1 - 7 |
Comparison of the electrochemical behavior of CeO2-SnO2 and CeO2-TiO2 electrodes produced by the Pechini method Rosario AV, Pereira EC |
8 - 13 |
Effects of rapid thermal annealing on the morphology and electrical properties of ZnO/In films Ma TY, Shim DK |
14 - 20 |
Photoelectrochemical properties of sol-gel-derived Ti1-xVxO2 solid solution film photoelectrodes Zhao GL, Han GR, Takahashi M, Yoko T |
21 - 27 |
Electrical properties of reactively sputtered carbon nitride films Wei J, Hing P |
28 - 37 |
Crystalline structure and magnetic and magneto-optical properties of MnSbBi thin films Kang K, Kravets VG, Petford-Long AK |
38 - 41 |
Electrical and optical properties of (Pb0.9La0.1)TiO3 films prepared by the sol-gel method with ultrasound application Lee JH, Jung SW, Kim NK, Park BO |
42 - 52 |
Hybrid gas-to-particle conversion and chemical vapor deposition for the production of porous alumina films Nguyen QT, Kidder JN, Ehrman SH |
53 - 60 |
Influence of thickness and growth temperature on the properties of zirconium oxide films grown by atomic layer deposition on silicon Kukli K, Ritala M, Uustare T, Aarik J, Forsgren K, Sajavaara T, Leskela M, Harsta A |
61 - 71 |
Molecular beam epitaxy synthesis of Si1-yCy and Si1-x-yGexCy alloys and Ge islands using an electron cyclotron resonance argon/methane plasma Baribeau JM, Lockwood DJ, Balle J, Rolfe SJ, Sproule GI, Moisa S |
72 - 75 |
Epitaxy of atomically flat CaF2 films on Si(111) substrates Wang CR, Muller BH, Hofmann KR |
76 - 85 |
Study of the formation of chromate conversion coatings on Alclad 2024 aluminum alloy using spectroscopic ellipsometry Campestrini P, Bohm S, Schram T, Terryn H, de Wit JHW |
86 - 93 |
A comparative study of the UV optical and structural properties of SiO2, Al2O3, and HfO2 single layers deposited by reactive evaporation, ion-assisted deposition and plasma ion-assisted deposition Thielsch R, Gatto A, Heber J, Kaiser N |
94 - 100 |
High concentration erbium doping of silicon-rich SiO2 thin films on silicon Xu F, Xiao ZS, Cheng GA, Yi ZZ, Zhang TH, Gu LL, Wang X |
101 - 106 |
Radiation damage and transmission enhancement in surface-emitting organic light-emitting diodes Hung LS, Madathil J |
107 - 113 |
Comparative analysis for the crystalline and ferroelectric properties of Pb(Zr,Ti)O-3 thin films deposited on metallic LaNiO3 and Pt electrodes Chae BG, Yang YS, Lee SH, Jang MS, Lee SJ, Kim SH, Baek WS, Kwon SC |
114 - 120 |
Low-temperature epitaxial growth of conductive LaNiO3 thin films by RF magnetron sputtering Wakiya N, Azuma T, Shinozaki K, Mizutani N |
121 - 128 |
Improvement of Ta-based thin film barriers on copper by ion implantation of nitrogen and oxygen Wieser E, Peikert M, Wenzel C, Schreiber J, Bartha JW, Bendjus B, Melov VV, Reuther H, Mucklich A, Adolphi B, Fischer D |
129 - 141 |
Predictive modeling of atomic layer deposition on the feature scale Gobbert MK, Prasad V, Cale TS |
142 - 146 |
Electrical and optical studies of ZnO : Ga thin films fabricated via the sol-gel technique Cheong KY, Muti N, Ramanan SR |
147 - 158 |
Low generation photochromic monodendrons on a solid surface Sidorenko A, Houphouet-Boigny C, Villavicencio O, McGrath DV, Tsukruk VV |
159 - 166 |
The use of charge transfer interlayers to control hole injection in molecular organic light emitting diodes Day SR, Hatton RA, Chesters MA, Willis MR |
167 - 170 |
Piezoresistive response of thin film manganin gauges in the 50-100-GPa range Du XS, Yang BC, Zhou HR |
171 - 176 |
Characterization of Cu-poor surface on Cu-rich CuInSe2 film prepared by evaporating binary selenide compounds and its effect on solar efficiency Lee DY, Yun JH, Yoon KH, Ahn BT |
177 - 182 |
Effect of precursor solution on the formation of perovskite phase of Pb(Mg-1/Nb-3(2/3))O-3 thin films Spagnol PD, Varela JA, Bertochi MAZ, Stojanovic BD, Tebcherani SM |
183 - 187 |
Electric-field-induced migration of chemisorbed gas molecules on a sensitive film - a new chemical sensor Liess M |
188 - 193 |
Study of the spontaneous alignment of InAs quantum dots along the surface steps as a function of the InAs coverage da Silva MJ, Quivy AA, Gonzalez-Borrero PP, Marega E |
194 - 199 |
Microstructural analysis of WO3 thin films on alumina substrates Gillet M, Al-Mohammad A, Lemire C |
200 - 204 |
Crystallographic and electrical properties of platinum film grown by chemical vapor deposition using (methylcyclopentadienyl)trimethylplatinum Hiratani M, Nabatame T, Matsui Y, Kimura S |
205 - 211 |
Ultrafast optical nonlinearity of titanylphthalocyanine films Ma GH, Guo LJ, Mi J, Liu Y, Qian SX, Pan DC, Huang Y |
212 - 221 |
Solid-liquid interdiffusion bonding between In-coated silver thick films Lin JC, Huang LW, Jang GY, Lee SL |