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Proceedings of Symposium J on Synthesis, Characterization and Advanced Applications of Amorphous Carbon Films, EMRS 2004 Conference, Strasbourg, France, 24-28 May, 2004 - Preface Patsalas P, Abadias G, Erdem A, Oskomov K |
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Pulsed-laser deposition of carbon: from DLC to cluster-assembled films Ossi PM, Bottani CE, Miotello A |
9 - 18 |
Surface and interface properties of amorphous carbon layers on rigid and flexible substrates Logothetidis S |
19 - 23 |
Structuring of carbon layers in Si-C-O systems studied on atomic scale Hahnel A, Woltersdorf J |
24 - 33 |
Optical and electronic properties of plasma-deposited hydrogenated amorphous carbon nitride and carbon oxide films Godet C, Adamopoulos G, Kumar S, Katsuno T |
34 - 40 |
Chemical bonding modifications of tetrahedral amorphous carbon and nitrogenated tetrahedral amorphous carbon films induced by rapid thermal annealing McCann R, Roy SS, Papakonstantinou P, Bain MF, Gamble HS, McLaughlin JA |
41 - 44 |
Microstructure and electronic investigations of carbon nitride films deposited by RF magnetron sputtering Lagrini A, Charvet S, Benlahsen M, Debiemme-Chouvy C, Deslouis C, Cachet H |
45 - 49 |
Effect of substrate bias voltage and substrate on the structural properties of amorphous carbon films deposited by unbalanced magnetron sputtering Ahmad I, Roy SS, Maguire PD, Papakonstantinou P, McLaughlin JA |
50 - 55 |
Effects of substrate temperature on nanocrystalline diamond growth: an in-situ optical study using pyrometric interferometry Bruno P, Benedic F, Mohasseb F, Silva F, Hassouni K |
56 - 62 |
Structure, stability, and stress properties of amorphous and nanostructured carbon films Fyta MG, Mathioudakis C, Kopidakis G, Kehres PC |
63 - 68 |
Characterisation of the interface region in stepwise bias-graded layers of DLC films by a high-resolution depth profiling method Ziebert C, Bauer C, Stuber M, Ulrich S, Holleck H |
69 - 73 |
A model for stress generation and stress relief mechanisms applied to as-deposited filtered cathodic vacuum arc amorphous carbon films Bilek MMM, Verdon M, Ryves L, Oates TWH, Ha CT, McKenzie DR |
74 - 78 |
Relaxation kinetics in amorphous carbon films: An insight from atomic scale simulation Belov AY, Jager HU |
79 - 85 |
Electron field emission from carbon-based materials Silva SRP, Carey JD, Guo X, Tsang WM, Poa CHP |
86 - 89 |
Effect of rf power on the photovoltaic properties of boron-doped amorphous carbon/n-type silicon junction fabricated by plasma enhanced chemical vapor deposition Soga T, Kokubu T, Hayashi Y, Jimbo T |
90 - 93 |
Microstructural relaxation of hydrogenated amorphous carbon thin films Bouzerar R, Benlahsen M, Picot JC |
94 - 98 |
Transport properties of low-dimensional amorphous carbon films Bhattacharyya S, Silva SRP |
99 - 108 |
Achieving superlow friction with hydrogenated amorphous carbon: some key requirements Fontaine J, Le Mogne T, Loubet JL, Belin M |
109 - 114 |
Structural, mechanical, and nanoscale tribological properties of nitrogen-incorporated fluorine-carbon films da Costa MEHM, Sanchez CMT, Jacobsohn LG, Freire FL |
115 - 119 |
Sealing performance of thin amorphous carbon films formed by ion beam assisted deposition at low temperature for protection of aluminium against aggressive media: the influence of the ion energy von Ringleben J, Sundermann C, Matsutani I, Kiuchi M, Ensinger W |
120 - 125 |
Nanomechanical and nanotribological properties of carbon based films Charitidis C, Logothetidis S |
126 - 132 |
Haemocompatibility studies on carbon-based thin films by ellipsometry Logothetidis S, Gioti M, Lousinian S, Fotiadou S |
133 - 137 |
Synthesis and in-situ ellipsometric monitoring of Ti/C nanostructured multilayers using a high-current, dual source pulsed cathodic arc Ryves L, Bilek MMM, Oates TW, Tarrant RN, McKenzie DR, Burgmann FA, McCulloch DG |
138 - 144 |
Towards high adherent and tough a-C coatings Zhang S, Bui XL, Zeng XT, Li XM |
145 - 150 |
The structure of amorphous carbon nitride films using a combined study of NEXAFS, XPS and Raman spectroscopies Roy SS, McCann R, Papakonstantinou P, Maguire P, McLaughlin JA |
151 - 155 |
Electronic and optical properties of a-C from tight-binding molecular dynamics simulations Mathioudakis C, Kopidakis G, Kelires PC, Patsalas P, Gioti M, Logothetidis S |
156 - 166 |
Comparative study of the structure of a-CNx and a-CNx : H films using NEXAFS, XPS and FT-IR analysis Bouchet-Fabre B, Zellama K, Godet C, Ballutaud D, Minea T |
167 - 171 |
Spectroscopic study using FTIR, Raman, XPS and NEXAFS of carbon nitride thin films deposited by RF magnetron sputtering Bouchet-Fabre B, Marino E, Lazar G, Zellama K, Clin M, Ballutaud D, Abel F, Godet C |
172 - 176 |
Time-resolved electrical measurements of a pulsed-dc methane discharge used in diamond-like carbon films production Corbella C, Polo MC, Oncins G, Pascual E, Andujar JL, Bertran E |
177 - 182 |
Effects of energetic species during the growth of nitrogenated amorphous carbon thin films on their nanomechanical properties Charitidis C, Patsalas P, Logothetidis S |
183 - 187 |
Chemical structure of silicon-, oxygen- and nitrogen-containing a-C : H films prepared by RF plasma beam CVD Toth A, Mohai M, Ujvari T, Bertoti I |
188 - 191 |
Nanomechanical properties of silicon-, oxygen- and nitrogen-containing a-C : H films prepared by RF plasma beam CVD Toth A, Mohai M, Ujvari T, Bertoti I |
192 - 196 |
Characterizations of CNx thin films made by ionized physical vapor deposition Tetard F, Djemia P, Besland MP, Tessier PY, Angleraud B |
197 - 200 |
Dual FCVA-PECVD deposition for DLC films Meunier C, Munnik F, Stauffer J, Germann E, Mikhailov S |
201 - 206 |
The improvement in gas barrier performance and optical transparency of DLC-coated polymer by silicon incorporation Abbas GA, Papakonstantinou P, Okpalugo TIT, McLaughlin JA, Filik J, Harkin-Jones E |
207 - 210 |
Influence of amorphous carbon nano-clusters on the capacity of carbon black electrodes Toth S, Fule M, Veres M, Selman JR, Arcon D, Pocsik I, Koos M |
211 - 215 |
Raman scattering of ultra-high molecular weight polyethylene treated by plasma-based ion implantation Veres M, Fule M, Toth S, Pocsik I, Koos M, Toth A, Mohai M, Bertoti I |
216 - 220 |
Aging of plasma-deposited carbon layers: effect of their thickness and material structure Clergereaux R, Escaich D, Martin S, Gaillard F, Raynaud P |
221 - 225 |
Silicon-incorporated diamond-like coatings for Si3N4 mechanical seals Camargo SS, Gomes JR, Carrapichano JM, Silva RF, Achete CA |
226 - 231 |
Characterization of hydrogenated amorphous carbon nitride particles and coatings obtained in a CH4/N-2 radiofrequency discharge Pereira J, Geraud-Grenier I, Massereau-Guilbaud V, Plain A |
232 - 236 |
Nanocrystalline diamond coating of silicon nitride ceramics by microwave plasma-assisted CVD Amaral M, Mohasseb F, Oliveira FJ, Benedic F, Silva RF, Gicquel A |
237 - 241 |
Application of aluminum oxide and ta-C thin films deposited at room temperature by PLD in RF-MEMS fabrication Orlianges JC, Pothier A, Mercier D, Blondy P, Champeaux C, Catherinot A, De Barros MI, Pavant S |
242 - 247 |
Electronic structure and hardening mechanism of Si-doped/undoped diamond-like carbon films Ray SC, Okpalugo TIT, Papakonstantinou P, Bao CW, Tsai HM, Chiou JW, Jan JC, Pong WF, McLaughlin JA, Wang WJ |
248 - 252 |
Electron field emission and surface morphology of a-C and a-C : H thin films Anishchik V, Uglov V, Kuleshov AK, Filipp AR, Rusalsky DP, Astashynskaya MV, Samtsov M, Kuznetsova TA, Thiery F, Pauleau Y |
253 - 257 |
CHx/PS/Si as structure for propane sensing Belhousse S, Gabouze N, Cheraga H, Henda K |
258 - 263 |
Nitrogen effect on the electrical properties of CNx thin films deposited by reactive magnetron sputtering Derradji NE, Mahdjoubi ML, Belkhir H, Mumumbila N, Angleraud B, Tessier F |
264 - 269 |
PECVD a-C : H films for STW resonant devices Cicala G, Bruno P, Dragone A, Losacco AM, Sadun C, Generosi A |
270 - 274 |
An electrical, optical and electron paramagnetic resonance study of room temperature deposited CNx films on Si Konofaos N, Deligiannakis Y, Evangelou EK, Gioti M, Logothetidis S |
275 - 279 |
The electrical and structural properties of the hydrogenated amorphous carbon films grown by close field unbalanced magnetron sputtering Park YS, Myung HS, Han JG, Hong B |
280 - 286 |
Structural, bonding and physical characteristics of phosphorus-dopcd hydrogenated amorphous carbon films grown by plasma-enhanced chemical vapor deposition Rusop M, Soga T, Jimbo T |
287 - 292 |
Nickel-incorporated amorphous carbon film deposited by femtosecond pulsed laser ablation Benchikh N, Garrelie F, Donnet C, Bouchet-Fabre B, Wolski K, Rogemond F, Loir AS, Subtil JL |
293 - 298 |
Composition and morphology of metal-containing diamond-like carbon films obtained by reactive magnetron sputtering Corbella C, Pascual E, Oncins G, Canal C, Andujar JL, Bertran E |
299 - 304 |
Effect of Si-incorporation on wear-corrosion properties of diamond-like carbon films Kim HG, Ahn SH, Kim JG, Park SJ, Lee KR |
305 - 310 |
Surface characterisation of nano-structured carbon films deposited by Nd : YAG pulsed laser deposition Cappelli E, Scilletta C, Orlando S, Flammini R, Iacobucci S, Ascarelli P |
311 - 317 |
Electrochemically induced surface modifications in boron-doped diamond films: a Raman spectroscopy study Ricci PC, Anedda A, Carbonaro CM, Clemente F, Corpino R |
318 - 323 |
Evolution under annealing and nitrogen implantation of the mechanical properties of amorphous carbon films Charvet S, Le Bourhis E, Faurie D, Goudeau P, Lejeune M, Gergaud P |
324 - 329 |
In situ tensile tests in SEM of sputtered CNx films deposited on Ti6Al4V substrate: effect of film thickness and plasma surface pretreatment Villechaise P, Milhet X, Angleraud B, Fouquet V, Pichon L, Straboni A, Tessier R |