127 - 133 |
Observation of Spectral and Normal Emissivity as a Method of Surface Control During the Growth of Diamond Films Deposited by a Microwave Plasma-Assisted CVD Technique Barrat S, Pigeat P, Dieguez I, Bauergrosse E, Weber B |
134 - 144 |
Microstructure and Water Transport in Spin Cast Films of Poly(Hexylmethacrylate Azobenzene-Sulfone) Sutandar P, Ahn DJ, Franses EI |
145 - 149 |
Structural and Optical-Properties of Electrodeposited Bi2S3, Sb2S3 and As2S3 Thin-Films Yesugade NS, Lokhande CD, Bhosale CH |
150 - 158 |
XRD Microstructural Study of Zn Films Deposited by Unbalanced Magnetron Sputtering Kuzel R, Valvoda V, Chladek M, Musil J, Matous J |
159 - 161 |
RES and Xhrtem Characterization of Epitaxial Ni Films Prepared by Biased DC Sputter-Deposition on MgO(001) Nakai H, Qiu H, Adamik M, Safran G, Barna PB, Hashimoto M |
162 - 168 |
Carbon-Based Hard Films Produced by High-Temperature Carbon-Ion Implantation Cabioch T, Riviere JP, Delafond J, Jaouen M, Denanot MF |
169 - 174 |
High-Resolution Auger Depth Profiling of Multilayer Structures Mo/Si, Mo/B4C, Ni/C Andreev SS, Akhsakhalyan AD, Drozdov MN, Polushkin NI, Salashchenko NN |
175 - 184 |
Comparison of Mechanical-Properties and Microstructure of Al(1 Wt.Percent-Si) and Al(1 Wt.Percent-Si, 0.5 Wt.Percent-Cu) Thin-Films Bader S, Kalaugher EM, Arzt E |
185 - 193 |
Contribution of Ionizations and Atomic Displacements to the Hardening of Ion-Irradiated Polymers Pivin JC |
194 - 197 |
A Novel Method for Determining the Strength of PECVD Silicon (Oxy)Nitride Films Ogbuji LU, Harding DR |
198 - 202 |
Determination of Limits in Deposition of Adhering A-C Films on Silicon Produced by Pulsed-Laser Deposition Zehnder T, Balmer J, Luthy W, Weber HP |
203 - 205 |
Dispersive Optical Bistability in Zncdse-ZnSe/GaAs Strained-Layer Superlattices on Reflection at Room-Temperature Guan ZP, Zheng ZH, Lu YM, Yang BJ, Fan XW |
206 - 212 |
Use of Spectrogoniometric-Ellipsometric Techniques for the Determination of Optical-Properties of Films of Trinitrofluorenone and Poly-N-Vinylcarbazole Carreno F, Martinezanton JC, Bernabeu E |
213 - 220 |
Langmuir-Blodgett-Films of Trivalent Rare-Earth Arachidates - Preparation and Characterization Fink C, Hassmann J, Irmer B, Saemannischenko G |
221 - 230 |
Fatigue of Organometallic Chemical-Vapor-Deposited Pbzrxt1-XO3 Thin-Films with Ru/RuO2 and Pt/Pt Electrodes Taylor DJ, Geerse J, Larsen PK |
231 - 237 |
The Kinetics of Formation of Gas-Sensitive Rgto-SnO2 Films Hellmich W, Boschvonbraunmuhl C, Muller G, Sberveglieri G, Berti M, Perego C |
238 - 242 |
Electroluminescence of Heavily-Doped P-Type Porous Silicon Under Electrochemical Oxidation in the Potentiostatic Regime Billat S, Gaspard F, Herino R, Ligeon M, Muller F, Romestain F, Vial JC |
243 - 247 |
Anisotropy of Conductivity in Polypyrrole Deposited on Crystalline Poly(Ethylene Oxide)-Copper(II) Chloride Complex and Its Blend Khedkar SP, Radhakrishnan S |
248 - 251 |
Structural Study of ZnS Thin-Films Prepared by Spray-Pyrolysis Afifi HH, Mahmoud SA, Ashour A |