV proton channeling contrast microscopy of LEO GaN thin film structures Osipowicz T, Teo EJ, Bettiol AA, Watt F, Hao MS, Chua SJ
143 - 147	Correlation between the composition, structure and properties of dual ion beam deposited SiNx films Tsang MR, Ong CW, Choy CL, Lim PK, Hung WW
148 - 151	Defects in silicon oxynitride films Futatsudera M, Kimura T, Matsumoto A, Inokuma T, Kurata Y, Hasegawa S