1 - 11 |
Crystallographic studies on hexaphenyl thin films - a review Resel R |
12 - 21 |
Correlation between the microscopic and mesoscopic chirality in Langmuir monolayers Nandi N, Vollhardt D |
22 - 26 |
Advanced light emitting diodes structures for optoelectronic applications Kovac J, Peternai L, Lengyel O |
27 - 33 |
a-C thin film deposition by laser ablation Olea-Cardoso O, Camps E, Escobar-Alarcon L, Muhl S, Rodil SE, Camacho-Lopez MA, Haro-Poniatowski E |
34 - 38 |
Electronic properties of PLD prepared nitrogenated a-SiC thin films Barreca F, Fazio E, Neri F, Trusso S |
39 - 44 |
Pulsed laser deposition of active waveguides Martino M, Caricato AP, Fernandez M, Leggieri G, Jha A, Ferrari M, Mattarelli M |
45 - 49 |
Pulsed laser deposition of Cd1-xMnxTe thin films Caricato AP, D'Anna E, Fernandez M, Leggieri G, Luches A, Mero E, Martino M |
50 - 56 |
Studies of pulsed high-current arcs used to prepare carbon films Muhl S, Maya F, Rodil S, Camps E, Villagran M, Garcia A |
57 - 62 |
Nano-scaled photocatalytic TiO2 thin films prepared by magnetron sputtering Zeman P, Takabayashi S |
63 - 67 |
Synthesis of GaAs quantum dots on Si-layers on AlGaAs films grown on GaAs(100) Mendez-Garcia VH, Perez-Centeno A, Lopez-Lopez M |
68 - 72 |
Study of the optical and structural properties of GaN films grown on Si substrates with a SiC layer Cervantes-Contreras M, Lopez-Lopez M, Melendez-Lira M, Tamura M, Vidal MA |
73 - 77 |
Comparison of diamond nucleation in DC and AC substrate bias mode Kromka A, Janik J, Balon F, Kubovic M, Cerven I, Dubravcova V |
78 - 81 |
The nucleation and growth of intermetallic Al-Pt phases in co-deposited thin films Kovacs A, Barna PB, Labar JL |
82 - 87 |
Interaction of amorphous Si and crystalline Al thin films during low-temperature annealing in vacuum Zhao YH, Wang JY, Mittemeijer EJ |
88 - 91 |
Nanostructural properties of amorphous silicon carbide by GISAXS and optical spectroscopy Gracin D, Dubcek P, Jaksic M, Bernstorff S |
92 - 96 |
Determination of the interdiffusion coefficient for Si/Al multilayers by Auger electron spectroscopical sputter depth profiling Wang JY, Zalar A, Zhao YH, Mittemeijer EJ |
97 - 102 |
Solid state diffusion of Sn in polycrystalline Al films Eisenmenger-Sittner C, Bangert H, Tomastik C, Barna PB, Kovacs A, Misiak F |
IX - IX |
Proceedings from the 12th International Conference on Thin Films, Bratislava, Slovakia, September 15-20, 2002 - Preface Luby S |
103 - 107 |
Study of the superconducting MgB2 films by ion beam analysis methods Andrade E, Chromik S, Jergel M, Jergel M, Falcony C, Strbik V, Rocha MF, Zavala EP |
108 - 113 |
Low-energy particle treatment of GaAs surface Pincik E, Jergel M, Falcony C, Ortega L, Ivanco J, Brunner R, Kucera M |
114 - 118 |
Study of the oxygen incorporation and structure in the low pressure sputtered YBCO films Chaudhary S, Pandya DK, Kashyap SC |
119 - 125 |
Optical gap in carbon nitride films Rodil SE, Muhl S, Maca S, Ferrari AC |
126 - 130 |
Thermoluminescence of aluminum oxide thin films subject to ultraviolet irradiation Escobar-Alarcon L, Villagran E, Camps E, Romero S, Villarreal-Barajas JE, Gonzalez PR |
131 - 134 |
High-quality ZnO films prepared on Si wafers by low-pressure MO-CVD Haga K, Suzuki T, Kashiwaba Y, Watanabe H, Zhang BP, Segawa Y |
135 - 139 |
Multilevel morphological analysis of continuous films and surfaces Hrach R, Novotny D, Novak S, Pavlik J |
140 - 143 |
Real-time stress/strain measurement during growth of Sr and SrO epilayer on H-terminated Si Asaoka H, Machida Y, Yamamoto H, Hojou K, Saiki K, Koma A |
144 - 148 |
Measurements of strain during vapour deposition of thin films and multilayers Rizzo A, Sagace M, Galietti U, Pappalettere C |
149 - 154 |
Structure and mechanical properties of PACVD fluorinated amorphous carbon films Bottani CE, Lamperti A, Nobili L, Ossi PM |
155 - 159 |
Friction and wear properties of C-N/MeNx nanolayer composites Sobota J, Bochnicek Z, Holy V |
160 - 165 |
The influence of mechanical adhesion of copper coatings on carbon surfaces on the interfacial thermal contact resistance Neubauer E, Korb G, Eisenmenger-Sittner C, Bangert H, Chotikaprakhan S, Dietzel D, Mansanares AM, Bein BK |
166 - 173 |
Nanoscaled composite TiN/Cu multilayer thin films deposited by dual ion beam sputtering: growth and structural characterisation Abadias G, Tse YY, Michel A, Jaouen C, Jaouen M |
174 - 179 |
Properties of Cr(C,N) hard coatings deposited in Ar-C2H2-N-2 plasma Cekada M, Macek M, Merl DK, Panjan P |
180 - 185 |
Deposition and some properties of nanocrystalline WC and nanocomposite WC/a-C : H coatings Czyzniewski A |
186 - 190 |
TiO2(Fe3+) nanostructured thin films with antibacterial properties Trapalis CC, Keivanidis P, Kordas G, Zaharescu M, Crisan M, Szatvanyi A, Gartner M |
191 - 198 |
Bio-compatibility of the surface layer of pyrolytic graphite Stary V, Bacakova L, Hornik J, Chmelik V |
199 - 204 |
Optical and mechanical properties of DLC-Si coatings on polycarbonate Damasceno JC, Camargo SS, Cremona M |
205 - 210 |
Structural evolution of Fe-Al multilayers submitted to thermal annealing Mengucci P, Majni G, Di Cristoforo A, Checchetto R, Miotello A, Tosello C, Principi G |
211 - 216 |
TiN/AIN bilayers and multilayers grown by magnetron co-sputtering Auger MA, Sanchez O, Ballesteros C, Jergel M, Aguilar-Frutis M, Falcony C |
217 - 223 |
The relation between the plasma characteristic and the corrosion properties of TiN/Ti multilayers deposited by unbalanced magnetron sputtering Flores M, Muhl S, Andrade E |
224 - 229 |
A tracking ellipsometer of picometer sensitivity enabling 0.1 % sputtering-rate monitoring of EUV nanometer multilayer fabrication Yamamoto M, Hotta Y, Sato M |
230 - 236 |
Effect of substrate roughness on Mo/Si multilayer optics for EUVL produced by UHV-e-beam evaporation and ion polishing Kleineberg U, Westerwalbesloh T, Hachmann W, Heinzmann U, Tummler J, Scholze F, Ulm G, Mullender S |
237 - 242 |
Correlation between interface structure and giant magnetoresistance in electrodeposited Co-Cu/Cu multilayers Cziraki A, Koteles M, Peter L, Kupay Z, Padar J, Pogany L, Bakonyi I, Uhlemann M, Herrich M, Arnold B, Thomas J, Bauer HD, Wetzig K |
243 - 246 |
Effect of magnetic flux distribution on GMR in Ag/Co multilayers Luby S, Majkova E, Debnarova A, Senderak R, Ac V, Anwarzai B |
247 - 251 |
Effect of process parameters on GMR in electrodeposited Cu-Co nanogranular thin films Pattanaik GR, Pandya DK, Kashyap SC |
252 - 258 |
Pulsed laser deposition of Co- and Fe-based amorphous magnetic films and multilayers Acquaviva S, Caricato AP, D'Anna E, Fernandez M, Luches A, Frait Z, Majkova E, Ozvold M, Luby S, Mengucci P |
259 - 262 |
Analysis of the magnetization switching in recording media thin films by magneto-optic Kerr effect vector magnetometry Bottoni G, Candolfo D, Cecchetti A, Vavassori P |
263 - 268 |
The influence of spatial disorder of the ion distribution on the surface morphology in thin films of blend based organic mixed ionic-electronic conductors Wenzl EP, Suess C, Haase A, Poelt R, Somitsch D, Knoll R, Scherf U, Leising G |
269 - 273 |
Ordered mono- and multilayer films of sexiphenyl on Al(111): a LEED investigation Winter B, Ivanco J, Netzer FP, Ramsey MG |
274 - 276 |
Polyimide-based organic thin films prepared by rf magnetron sputtering Kinbara A, Hayashi T, Wakahara K, Kikuchi N, Kusano E, Nanto H |
277 - 280 |
Polymeric multilayers for integration into photonic devices Alvarez AL, Tito J, Vaello MB, Velasquez P, Mallavia R, Sanchez-Lopez MM, de Avila SF |
281 - 286 |
Characterization of DMPC bilayers and multilamellar islands on hydrophobic self-assembled monolayers of ODS/Si(100) and mixed ODS-DDS/Si(100) Brechling A, Sundermann M, Kleineberg U, Heinzmann U |
287 - 291 |
Interface and ion-induced optoelectronic effects in thin films of poly (p-phenylene)s functionalised with ion-transporting side chains Wenzl FP, Mauthner G, Collon M, List EJW, Suess C, Haase A, Jakopic G, Somitsch D, Knoll R, Bouguettaya M, Reynolds JR, Leising G |
292 - 297 |
Transient charging of copper phthalocyanine: model and experiment Thurzo I, Pham G, Kampen TU, Zahn DRT |
298 - 304 |
Study of cobalt silicides formation in Co/Ta-W/Si(100) multilayer systems Moshfegh AZ, Hashemifar SJ, Akhavan O, Azimirad R |
305 - 308 |
The application of platinum-silicide anode layer to decrease the static and turn-off losses in high-power P-i-N diode Vobecky J, Hazdra P |
309 - 314 |
Dielectric properties of RF-sputtered silicon nitride thin films with gold electrodes Gould RD, Awan SA |
315 - 320 |
Electrical conductivity and dynamics of electroforming in Al-SiOx-Al thin film sandwich structures Gould RD, Lopez MG |
321 - 325 |
Monte Carlo simulation of current-voltage characteristics in metalinsulator-metal thin film structures Gravano S, Amr E, Gould RD, Abu Samra M |
326 - 331 |
Monte Carlo simulation of electron interaction with a thin film Stary V |
332 - 336 |
Thin film non-symmetric microelectrode array for impedance monitoring of human skin Ivanic R, Novotny I, Rehacek V, Tvarozek V, Weis M |
337 - 343 |
The electromechanical behavior of nichrome (80/20 wt.%) film Kazi IH, Wild PM, Moore TN, Sayer M |
344 - 351 |
Photoluminescence properties of a-Si : H based thin films and corresponding solar cells Pincik E, Kobayashi H, Gleskova H, Kucera M, Ortega L, Jergel M, Falcony C, Brunner R, Shimizu T, Nadazdy V, Zeman M, Mikula M, Kumeda M, van Swaaij RACMM |
352 - 358 |
A study of Al/Si3N4/ultrathin Si/GaAs structures by DLTS and C-V measurements Pincik E, Bartos J, Brunner R, Ivanco J |
359 - 362 |
Properties of YBa2Cu3Ox and Bi2CaCu2Ox thin film microstrips patterned by argon ion beam Oszi Z, Benacka S, Strbik V, Chromik S, Pankova M, Kostic I, Kleja P |
363 - 366 |
Erbium doping into thin carbon optical layers Prajzler V, Huttel I, Nekvindova P, Schrofel J, Mackova A, Gurovic J |
367 - 370 |
Effect of r.f. hydrogen plasma annealing on the properties Of Si/SiO2 interface: a spectroscopic ellipsometry study Paneva A, Szekeres A |
371 - 374 |
Electron and phonon thermal waves in semiconductors: the effect of carrier diffusion and recombination on the photoacoustic signal Villegas-Lelovsky L, de la Cruz GG, Gurevich YG |