1 - 5 |
Electron microscopic analysis of cubic boron nitride films deposited on fused silica Weissmantel E, Pfeifer T, Richter F |
6 - 10 |
Chemical deposition and characterization of glassy bismuth(III) selenide thin films Pejova B, Grozdanov I |
11 - 14 |
Barium titanate glass-ceramic thin films for integrated high-dielectric media Yao K, Zhu WG |
15 - 25 |
Characterization of carbon nitride layers deposited by IR laser ablation of graphite target in a remote nitrogen plasma atmosphere: nanoparticle evidence Al Khawwam A, Jama C, Goudmand P, Dessaux O, El Achari A, Dhamelincourt P, Patrat G |
26 - 32 |
Reactively sputtered Ti-B-N nanocomposite films: correlation between structure and optical properties Pierson JF, Tomasella E, Bauer P |
33 - 36 |
Pulsed laser-deposited ilmenite-hematite films for application in high-temperature electronics Zhou F, Kotru S, Pandey RK |
37 - 42 |
Electroless deposition of polyaniline film via autocatalytic polymerization of aniline Liao CP, Gu MY |
43 - 50 |
X-ray diffraction studies of p-CdS : Cu thin films Kashiwaba Y, Komatsu T, Nishikawa M, Ishikawa Y, Segawa K, Hayasi Y |
51 - 58 |
Morphological rank of nano-scale tin dioxide films deposited by spray pyrolysis from SnCl(4)5H(2)O water solution Brinzari V, Korotcenkov G, Golovanov V, Schwank J, Lantto V, Saukko S |
59 - 63 |
Fabrication and characterization of PAN-derived carbon thin films containing Au nanoparticles Deki S, Nabika H, Akamatsu K, Mizuhata M, Kajinami A, Tomita S, Fujii M, Hayashi S |
64 - 72 |
In situ X-ray fluorescence used for real-time control of CuInxGa1-xSe2 thin film composition Eisgruber IL, Joshi B, Gomez N, Britt J, Vincent T |
73 - 78 |
A study of the fractal dimension and percolative structure of lithium-inserted BaTiO3 film Malek K |
79 - 86 |
Porous thin films for the characterization of atomic force microscope tip morphology Vick D, Brett MJ, Westra K |
87 - 96 |
Underlayer work function effect on nucleation and film morphology of chemical vapor deposited aluminum Rogers BR |
97 - 103 |
Growth kinetics and structure formation of ZrO2 thin films in chloride-based atomic layer deposition process Aarik J, Aidla A, Mandar H, Uustare T, Sammelselg V |
104 - 110 |
Characterization of nickel titanate synthesized by sol-gel processing Taylor DJ, Fleig PF, Page RA |
111 - 122 |
Structure and properties of sequentially sputtered molybdenum-tin films Dahn JR, Turner RL, Mao O, Dunlap RA, George AE, Buckett MM, McClure DJ, Krause LJ |
123 - 127 |
TEM analysis of an additional metal-rich component at the C49-C54 transformation in Ti/Si thin films capped with TiN Matko I, Chenevier B, Chaix-Pluchery O, Madar R, La Via F |
128 - 131 |
Novel synthesis route to conductive antimony-doped tin dioxide and micro-fabrication method Kololuoma T, Karkkainen AHO, Rantala JT |
132 - 135 |
Formation of disk-like aggregates of cadmium sulfide nanocrystals at the oil-water interface Wu PW, Gao L, Guo JK |
136 - 147 |
Composition, structure, microhardness and residual stress of W-Ti-N films deposited by reactive magnetron sputtering Shaginyan LR, Misina M, Zemek J, Musil J, Regent F, Britun VF |
148 - 154 |
Electrochemical evaluation of high temperature hydrogen impermeability of TiN films and its dependence on film thickness Nishikiori T, Nohira T, Ito Y |
155 - 159 |
Stress relaxation and phase stability of cubic boron nitride films during ion post implantation and annealing Fitz C, Fukarek W, Moller W |
160 - 168 |
Young's modulus of (Ti,Si)N films by surface acoustic waves and indentation techniques Vaz F, Carvalho S, Rebouta L, Silva MZ, Paul A, Schneider D |
169 - 175 |
Elastic properties of thin silver films: hexagonal model and influence of corrugation effects Eberle R, Kresser T, Pietralla M |
176 - 182 |
Mechanical properties of electroless Ni/Au wire bonded to an Al pad with the effects of chemical activation Lee WJ |
183 - 187 |
Structural and mechanical properties of Ti-containing diamond-like carbon films deposited by filtered cathodic vacuum arc Ding XZ, Tay BK, Lau SP, Zhang P, Zeng XT |
188 - 193 |
Effects of preparation conditions and thermocoloration on the optical properties of thin films of molybdenum oxide Al-Kuhaili MF, Durrani SMA, Khawaja EE |
194 - 199 |
Dielectric tunability of barium strontium titanate films prepared by a sol-gel method Nayak M, Tseng TY |
200 - 205 |
Influences of annealing temperature on the optical and structural properties of (Ba,Sr)TiO3 thin films derived from sol-gel technique Tian HY, Luo WG, Ding AL, Choi JW, Lee C, No K |
206 - 210 |
Effects of alternate doped structures on organic electroluminescent devices Yang KX, Huang JS, Gao WB, Liu SY |
211 - 217 |
Optical properties of nanophase films measured by variable-angle spectroscopic ellipsometry Urban FK, Hosseini-Tehrani A, Khabari A, Griffiths P, Bungay C, Petrov I, Kim Y |
218 - 222 |
Effect of ion beam energy on the electrical, optical, and structural properties of indium tin oxide thin films prepared by direct metal ion beam deposition technique Kim D, Kim S |
223 - 229 |
Evaluation of elastic modulus and yield strength of Al film using an electrostatically actuated test device Lee SH, Evans JW, Pak YE, Jeon JU, Kwon D |
230 - 235 |
Impurity redistributions in electroplated Cu films during self-annealing Yoon MS, Park YJ, Joo YC |
236 - 239 |
(E)-4-[2-(bis(octadecylsulfanyl)tetrathiafulvalenyl)ethenyl]-1-methylpyridinium iodide: synthesis and characterisation of its Langmuir-Blodgett films Andreu R, Garin J, Orduna J, Ashwell GJ, Amiri MA, Hamilton R |
240 - 244 |
Influences of directional crystallization using field aided lateral crystallization on the electrical characteristics of poly-Si thin film transistors Lee JB, Choi DK, Yang YH |
245 - 251 |
An electron paramagnetic resonance study of vacuum-deposited films of titanyl phthalocyanine Kaji H, Shimoyama Y |
252 - 259 |
Improvement of the SiO2/Si interface characteristics by two-step deposition with intermediate plasma treatment using N-2/He or O-2/He gas Yi C, Kim HU, Rhee SW |
260 - 269 |
Modelling the effect of a thin ZnO layer on the cathodoluminescence generated in ZnS phosphor powders Greeff AP, Swart HC |
270 - 274 |
Peltier effect in a co-evaporated Sb2Te3(P)-Bi2Te3(N) thin film thermocouple Zou HL, Rowe DM, Williams SGK |
275 - 281 |
Single layer polymer electroluminescent devices incorporating new electron transport materials Cea P, Hua Y, Pearson C, Wang C, Bryce MR, Royo FM, Petty MC |
282 - 285 |
Substrate influence on the X-ray diffraction patterns of amorphous chalcogenide thin films deposited on silicon wafers Lorinczi A |
286 - 290 |
The capacitance of mixed alkyl monolayers on Si(111) surface Wei F, Zhao XS |
291 - 296 |
Nitrogen doping of fluorinated amorphous carbon thin films: structural and optical properties evolution upon thermal annealing Valentini L, Braca E, Kenny JM, Fedosenko G, Engemann J, Lozzi L, Santucci S |
297 - 301 |
Femtosecond laser damage of a high reflecting mirror Bonse J, Baudach S, Kautek W, Welsch E, Kruger J |
302 - 309 |
Phase transformations inWO(3) thin films during annealing Al Mohammad A, Gillet M |
310 - 315 |
Crystallization kinetics of Ge4Sb1Te5 films Wamwangi D, Njoroge WK, Wuttig M |
316 - 320 |
Crystallization behavior of r.f.-sputtered near stoichiometric Ni2MnGa thin films Wu SK, Tseng KH, Wang JY |