| 215 - 230 |
Fundamental understanding and modeling of reactive sputtering processes
Berg S, Nyberg T |
| 231 - 236 |
Studies on micro-structural and electrical properties of spray-deposited fluorine-doped tin oxide thin films from low-cost precursor
Elangovan E, Ramamurthi K |
| 237 - 245 |
Structural studies on Si : H network by micro-Raman, micro-photoluminescence, electron microscopy and ultraviolet ellipsometry: effect of Ar dilution to the SiH4-plasma
Das D |
| 246 - 251 |
A comparative study of p-type diamond films using Raman and transport measurements
Fortunato W, Chiquito AJ, Galzerani JC, Moro JR |
| 252 - 257 |
Influence of oxidant source on the property of atomic layer deposited Al2O3 on hydrogen-terminated Si substrate
Ha SC, Choi E, Kim SH, Roh JS |
| 258 - 263 |
Thermal stability of Cr-doped diamond-like carbon films synthesized by cathodic arc evaporation
Chiu MC, Hsieh WP, Ho WY, Wang DY, Shieu FS |
| 264 - 271 |
Photoanodic properties of sol-gel-derived iron oxide thin films with embedded gold nanoparticles: effects of polyvinylpyrrolidone in coating solutions
Hida Y, Kozuka H |
| 272 - 275 |
Effects of growth ambient on electrical properties of Al-N co-doped p-type ZnO films
Zhuge F, Zhu LP, Ye ZZ, Lu JG, Zhao BH, Huang JY, Wang L, Zhang ZH, Ji ZG |
| 276 - 279 |
Temperature dependence of InN film deposition by an RF plasma-assisted reactive ion beam sputtering deposition technique
Shinoda H, Matsukura N |
| 280 - 287 |
On the dependence on bias voltage of the structural evolution of magnetron-sputtered nanocrystalline Cu films during thermal annealing
Schell N, Andreasen KP, Bottiger J, Chevallier J |
| 288 - 294 |
Electrodeposited carbon nanotube thin films
Pal AK, Roy RK, Mandel SK, Gupta S, Deb B |
| 295 - 302 |
Sputter deposition of bcc tantalum films with TaN underlayers for protection of steel
Gladczuk L, Patel A, Demaree JD, Sosnowski M |
| 303 - 311 |
Infrared spectroscopy of Si-O bonding in low-dose low-energy separation by implanted oxygen materials
Jutarosaga T, Jeoung JS, Seraphin S |
| 312 - 316 |
Microstructure and electrical properties of Al2O3-ZrO2 composite films for gate dielectric applications
Zhu M, Chen P, Fu RKY, Liu WL, Lin CL, Chu PK |
| 317 - 321 |
Pulsed laser deposition and photoluminescence measurements of ZnO thin films on flexible polyimide substrates
Matsumura M, Camata RP |
| 322 - 325 |
Preliminary evaluation of interfacial stability of surface modified porous methyl silsesquioxane by ion implantation for copper metallization scheme
Patel ZP, Roy ANU, Bakhru H, Lu TM |
| 326 - 330 |
Magnetic coupling in La0.67Ca0.33MnO3/La0.67Sr0.33CoO3/Ld(0.67)Ca(0.33)MnO(3) sandwiches
Zhao K, Feng JF, Huang YH, Li H, Wong HK |
| 331 - 335 |
Formation and photoluminescence properties of self-assembled films of 2-naphthyl-Delta(2)-1,3,4-oxadiazoline-5-thione
Yu BZ, Li HL, Zhang YF |
| 336 - 339 |
Spectroscopic properties of an amphiphilic styryl pyridinium dye in Langmuir-Blodgett films
Turshatov AA, Bossi ML, Mobius D, Hell SW, Vedernikov AI, Gromov SP, Lobova NA, Alfimov MV, Zaitsev SY |
| 340 - 343 |
Development of air stable polymer solar cells using an inverted gold on top anode structure
Sahin Y, Alem S, de Bettignies R, Nunzi JM |
| 344 - 351 |
Effect of aluminum doping on the high-temperature stability and piezoresistive response of indium tin oxide strain sensors
Gregory OJ, You T, Crisman EE |
| 352 - 357 |
Effects of silicon nitride interlayer on phase transfort-nation and adhesion of TiNi films
Fu YQ, Du HJ, Zhang S, Ong SE |
| 358 - 365 |
Pattern replication examined with integral geometry approach: application to ion milling of polymer blend films
Raukowska J, Bernasik A, Budkowski A, Rysz J, Kowalski K, Lekka M, Czuba P, Lekki J |
| 366 - 372 |
The ac conductivity and dielectric properties of Europium-Indium oxide films prepared on silicon (100) substrate
Dakhel AA |
| 373 - 378 |
Optical second harmonic generation at platinum phthalocyanine-modified platinum electrodes
Brown RJC, Kucernak AR, Taylor AG |
| 379 - 385 |
Combinatorial approach to the edge delamination test for thin film reliability - adaptability and variability
Chiang MY, Song R, Crosby AJ, Karim A, Chiang CK, Amis EJ |
| 386 - 390 |
Effects of ion bombardment with reactive gas environment on adhesion of Au films to Parylene C film
Seong JW, Kim KW, Beag YW, Koh SK, Yoon KH, Lee JH |
| 391 - 395 |
Effect of oxidation on thickness dependencies of thermoelectric properties in PbTe/mica thin films
Rogacheva EI, Lyubchenkoa SG, Dresselhaus MS |
| 396 - 404 |
Surface and electronic structure of Ga0.92In0.08N thin film investigated by photoelectron spectroscopy
Kowalski BJ, Kowalik IA, Iwanowski RJ, Sadowski J, Kanski J, Orlowski BA, Ghijsen J, Mirabella F, Lusakowska E, Perlin P, Porowski S, Grzegory I, Leszczynski M |
