1 - 4 |
Roughness and critical exponents analysis of diamond films by AFM imaging Salvadori MC, Silveira MG, Cattani M |
5 - 8 |
Effect of an initially sulphur-rich sprayed solution on CuInS2 thin films Bihri H, Abd-Lefdil M |
9 - 12 |
Electrical characterisation of thin silicon oxynitride films deposited by low pressure chemical vapour deposition Hajji B, Temple-Boyer P, Olivie F, Martinez A |
13 - 18 |
Micropatterning of SiO2 film using organosilicon nanocluster as a precursor Watanabe A, Fujitsuka M, Ito O |
19 - 23 |
Structural and optical modification in hafnium oxide thin films related to the momentum parameter transferred by ion beam assistance Alvisi M, Scaglione S, Martelli S, Rizzo A, Vasanelli L |
24 - 28 |
Cubic boron nitride thin film synthesis on silica substrates by low-pressure inductively-coupled r.f. plasma chemical vapor deposition Chattopadhyay KK, Matsumoto S, Zhang YF, Sakaguchi I, Nishitani-Gamo M, Ando T |
29 - 33 |
A self-ion assisted beam (SIAB) source based upon unvala electron beam scheme Choi WK, Song JH, Kim KH, Lee CM, Choi SC, Song JH, Jung HJ |
34 - 37 |
Influence of oxidation and carbon-containing contamination in the stabilization of the luminescence in porous silicon Guerrero-Lemus R, Moreno JD, Martin-Palma RJ, Ben-Hander F, Martinez-Duart JM, Fierro JLG, Gomez-Garrido P |
38 - 42 |
Photo-excitation effects on pyrolysis of metallo-organic precursors for yttria-stabilized zirconia thin films Matsuzaki Y, Hishinuma M, Yasuda I |
43 - 49 |
Statistical evaluation of refractive index, growth rate, hardness and Young's modulus of aluminium oxynitride films Dreer S, Krismer R, Wilhartitz P, Friedbacher G |
50 - 54 |
Microstructure and metal-insulator transition of NdNiO3 thin films on various substrates Laffez P, Zaghrioui M, Monot I, Brousse T, Lacorre P |
55 - 58 |
Heteroepitaxial growth of La0.7Ca0.3MnO3/SrTiO3/TiN/Si by pulsed laser deposition Wong KH, Leung YS |
59 - 65 |
Characterisation of magnetron sputter deposited MoSx/metal multilayers Simmonds MC, Savan A, Van Swygenhoven H, Pfluger E |
66 - 72 |
XPS depth profile analysis of sol-gel calcium-modified lead titanate thin films Leinen D, Sirera R, Rodriguez-Castellon E, Calzada ML |
73 - 81 |
Structural and optical characterization of amorphous and crystalline evaporated WO3 layers Antonaia A, Polichetti T, Addonizio ML, Aprea S, Minarini C, Rubino A |
82 - 86 |
Texture and cross-sectional microstructure of MgO films grown on silicon dioxide by electron-beam evaporation Lee JS, Ryu BG, Kwon HJ, Jeong YW, Kim HH |
87 - 92 |
Characterization of granular Ag films grown by low-energy cluster beam deposition Bouwen W, Kunnen E, Temst K, Thoen P, Van Bael MJ, Vanhoutte F, Weidele H, Lievens P, Silverans RE |
93 - 99 |
Growth and structural characterization of Pb/Fe layered system Lazar L, Westerholt K, Zabel H, Goryunov YV, Garifullin IA |
100 - 105 |
Deposition of transparent and conducting indium-tin-oxide films by the r.f.-superimposed DC sputtering technology Bender M, Trube J, Stollenwerk J |
106 - 110 |
Studies of amorphous carbon using X-ray photoelectron spectroscopy, near-edge X-ray-absorption fine structure and Raman spectroscopy Ramm M, Ata M, Brzezinka KW, Gross T, Unger W |
111 - 117 |
Effect of pre-annealing on physical and electrical properties of SrBi2Ta2O9 thin films prepared by chemical solution deposition Chung CW, Chung I |
118 - 128 |
Effects of cemented carbide surface pretreatment in combustion flame chemical vapour deposition of diamond Marinkovic S, Stankovic S, Rakocevic Z |
129 - 135 |
Characterization of the PEDOT-PSS system by means of X-ray and ultraviolet photoelectron spectroscopy Greczynski G, Kugler T, Salaneck WR |
136 - 141 |
Langmuir films of polystyrene-b-poly(alkyl acrylate) diblock copolymers Li S, Clarke CJ, Eisenberg A, Lennox RB |
142 - 147 |
Correlation of hydrogen-facilitated pitting of AISI 304 stainless steel to semiconductivity of passive films Yang MZ, Luo JL, Patchet BM |
148 - 153 |
Silicon carbonitride, a new hard material and its relation to the confusion about 'harder than diamond' C3N4 Badzian A, Badzian T, Roy R, Drawl W |
154 - 161 |
Elastic-plastic deformation analysis of multi-layer surface coating under sliding contact Pan XX, Yan L, Xu JJ |
162 - 168 |
Effect of oxygen content and thickness of sputtered RuOx electrodes on the ferroelectric and fatigue properties of sol-gel PZT thin films Law CW, Tong KY, Li JH, Li K, Poon MC |
169 - 175 |
Morphology and optical properties of gold thin films prepared by filtered are deposition Bendavid A, Martin PJ, Wieczorek L |
176 - 186 |
Simultaneous measurement of spectral optical properties and thickness of an absorbing thin film on a substrate Chen JJ, Lin JD, Sheu LJ |
187 - 194 |
Optimized calibration method for Fourier transform infrared phase-modulated ellipsometry Garcia-Caurel E, Bertran E, Canillas A |
195 - 200 |
In-situ annealing effect of sputter-deposited Nd1Ba2Cu3O7-delta thin films Mori Z, Nozoe S, Yokoyama N, Koba S, Doi T, Higo S, Hakuraku Y |
201 - 207 |
Mediated electron transfer across supported bilayer lipid membrane (s-BLM) Asaka K, Ottova A, Tien HT |
208 - 214 |
Self-assembled thin films of organo-metal complexes Salditt T, An QR, Plech A, Peisl J, Eschbaumer C, Weidl CH, Schubert US |
215 - 221 |
Langmuir monolayers of lignins obtained with different isolation methods Barros AM, Dhanabalan A, Constantino CJL, Balogh DT, Oliveira ON |
222 - 226 |
Investigation on ozone-sensitive In2O3 thin films Atashbar MZ, Gong B, Sun HT, Wlodarski W, Lamb R |
227 - 231 |
Application of sol-gel derived films for ZnO/n-Si junction solar cells Baik DG, Cho SM |
232 - 236 |
In situ second-harmonic generation measurement study of poled phenylhydrazone doped polymer films Hou ZJ, Liu LY, Xu L, Chen J, Xu ZL, Wang WC, Li FM, Ye MX |
237 - 244 |
The composite phthalocyanine-based Langmuir-Blodgett films: structural peculiarities and NO-sensitive properties Emelianov IL, Khatko VV |
245 - 250 |
Porphyrin thin films coated quartz crystal microbalances prepared by electropolymerization technique Paolesse R, Di Natale C, Dall'Orto VC, Macagnano A, Angelaccio A, Motta N, Sgarlata A, Hurst J, Rezzano I, Mascini M, D'Amico A |
251 - 255 |
Characteristics of Pt/SrTiO3/Pb(Zr-0.52, Ti-0.48)O-3/SrTiO3/Si ferroelectric gate oxide structure Shin DS, Park ST, Choi HS, Choi IH, Lee JY |
256 - 261 |
Effect of substrate composition on the piezoelectric response of reactively sputtered AlN thin films Ruffner JA, Clem PG, Tuttle BA, Dimos D, Gonzales DM |
262 - 266 |
Raman scattering from BaTiO3 thin film prepared on silicon substrate by r.f. sputtering Wang B, Zhang LD, Zhang L, Yan Y, Zhang SL |
267 - 275 |
On the short-time compositional stability of periodic multilayers Hentschel M, Bobeth M, Diener G, Pompe W |
276 - 282 |
Optical properties of metal-free tetraphenylporphyrin (H2TPP) dispersed into vacuum-deposited nylon-11 film Sayo K, Deki S, Noguchi T, Goto K |
283 - 286 |
Finite size effect on glass transition temperatures Jiang Q, Shi HX, Li JC |