1 - 5 |
Electrical and spectroscopic properties of amorphous copper sulfide films treated with iodine, lithium iodide and sodium iodide Cruz-Vazquez C, Inoue M, Inoue MB, Bernal R, Espinoza-Beltran FJ |
6 - 9 |
Strain gradients in polycrystalline CdS thin films Castro-Rodriguez R, Sosa V, Oliva AI, Iribarren A, Pena JL, Caballero-Briones F |
10 - 14 |
Structural, optical and electrical characterization of In/CdS/glass thermally annealed system Castillo SJ, Mendoza-Galvan A, Ramirez-Bon R, Espinoza-Beltran FJ, Sotelo-Lerma M, Gonzalez-Hernandez J, Martinez G |
15 - 18 |
The formation of CdTe thin films by the stacked elemental layer method Cruz LR, de Avillez RR |
19 - 22 |
Theoretical study of the structural, electronic and vibrational properties of CdIn2Te4 Fuentes-Cabrera M, Dong JJ, Sankey OF |
23 - 27 |
(CdTe)(1-x)(In2Te3)(x) pseudo-binary in polycrystalline CdTe-In films Castro-Rodriguez R, Hernandez MP, Zapata-Torres M, Pena JL |
28 - 32 |
Assessment of a non-linear diffusive-convective model for the ISOVPE MCT growth Moyano E, Scarpettini A, Gilabert U, Trigubo AB |
33 - 36 |
Improvement in the crystal quality of ZnSe films on Si(111) substrates with a nitrogen surface treatment Mendez-Garcia VH, Centeno AP, Lopez-Lopez M, Tamura M, Momose K, Ojima K, Yonezu H |
37 - 40 |
Characterization of ZnSe films grown on GaAs substrates with InxGa1-xAs and AlxGa1-xAs buffer layers Luyo-Alvarado J, Santana-Aranda MA, Melendez-Lira M, Lopez-Lopez M, Mendez VH, Vidal MA, Yonezu H |
41 - 45 |
In situ reflectance difference spectroscopy of p-type ZnTe : N grown by MBE Stifter D, Bonanni A, Garcia-Rocha M, Schmid M, Hingerl K, Sitter H |
46 - 48 |
Ion beam irradiation of thin CaF2 films: a study of lithographic properties Zehe A, Ramirez A |
49 - 52 |
Ba0.5Sr0.5TiO3 thin films deposited by PLD on SiO2/Si RuO2/Si and Pt/Si electrodes Lopez LL, Portelles J, Siqueiros JM, Hirata GA, McKittrick J |
53 - 59 |
Fatigue and dielectric properties of the (Pb, La)TiO3 thin films with various La concentrations Kang SJ, Chang DH, Yoon YS |
60 - 63 |
Deposition and characterization of PMNT thin films Fundora A, Siqueiros JM |
64 - 67 |
Chemical stability of Ta diffusion barrier between Cu and Si Laurila T, Zeng K, Kivilahti JK, Molarius J, Suni I |
68 - 72 |
Electrical properties of Ir-silicide formation on p-Si(100) in ultra-high vacuum Chung CK, Hwang J, Jaw TH, Wuu DS |
73 - 78 |
Interfacial reactions of Ti- and Zr(Si1-xGex) Si contacts with rapid thermal annealing Yasuda Y, Nakatsuka O, Zaima S |
79 - 83 |
The influence of TiB2-thin film thickness on metal-GaAs structural characteristics Kryshtab TG, Gomez JP, Lytvyn PM, Lytvyn OS |
84 - 88 |
Characterization of sputtered Ta-Ru thin films for ink-jet heater applications Wuu DS, Chan CC, Horng RH |
89 - 93 |
Conduction in lead phthalocyanine films with aluminium electrodes Gould RD, Shafai TS |
94 - 97 |
Intergranular Coulomb barriers in thin films of magnetoresistive manganites Garcia-Hernandez M, de Andres A, Guinea F, Martinez JL, Prieto C, Munoz A, Vazquez L |
98 - 101 |
Influence of the microstructure on the magnetoresistance of manganite thin films de Andres A, Garcia-Hernandez M, Munoz-Martin A, Martin L, Prieto C, Calzada L, Martinez JL |
IX - IX |
Proceedings of the 11th International Conference on Thin Films, August 30 through September 3, 1999, Cancun, Mexico Rockett A, Jergel M, Melendez-Lira M, Lopez-Lopez M, Falcony C, Zelaya O |
102 - 106 |
Thickness dependence of the properties of La0.6Sr0.4MnO3 thin films Sirena M, Steren L, Guimpel J |
107 - 112 |
Influence of local inhomogeneities on the magnetic properties of thin ferromagnetic films and nanostructures Hoffmann H |
113 - 116 |
Relation between microstructure and superconducting properties in a-axis 123 films and superlattices Ballesteros C, Gomez ME, Martin JI, Velez M, Prieto P, Vicent JL |
117 - 121 |
Rutherford backscattering analysis of Bi-based superconducting films Cheang-Wong JC, Diaz-Valdes E, Jergel M, Morales A, Vargas R |
122 - 128 |
Bi-Pb-Sr-Ca-Cu-O/MgO superconducting thin films Diaz-Valdes E, Jergel M, Falcony-Guajardo C, Morales F, Araujo-Osorio J |
129 - 133 |
Preparation and properties of precursor Ba-Ca-Cu(O, F) thin films deposited from fluorides for superconducting Tl- and Hg-based films Chromik S, Jergel M, Hanic F, Jimenez S, Jergel M, Strbik V, Falcony C, Benacka S, Cheang-Wong JC, Andrade E |
134 - 136 |
Duality metal oxide semiconductor-PN junction in the Al/silicon rich oxide/Si structure as a radiation sensor Aceves M, Carrillo J, Carranza J, Calleja W, Falcony C, Rosales P |
137 - 140 |
Influence of Al, In, Cu, Fe and Sn dopants on the response of thin film ZnO gas sensor to ethanol vapour Paraguay DF, Miki-Yoshida M, Morales J, Solis J, Estrada LW |
141 - 144 |
Thin film tin oxide-based propane gas sensors Carbajal-Franco G, Tiburcio-Silver A, Dominguez JM, Sanchez-Juarez A |
145 - 149 |
Manganese-activated gallium oxide electroluminescent phosphor thin films prepared using various deposition methods Miyata T, Nakatani T, Minami T |
150 - 154 |
Organically modified sol-gel films incorporating an infrared dye Prosposito P, Casalboni M, De Matteis F, Pizzoferrato R |
155 - 158 |
Ultraviolet-graded coatings for lasers: surface optical performance Piegari A, Perrone MR, Protopapa ML |
159 - 163 |
GaAs surface oxide desorption by annealing in ultra high vacuum Guillen-Cervantes A, Rivera-Alvarez Z, Lopez-Lopez M, Lopez-Luna E, Hernandez-Calderon I |
164 - 169 |
Preparation and optical properties of Ge and C-induced Ge quantum dots on Si Eberl K, Schmidt OG, Kienzle O, Ernst F |
170 - 175 |
In situ electron-beam processing for III-V semiconductor nanostructure fabrication Ishikawa T, Kohmoto S, Nishimura T, Asakawa K |
176 - 179 |
High deposition rate a-Si : H layers from pure SiH4 and from a 10% dilution of SiH4 in H-2 Estrada M, Cerdeira A, Pereyra I, Soto S |
180 - 183 |
Dependency of reactive magnetron-sputtered SiC film quality on the deposition parameters Mahmood A, Muhl S, Sansores LE, Andrade E |
184 - 188 |
Preparation and characterization of sol-gel glasses containing chromium Yanez-Limon JM, Perez-Roblez JF, Gonzalez-Hernandez J, Zamorano-Ulloa R, Ramirez-Rosales D |
189 - 194 |
Transparent conducting zinc-co-doped ITO films prepared by magnetron sputtering Minami T, Yamamoto T, Toda Y, Miyata T |
195 - 198 |
The growth, structure and optics of CsI-PbI2 co-evaporated thin films Somma F, Nikl M, Nitsch K, Giampaolo C, Phani AR, Santucci S |
199 - 202 |
Growth mode variations of thin films on nano-faceted substrates Mae K, Honda T |
203 - 206 |
Study of morphology of composite films Novak S, Sobotka M, Hrach R |
207 - 210 |
Linear electro-optic reflectance modulated spectra of GaAs (001) around E-1 and E-1+Delta(1) Lastras-Martinez A, Balderas-Navarro RE, Lastras-Martinez LF |
211 - 215 |
Spectroscopic ellipsometry of SixGe1-x/Si: a tool for composition and profile analysis in strained heterostructures used in the microelectronics industry Ferrieu F, Ribot P, Regolini JL |
216 - 221 |
Structure of Ag/Co multilayers on excimer laser irradiation Jergel M, Anopchenko A, Majkova E, Spasova M, Luby S, Holy V, Brunel M, Luches A, Martino M |
222 - 226 |
Application of synchrotron radiation to TXRF analysis of metal contamination on silicon wafer surfaces Pianetta P, Baur K, Singh A, Brennan S, Kerner J, Werho D, Wang J |
227 - 230 |
Optical spectroscopy of near-surface excitonic states Azucena-Coyotecatl H, Grigorieva NR, Kazennov BA, Madrigal-Melchor J, Novikov BV, Perez-Rodriguez F, Sel'kin AV |
231 - 234 |
Formation process and material properties of reactive sputtered IrO2 thin films Horng RH, Wuu DS, Wu LH, Lee MK |
235 - 238 |
Structural and optical properties of (ZnO)(x)(CdO)(1-x) thin films obtained by spray pyrolysis Santana G, Morales-Acevedo A, Vigil O, Vaillant L, Cruz F, Contreras-Puente G |
239 - 242 |
Observation of thermal desorption and MBE growth rate using laser light scattering Huerta-Ruelas J, Lopez-Lopez M, Zelaya-Angel O |
243 - 246 |
Effects of the methane content on the characteristics of diamond-like carbon films produced by sputtering Mansano RD, Massi M, Zambom LS, Verdonck P, Nogueira PM, Maciel HS, Otani C |
247 - 250 |
Characterization of diamond-like carbon (DLC) thin films prepared by r.f. magnetron sputtering Sanchez NA, Rincon C, Zambrano G, Galindo H, Prieto P |
251 - 254 |
Electrical conductive hard-carbon (diamond-like carbon) films formed by i-C4H10/N-2 supermagnetron plasma chemical vapor deposition method Kinoshita H, Takahashi J, Hando T |
255 - 260 |
Electron evaporation of carbon using a high density plasma Muhl S, Camps E, Escobar-Alarcon L, Olea O |
261 - 265 |
Electron spectroscopy study of plasma assisted amorphous carbon deposition Ghezzi F, Dellera F, Shmayda WT, Sancrotti M |
266 - 272 |
Deposition of carbon nitride films by reactive sub-picosecond pulsed laser ablation Acquaviva S, Perrone A, Zocco A, Klini A, Fotakis C |
273 - 276 |
Mechanical properties of boron nitride thin films obtained by RF-PECVD at low temperatures Vilcarromero J, Carreno MNP, Pereyra I |
277 - 281 |
Boron-carbon-nitrogen compounds grown by ion beam assisted evaporation Gago R, Jimenez I, Albella JM |
282 - 286 |
Mechanical and tribological properties of tungsten carbide sputtered coatings Esteve J, Zambrano G, Rincon C, Martinez E, Galindo H, Prieto P |
287 - 292 |
Structure determination of (Ti,Al)N/Mo multilayers Tavares CJ, Rebouta L, Alves EJ |
293 - 298 |
Microwave plasma characteristics in steel nitriding process Camps E, Becerril F, Muhl S, Alvarez-Fregoso O, Villagran M |