169 - 171 |
Electrorheological Property of a Polyaniline-Coated Silica Suspension Kuramoto N, Yamazaki M, Nagai K, Koyama K, Tanaka K, Yatsuzuka K, Higashiyama Y |
172 - 174 |
Perpendicular Electrical-Conduction in Cu/Cr Multilayer Films at Low-Temperatures Nallamshetty K, Angadi MA |
175 - 180 |
A Study of UV-Light Blocking Filter Materials for Ultrasoft X-Ray-Emission Spectroscopy of Sputtered Thin-Films Andersson K |
181 - 185 |
Properties of Thin-Films of Tantalum Oxide Deposited by Ion-Assisted Deposition Martin PJ, Bendavid A, Swain M, Netterfield RP, Kinder TJ, Sainty WG, Drage D, Wielunski L |
186 - 191 |
Influence of Substrate on Structural-Properties of TiO2 Thin-Films Obtained via MOCVD Battiston GA, Gerbasi R, Porchia M, Marigo A |
192 - 195 |
Preparation of Tungsten Disilicide Thin-Films by Laser Evaporation Glebovsky VG, Oganyan RA, Ermolov SN, Stinov ED, Kolosova EV |
196 - 204 |
High-Frequency Impedance Analysis of Quartz-Crystal Microbalances Coated with Conducting Polymers Topart PA, Noel MA, Liess HD |
205 - 210 |
Amorphous Zn3P2 Thin-Films Grown by Reactive RF-Sputtering Weber A, Sutter P, Vonkanel H |
211 - 213 |
Transparent Conducting Cadmium-Oxide Thin-Films Prepared by a Solution Growth Technique Varkey AJ, Fort AF |
214 - 219 |
Organic Superlattice Film by Alternate Deposition of Single Molecular Layers Nonaka T, Mori Y, Nagai N, Nakagawa Y, Saeda M, Takahagi T, Ishitani A |
220 - 224 |
X-Ray Photoemission-Study of Various Polyimide Cleaning Processes Before Metal-Deposition Ermolieff A, Marthon S, Granges H, Piaguet J, Pierre F |
225 - 228 |
Modeling of Silicon Epitaxy at Low-Pressure Pal DK, Daw AN |
229 - 239 |
Influence of Base-Pressure on Structure and Magnetoresistance in Sputter-Deposited Co/Cu Metallic Multilayers Yoshizaki F, Kingetsu T |
240 - 244 |
Effect of Deposition Orientation on the Structure and Magnetic-Properties of Chemical-Vapor-Deposited Iron-Oxide Thin-Films Dhara S, Rastogi AC, Das BK |
245 - 250 |
Reactive Ion Etching of Nb Thin-Films for Nb/Al-Alox/Nb Josephson Tunnel-Junctions Popova K, Lea WF, Hutson D, Sydow JP, Pegrum CM |
251 - 258 |
A Study on WSi2 Thin-Films, Formed by the Reaction of Tungsten with Solid or Liquid Silicon, by Rapid Thermal Annealing Doscher M, Pauli M, Muller J |
259 - 267 |
Application of Multiple Coatings to Protect Polyimide-Based X-Ray Windows from Eroding Oxygen Attack Mutikainen R |
268 - 271 |
The Infrared Response of Lead Phthalocyanine Thin-Films to Chlorine and Iodine Doping Collins RA, Abass AK, Krier A |
272 - 275 |
On the Vanderpauw Method of Resistivity Measurements Ramadan AA, Gould RD, Ashour A |