1 - 8 |
Shape, size, strain and correlations in quantum dot systems studied by grazing incidence X-ray scattering methods Metzger TH, Kegel I, Paniago R, Lorke A, Peisl J, Schulze J, Eisele I, Schittenhelm P, Abstreiter G |
9 - 12 |
Self-aggregation of InAs quantum dots on (N11) GaAs substrates Sanguinetti S, Fortina SC, Miotto A, Grilli E, Guzzi M, Henini M, Polimeni A, Eaves L |
13 - 15 |
Growth of solution cast macromolecular pi-conjugated nanoribbons on mica Samori P, Francke V, Mullen K, Rabe JP |
16 - 21 |
Adsorption induced giant faceting of vicinal Si(001) Horn-von Hoegen M, Heringdorf FJMZ, Kahler D, Schmidt T, Bauer E |
22 - 25 |
Formation of highly uniform InGaAs ridge quantum wires by selective molecular beam epitaxy on novel InP patterned substrates Fujikura H, Kihara M, Hasegawa H |
26 - 28 |
Retarded diffusion of boron in Si due to the formation of an epitaxial CoSi2 layer Kappius L, Bay HL, Mantl S, Tyagi AK, Breuer U, Becker JS |
29 - 33 |
Surfactant-mediated epitaxy of Ge on Si: progress in growth and electrical characterization Kammler M, Reinking D, Hofmann KR, Horn-von Hoegen M |
34 - 37 |
Growth of Ge on H-terminated Si(111) surface Ishii K, Kuriyama H, Ezoe K, Yamamoto T, Ikeda M, Matsumoto S |
38 - 41 |
TEM study of InAs self-assembled quantum dots in GaAs Muller E, Ribeiro E, Heinzel T, Ensslin K, Medeiros-Ribeiro G, Petroff PM |
42 - 48 |
Relation of initial thin film formation to defects induced by low energy ions Durand HA, Sekine K, Etoh K, Ito K, Kataoka I |
49 - 52 |
Role of hydrogen during Si capping of strained Ge or Si1-xGex hut clusters Dentel D, Bischoff JL, Kubler L, Bolmont D |
53 - 57 |
Cluster-size distribution of SiGe alloys grown by MBE Pinto N, Murri R, Rinaldi R |
58 - 62 |
Structural properties of Ge nano-crystals embedded in SiO2 films from X-ray diffraction and Raman spectroscopy Rolo AG, Vasilevskiy MI, Conde O, Gomes MJM |
63 - 68 |
Growth of III-V semiconductor layers on Si patterned substrates Gorbach TY, Holiney RY, Matveeva LA, Smertenko PS, Svechnikov SV, Venger EF, Ciach R, Faryna M |
69 - 72 |
The influence of carbon on the surface morphology of Si(100) and on subsequent Ge island formation Butz R, Luth H |
73 - 75 |
Composition and structure of Ge islands grown on Si(001) and of SiGe grown on Si mesa Regelman DV, Magidson V, Beserman R, Dettmer K |
76 - 79 |
TEM studies of self-organization phenomena in CdSe fractional monolayers in a ZnSe matrix Sitnikova A, Sorokin S, Sedova I, Shubina T, Toropov A, Ivanov S, Falk L, Willander M |
80 - 83 |
Study of InAs quantum dots in GaAs prepared on misoriented substrates Oswald J, Hulicius E, Vorlicek V, Pangrac J, Melichar K, Simecek T, Lippold G, Riede V |
84 - 88 |
Orientation of aluminum nuclei on Si(100) and Si(111) Bisch C, Boellaard E, Janssen GCAM, Alkemade PFA, Radelaar S |
89 - 91 |
Epitaxial growth at high rates with LEPECVD Rosenblad C, Graf T, Stangl J, Zhuang Y, Bauer G, Schulze J, von Kanel H |
92 - 95 |
Structural characterization of SiGe step graded buffer layers grown on prestructured Si[001] substrates by molecular beam epitaxy Muller E, Hartmann R, David C, Grutzmacher D |
96 - 99 |
TEM investigation of the dependence of structural defects on prelayer formation in GaAs-on-Si thin films Lioutas CB, Delimitisi A, Georgakilas A |
IX - IX |
Papers presented at the 1998 E-MRS spring conference, symposium D: Thin Films Epitaxial Growth and Nanostructures Strasbourg, France, June 16-19, 1998 - Preface Kasper E, Wang KL, Hasegawa H |
100 - 103 |
STM study of step graded Si1-xGex/Si(001) buffers Kummer M, Vogeli B, Von Kanel H |
104 - 108 |
Ion assisted MBE growth of SiGe nanostructures Bauer M, Oehme M, Lyutovich K, Kasper E |
109 - 111 |
Coalescence of germanium islands on silicon Schollhorn C, Oehme M, Bauer M, Kasper E |
112 - 115 |
Dislocation pattern formation in epitaxial structures based on SiGe alloys Yugova TG, Vdovin VI, Mil'vidskii MG, Orlov LK, Tolomasov VA, Potapov AV, Abrosimov NV |
116 - 119 |
Defect distribution and morphology development of SiGe layers grown on Si(100) substrates by LPE Sembian AM, Konuma M, Silier I, Gutjahr A, Rollbuhler N, Banhart F, Babu SM, Ramasamy P |
120 - 123 |
Annealing of CaF2 adlayers grown on Si(111): investigations of the morphology by atomic force microscopy Wollschlager J, Pietsch H, Kayser R, Klust A |
124 - 129 |
The influence of stress on growth instabilities on Si substrates Lapena L, Berbezier I, Gallas B, Joyce B |
130 - 136 |
Silicon quantum integrated circuits - an attempt to fabricate silicon-based quantum devices using CMOS fabrication techniques Paul DJ, Coonan B, Redmond G, O'Neill BJ, Crean GM, Hollander B, Mantl S, Zozoulenko I, Berggren KF, Lazzari JL, d'Avitaya FA, Derrien J |
137 - 140 |
Assessment of transport parameters for the design of high speed Si/SiGe HBTs with compositionally graded base Weller J, Jorke H, Strohm K, Luy JF, Kibbel H, Herzog HJ, Sauer R |
141 - 144 |
Carrier mobilities in modulation doped Si1-xGex heterostructures with respect to FET applications Hock G, Gluck M, Hackbarth T, Herzog HJ, Kohn E |
145 - 148 |
Simulation of a non-invasive charge detector for quantum cellular automata Iannaccone G, Ungarelli C, Macucci M, Amirante E, Governale M |
149 - 152 |
Domain wall splitting and creation of the fine domain structure Dorfman S, Fuks D, Gordon A, Kotomin E |
153 - 155 |
Pulsed laser deposition of SmBaCuO thin films Di Trolio A, Morone A, Orlando S, Cappuccio G |
156 - 159 |
Epitaxial zirconia films on sapphire substrates Mary C, Guinebretiere R, Trolliard G, Soulestin B, Villechaize P, Dauger A |
160 - 162 |
Growth and magnetism of Co/NiO(111) thin films Mocuta C, Barbier A, Renaud G, Dieny B |
163 - 167 |
Epitaxial growth of LiNbO3 on alpha Al2O3(0001) Veignant F, Gandais M, Aubertl P, Garry G |
168 - 171 |
MgO surface microstructure and crystalline coherence of Co/Pt superlattices Haibach P, Koble J, Huth M, Adrian H |
172 - 175 |
Fabrication and electrical properties of sol-gel derived (BaSr)TiO3 thin films with metallic LaNiO3 electrode Wu D, Li AD, Liu ZG, Ling HQ, Ge CZ, Liu XY, Wang H, Wang M, Lu P, Ming NB |
176 - 178 |
Two-dimensional and zero-dimensional structures of semimagnetic semiconductors prepared by pulsed laser deposition Savchuk AI, Stolyarchuk ID, Medynskiy SV, Perrone A, Nikitin PI |
179 - 182 |
RHEED investigation of limiting thickness epitaxy during low-temperature Si-MBE on (100) surface Nikiforov AI, Kanter BZ, Pchelyakov OP |
183 - 187 |
The influence of growth temperature on the period of RHEED oscillations during MBE of Si and Ge on Si(111) surface Nikiforov AI, Markov VA, Cherepanov VA, Pchelyakov OP |
188 - 190 |
Electrical properties of HgCdTe films obtained by laser deposition Wisz G, Virt I, Kuzma M |
191 - 195 |
The growth kinetics of Si1-xGex layers from SiH4 and GeH4 Potapov AV, Orlov LK, Ivin SV |
196 - 200 |
Crystal microstructure of PbTe/Si and PbTe/SiO2/Si thin films Ugai YA, Samoylov AM, Sharov MK, Tadeev AV |
201 - 204 |
The growth of an intermediate CoSi phase during the formation of epitaxial CoSi2 by solid phase reaction Falke M, Gebhardt B, Beddies G, Teichert S, Hinneberg HJ |
205 - 207 |
Valence band splitting in Cd(1-x)ZnxTe epilayers Cohen K, Beserman R, Stolyarova S, Weil R, Nemirovsky Y |
208 - 212 |
Diffusion of Cd, Mg and S in ZnSe-based quantum well structures Strassburg M, Kuttler M, Pohl UW, Bimberg D |
213 - 217 |
Epitaxial growth of ZnS on CdS in CdS/ZnS nanostructures Ricolleau C, Audinet L, Gandais M, Gacoin T |
218 - 221 |
Correlation between the sign of strain and the surface morphology and defect structure of InAlAs grown on vicinal (111)BInP Georgakilas A, Tsagaraki K, Harteros K, Hatzopoulos Z, Vila A, Becourt N, Peiro F, Cornet A, Chrysanthakopoulos N, Calamiotou M |
222 - 226 |
Allotaxy in the Ni-Si system Teichert S, Falke M, Giesler H, Beddies G, Hinneberg HJ |
227 - 231 |
Influence of grown-in defects on the optical and electrical properties of Si/Si1-xGex/Si heterostructures Loo R, Caymax M, Simoen E, Howard D, Goryll M, Klaes D, Vescan L, Gravesteijn D, Pettersson H, Zhang X |
232 - 235 |
Low temperature epitaxial growth of Si on Si(111) by gas-source MBE with heat-pulse annealing Ishikawa T, Okumura H, Akane T, Sano M, Giraud S, Nakabayashi Y, Matsumoto S |
236 - 239 |
Strong surface segregation of Sb atoms at low temperatures during Si molecular beam epitaxy Jiang ZM, Pei CW, Liao LS, Zhou XF, Zhang XJ, Wang X, Jia QJ, Jiang XM, Ma ZH, Smith TR, Sou IK |
240 - 243 |
Photoluminescence of self-assembled Ge dots grown by ultra-high-vacuum chemical vapor deposition Boucaud P, Le Thanh V, Sauvage S, Debarre D, Bouchier D, Lourtioz JM |
244 - 247 |
Morphology and photoluminescence of Ge islands grown on Si(001) Goryll M, Vescan L, Luth H |
248 - 251 |
C-induced Ge dots: a versatile tool to fabricate ultra-small Ge nanostructures Schmidt OG, Lange C, Eberl K, Kienzle O, Ernst F |
252 - 255 |
Lateral ordering of self-assembled Ge islands Zhu JH, Brunner K, Abstreiter G, Kienzle O, Ernst F |
256 - 261 |
Self organization of Ge dots on Si substrates: influence of misorientation Abdallah M, Berbezier I, Dawson P, Serpentini M, Bremond G, Joyce B |
262 - 270 |
Low-energy electron microscopy of nanoscale three-dimensional SiGe islands on Si(100) Sutter P, Mateeva E, Sullivan JS, Lagally MG |
271 - 276 |
X-ray diffraction analysis of strain relaxation in free standing and buried GaAs/GaInAs/GaAs SQW lateral structures Darowski N, Pietsch U, Wang KH, Forchel A, Shen Q, Kycia S |
277 - 280 |
Dislocation half loop formation in GaSb/(001)GaAs islands and steps role: a Monte Carlo simulation Dalla Torre J, Rouhani MD, Landa G, Rocher AM, Malek R, Esteve D |
281 - 285 |
Early stages of growth and nanostructure of Pb(Zr,Ti)O-3 thin films observed by atomic force microscopy Craciun F, Verardi P, Dinescu M, Dinelli F, Kolosov O |
286 - 290 |
Dynamical properties of trions and excitons in modulation doped CdTe/CdMgZnTe quantum wells Brinkmann D, Kudrna J, Vanagas E, Gilliot P, Levy R, Arnoult A, Cibert J, Tatarenko S |
291 - 294 |
Structural studies of epitaxial PbTiO3 films by optical second harmonic generation Mishina ED, Sherstyuk NE, Misyuraev TV, Sigov AS, Grishin AM, Rasing T, Aktsipetrov OA |
295 - 298 |
Spectroscopic study of nanocrystalline TiO2 thin films grown by atomic layer deposition Suisalu A, Aarik J, Mandar H, Sildos I |
299 - 305 |
The vertical heterojunction MOSFET De Meyer K, Caymax M, Collaert N, Loo R, Verheyen P |
306 - 308 |
Selectively grown vertical Si MOS transistor with reduced overlap capacitances Klaes D, Moers J, Tonnesmann A, Wickenhauser S, Vescan L, Marso M, Grabolla T, Grimm M, Luth H |
309 - 312 |
Optimization of the channel doping profile of vertical sub-100 nm MOSFETs Kaesen F, Fink C, Anil KG, Hansch W, Doll T, Grabolla T, Schreiber H, Eisele I |
313 - 318 |
Comparison of lateral and vertical Si-MOSFETs with ultra short channels Behammer D, Zeuner M, Hackbarth T, Herzog J, Schafer M, Grabolla T |
319 - 322 |
New virtual substrate concept for vertical MOS transistors Kasper E, Lyutovich K, Bauer M, Oehme M |
323 - 325 |
Optical and electrical characterization of SiGe layers for vertical sub-100 nm MOS transistors Zhang XH, Unelind P, Kleverman M, Olajos J |
326 - 331 |
Determination of light amplification processes in MOCVD grown ZnCdSe GRINSCH structures Mikulskas I, Brinkmann D, Luterova K, Tomasiunas R, Honerlage B, Vaitkus JV, Aulombard RL, Cloitre T |
332 - 335 |
Formation of zero-dimensional hole states in Ge/Si heterostructures probed with capacitance spectroscopy Yakimov AI, Dvurechenskii AV, Nikiforov AI, Pchelyakov OP |
336 - 339 |
Hole mobilities in pseudomorphic Si1-x-yGexCy alloy layers Duschl R, Seeberger H, Eberl K |
340 - 343 |
Thin tantalum pentoxide films deposited by photo-induced CVD Zhang JY, Lim B, Boyd IW |
344 - 346 |
Tunnelling currents in very narrow p(+)-n(+) junctions Reitemann G, Kasper E, Kibbel H, Jorke H |
347 - 349 |
Optical on wafer measurement of Ge content of virtual SiGe-substrates Oehme M, Bauer M |
350 - 353 |
Oscillatoric bias dependence of DC-electric field induced second harmonic generation from SiSiO2 multiple quantum wells Savkin VV, Fedyanin AA, Pudonin FA, Rubtsov AN, Aktsipetrov OA |
354 - 357 |
The determination of e(14) in (111)B-grown (In,Ga)As/GaAs strained layers Ballet P, Disseix P, Leymarie J, Vasson A, Vasson AM, Grey R |
358 - 361 |
Photoluminescence studies of As-P exchange in GaAs/GaInP2 quantum wells grown by chemical beam epitaxy Aurand A, Leymarie J, Vasson A, Vasson AM, Mesrine M, Deparis C, Leroux M |
362 - 365 |
Characterization of inhomogeneous films by multiple-angle ellipsometry Colard S, Mihailovic M |
366 - 369 |
Magnetoluminescence measurements of two-dimensional hole gas Ciorga M, Bryja L, Misiewicz J, Hansen OP |
370 - 372 |
Optical pumping in strained InxGa1-xAs/GaAs quantum wells Hassen F, Sghaier H, Maaref H, Murray R |
373 - 376 |
RF-sputtering deposition of Al/Al2O3 multilayers Paven-Thivet L, Malibert C, Houdy P, Albouy PA |
377 - 380 |
Optical studies of carrier transport phenomena in CdSe/ZnSe fractional monolayer superlattices Shubina TV, Toropov AA, Sorokin SV, Ivanov SV, Kop'ev PS, Pozina GR, Bergman JP, Monemar B |
381 - 385 |
Raman and photoreflectance studies of electronic band bending at ZnSe/GaAs interfaces Pages O, Erguig H, Wagner V, Zaoui A, Laurenti JP, Gueurts J, Aourag H, Aulombard RL, Certier M |
386 - 390 |
TEM and AFM study of perovskite conductive LaNiO3 films prepared by metalorganic decomposition Li AD, Wu D, Liu ZG, Ge CZ, Liu XY, Chen GX, Ming NB |