1 - 11 |
Surface processes in OMVPE - the frontiers Stringfellow GB, Shurtleff JK, Lee RT, Fetzer CM, Jun SW |
12 - 19 |
TEM study of the morphological and compositional instabilities of InGaAsP epitaxial structures Patriarche G, Glas F, Le Roux G, Largeau L, Mereuta A, Ougazzaden A, Benchimol JL |
20 - 25 |
MOVPE strain layers - growth and application Strupinski W, Dillner L, Sass J, Kosiel K, Stake J, Ingvarson M, Jakiela R |
26 - 30 |
Fabrication of a P-stabilized CaP(001)-(2 x 1) surface at very low pressure studied by LEED, STM, AES, and RHEED Fukuda Y, Sekizawa N, Mochizuki S, Sanada N |
31 - 36 |
Sb-flow-rate dependence of triple-period (TP)-A-type atomic-ordering in Ga0.5In0.5P grown by metalorganic-vapor-phase epitaxy Suzuki T, Ichihashi T, Kurihara K, Nishi K |
37 - 40 |
Perfect "fractal" behavior in XRD pattern of Ga(As,P) Fibonacci lattice grown by atomic layer epitaxy Isshiki H, Lee JS, Aoyagi Y, Sugano T |
41 - 46 |
Impurity incorporation of unintentionally doped AlxGa1-xAs during MOVPE Fujii K, Kawamura K, Gotoh H |
47 - 52 |
Incorporation mechanism of Si during delta-doping in GaAs singular and vicinal surfaces Motohisa J, Tazaki C, Akabori M, Fukui T |
53 - 58 |
Carbon doping for the GaAs base layer of Heterojunction Bipolar Transistors in a production scale MOVPE reactor Brunner F, Bergunde T, Richter E, Kurpas P, Achouche M, Maassdorf A, Wurfl J, Weyers M |
59 - 65 |
Heavily carbon-doped GaAsSb grown on InP for HBT applications Watkins SP, Pitts OJ, Dale C, Xu XG, Dvorak MW, Matine N, Bolognesi CR |
66 - 69 |
Carbon doping of InAlAs in LP-MOVPE using CBr4 Ougazzaden A, Holavanahalli J, Geva M, Smith LE |
70 - 74 |
Comparison of MOVPE-based Zn diffusion into InGaAsP/InP using H-2 and N-2 carrier gas Schroeter-Janssen H, Roehle H, Franke D, Bochnia R, Harde P, Grote N |
75 - 80 |
Influence of Zn introduction on Al(x)Ga(1-x)AS crystal growth by MOVPE Fujii K, Kawamura K, Gotoh H |
81 - 85 |
Synthesis of oxygen-free trimethylindium using second generation adduct purification techniques Coward KM, Jones AC, Bickley JF, Steiner A, Smith LM, Ravetz MS, Rushworth SA, Odedra R, Roberts JS, Pemble ME |
86 - 90 |
Low oxygen content trimethylaluminium and trimethylindium for MOVPE of light emitting devices Smith LM, Rushworth SA, Ravetz MS, Odedra R, Kanjolia R, Agert C, Dimroth F, Schubert U, Bett AW |
91 - 97 |
On the choice of precursors for the MOVPE-growth of high-quality Al(0.30)Gao(0.70)As/GaAs v-groove quantum wires with large subband spacing Kaluza A, Schwarz A, Gauer D, Hardtdegen H, Nastase N, Luth H, Schapers T, Meertens D, Maciel A, Ryan J, O'Sullivan E |
98 - 105 |
In situ studies of the effect of silicon on GaN growth modes Munkholm A, Stephenson GB, Eastman JA, Auciello O, Murty MVR, Thompson C, Fini P, Speck JS, DenBaars SP |
XI - XI |
Proceedings of the Tenth International Conference on Metalorganic Vapor Phase Epitaxy Sapporo, Japan, 5-9 June 2000 - Preface Onabe K, Kawai H |
106 - 110 |
In situ observation of superstructures on InP(001) surface under hydrogen atmospheric environment with using grazing incidence X-ray diffraction Kawamura T, Watanabe Y, Utsumi Y, Uwai K, Matsui J, Kagoshima Y, Tsusaka Y, Fujikawa S |
111 - 116 |
Real-time monitoring of ellipsometry monolayer oscillations during metalorganic vapor-phase epitaxy Lee JS, Masumoto Y |
117 - 123 |
In situ monitoring of the MOCVD growth of CdS/CdTe Irvine SJC, Hartley A, Stafford A |
124 - 128 |
Reflectance anisotropy spectra for the transition from the P-rich to the In-rich surface reconstruction of InP(100) Hannappel T, Visbeck S, Zorn M, Zettler JT, Willig F |
129 - 135 |
Kinetic study of P and As desorption from binary and ternary III-V semiconductors surface by in situ ellipsometry Feron O, Nakano Y, Shimogaki Y |
136 - 141 |
Kinetic ellipsometry measurement of InGaP/GaAs hetero-interface formation in MOVPE Nakano T, Nakano Y, Shimogaki Y |
142 - 148 |
Quantifying the smoothing of GaN epilayer growth by in situ laser interferometry Stafford A, Irvine SJC, Bougrioua Z, Jacobs K, Moerman I, Thrush EJ, Considine L |
149 - 155 |
In situ investigation of GaAs (001) intrinsic carbon p-doping in metal-organic vapour phase epitaxy Pristovsek M, Han B, Zettler JT, Richter W |
156 - 159 |
In situ reflectance monitoring of overgrowth of InGaAs gratings in laser diode manufacture Ebert CW, Joyner CH, Rao GK, Venables RD |
160 - 165 |
In situ characterisation of epiready III-V substrates for MOVPE Allwood DA, Grant IR, Mason NJ, Palmer RA, Walker PJ |
166 - 171 |
Infrared single wavelength gas composition monitoring for metalorganic vapour-phase epitaxy Watkins SP, Pinnington T, Hu J, Yeo P, Kluth M, Mason NJ, Nicholas RJ, Walker PJ |
172 - 176 |
Surface and bulk passivation of defects in GaAs/Si by RF plasma-assisted MOCVD Wang G, Ogawa T, Soga T, Jimbo T, Umeno M |
177 - 182 |
MOVPE-based in situ etching of In(GaAs)P/InP using tertiarybutylchloride Wolfram P, Ebert W, Kreissl J, Grote N |
183 - 188 |
Highly selective growth of AlGaInAs assisted by CBr4 during MOCVD growth Arakawa S, Itoh M, Kasukawa A |
189 - 195 |
Growth pressure dependence of neighboring mask interference in densely arrayed narrow-stripe selective MOVPE for integrated photonic devices Sudo S, Yokoyama Y, Nakazaki T, Mori K, Kudo K, Yamaguchi M, Sasaki T |
196 - 200 |
Wavelength control of arrayed waveguide by MOVPE selective area growth Kihara T, Nitta Y, Suda H, Miki K, Shimomura K |
201 - 207 |
Constant growth of V-groove AlGaAs/GaAs multilayers on submicron gratings for complex optical devices Son CS, Kim TG, Wang XL, Ogura M |
208 - 211 |
Epitaxial regrowth of AlGaInP on AlGaInP grooved structure by MOVPE Fukuhisa T, Imafuji O, Mannoh M, Yuri M, Itoh K |
212 - 219 |
GaAs buried growth over tungsten stripe using TEG and TMG Arai T, Tobita H, Miyamoto Y, Furuya K |
220 - 224 |
Growth of stress-reduced GaAs on Si substrate by using epitaxial lift-off and MOCVD regrowth Soga T, Arokiaraj J, Taguchi H, Jimbo T, Umeno M |
225 - 230 |
Conformal MOVPE of (Al)GaAs on silicon using alternative chlorine-containing precursors Philippens M, Oligschlaeger R, Gerard B, Rushworth S, Gil-Lafon E, Napierala J, Jimenez J, Heime K |
231 - 239 |
Progress in crystal growth of nitride semiconductors Akasaki I |
240 - 245 |
Time-resolved photoluminescence study of GaN grown by metalorganic chemical vapor deposition Kwon HK, Eiting CJ, Lambert DJH, Wong MM, Shelton BS, Zhu TG, Liliental-Weber Z, Benamura M, Dupuis RD |
246 - 250 |
MOVPE of GaN on sapphire using the alternate precursor 1,1-dimethylhydrazine Bourret-Courchesne ED, Yu KM, Irvine SJC, Stafford A, Rushworth SA, Smith LM, Kanjolia R |
251 - 257 |
Nearly strain-free AlGaN on (0001) sapphire: X-ray measurements and a new crystallographic growth model Krost A, Blasing J, Schulze F, Schon O, Alam A, Heuken M |
258 - 261 |
Growth of AlN on sapphire substrates by using a thin AlN buffer layer grown two-dimensionally at a very low V/III ratio Ohba Y, Sato R |
262 - 266 |
In situ and ex situ evaluation of the film coalescence for GaN growth on GaN nucleation layers Figge S, Bottcher T, Einfeldt S, Hommel D |
267 - 270 |
High hole concentrations in Mg-doped InGaN grown by MOVPE Kumakura K, Makimoto T, Kobayashi N |
271 - 275 |
AFM measurement of initially grown GaN layer on GaAs substrate Tanaka H, Nakadaira A |
276 - 279 |
Metalorganic vapor-phase epitaxy of cubic GaN on GaAs (100) substrates by inserting an intermediate protection layer Wu J, Zhao FH, Onabe K, Shiraki Y |
280 - 285 |
AlAs/GaAs(001) as a template for c-oriented hexagonal GaN grown by metalorganic vapor-phase epitaxy Ishido T, Funato M, Hamaguchi A, Fujita S, Fujita S |
286 - 292 |
Growth characteristics of GaN on (001)GaP substrates by MOVPE Wuu DS, Lin WT, Pan CC, Horng RH |
293 - 296 |
Structural investigation of GaN layers grown on Si(111) substrates using a nitridated AlAs buffer layer Strittmatter A, Bimberg D, Krost A, Blasing J, Veit P |
297 - 300 |
Nucleation control in MOVPE of group III-nitrides on SiC substrate Nishida T, Kobayashi N |
301 - 304 |
Growth and characterization of graded AlCaN conducting buffer layers on n(+) SiC substrates Moran B, Hansen M, Craven MD, Speck JS, DenBaars SP |
305 - 310 |
Low-temperature growth of GaN by remote-plasma-enhanced organometallic vapor-phase epitaxy Wakahara A, Genba J, Yoshida A, Saiki H |
311 - 315 |
Growth of GaN film on a-plane sapphire substrates by plasma-assisted MOCVD Sugianto, Sani RA, Arifin P, Budiman M, Barmawi M |
316 - 326 |
Fabrication and characterization of low defect density GaN using facet-controlled epitaxial lateral overgrowth (FACELO) Hiramatsu K, Nishiyama K, Onishi M, Mizutani H, Narukawa M, Motogaito A, Miyake H, Iyechika Y, Maeda T |
327 - 333 |
Control of crystalline quality of MOVPE-grown GaN and (Al,Ga)N/AlGaN MQW using In-doping and/or N-2 carrier gas Yamaguchi S, Kariya M, Nitta S, Kashima T, Kosaki M, Yukawa Y, Amano H, Akasaki I |
334 - 337 |
A new method of reducing dislocation density in GaN layer grown on sapphire substrate by MOVPE Sakai S, Wang T, Morishima Y, Naoi Y |
338 - 344 |
High-quality GaN films obtained by air-bridged lateral epitaxial growth Ishibashi A, Kidoguchi I, Sugahara G, Ban Y |
345 - 349 |
Drastic reduction of threading dislocation in GaN regrown on grooved stripe structure Ishida M, Ogawa M, Orita K, Imafuji O, Yuri M, Sugino T, Itoh K |
350 - 355 |
Reduced damage of electron cyclotron resonance etching by In doping into p-GaN Makimoto T, Kumakura K, Kobayashi N |
356 - 361 |
In situ annealing treatment and In-doping of GaN epilayers grown by MOVPE Lu DC, Wang CX, Yuan HR, Liu XL, Wang XH |
362 - 367 |
Optical properties of undoped and modulation-doped AlxGa1-xN/GaN heterostructures grown by metalorganic chemical vapor deposition Kwon HK, Eiting CJ, Lambert DJH, Shelton BS, Wong MM, Zhu TG, Dupuis RD |
368 - 372 |
Structural and optical properties of InGaN/GaN multiple quantum wells: The effect of the number of InGaN/GaN pairs Kim DJ, Moon YT, Song KM, Choi CJ, Ok YW, Seong TY, Park SJ |
373 - 377 |
MOCVD growth, stimulated emission and time-resolved PL studies of InGaN/(In)GaN MQWs: well and barrier thickness dependence Shee SK, Kwon YH, Lam JB, Gainer GH, Park GH, Hwang SJ, Little BD, Song JJ |
378 - 381 |
Growth of BGaN/AlGaN multi-quantum-well structure by metalorganic vapor phase epitaxy Kurimoto M, Takano T, Yamamoto J, Ishihara Y, Horie M, Tsubamoto M, Kawanishi H |
382 - 387 |
The reaction mechanisms for precursors in photo-assisted metalorganic-vapor-phase epitaxy growth of ZnSe Fujita Y |
388 - 392 |
Optical and structural properties of high-quality ZnS epitaxial layers grown on GaAs substrates by low-pressure metalorganic chemical vapor deposition Nakamura S, Takagimoto S, Ando T, Kugimiya H, Yamada Y, Taguchi T |
393 - 397 |
Compensation of nitrogen acceptor in ZnSe : N/ZnSe grown by MOCVD Wang J, Miki T, Omino A, Park KS, Isshiki M |
398 - 403 |
Deep levels in Sb-doped ZnSe fabricated by metalorganic vapor-phase epitaxy Kawahara T, Ohbuchi Y, Tabuchi N, Morimoto J, Goto H, Ido T |
404 - 409 |
Effects of substrate temperature upon photoluminescence properties of ZnTe layers grown by photo-assisted MOVPE Hayashida K, Nishio M, Harada H, Furukawa S, Guo QX, Ogawa H |
410 - 415 |
Low pressure MOVPE growth and structural properties of ZnMgSe epilayers on (100)GaAs Prete P, Lovergine N, Tapfer L, Berti M, Sinha SK, Mancini AM |
416 - 420 |
ZnMgCdSe structures on InP grown by MOVPE Strassburg M, Strassburg M, Schulz O, Pohl UW, Bimberg D, Litvinov D, Gerthsen D, Schmidbauer M, Schafer P |
421 - 424 |
Epitaxial growth of MgxZn1-xS heterostructures by low-pressure MOCVD Yoshimura K, Ishizaki S, Yamada Y, Taguchi T |
425 - 430 |
Growth mechanism of selectively grown II-VI semiconductor photonic dots for short-wavelength light emitters Ueta A, Shimozawa T, Avramescu A, Suemune I, Machida H, Shimoyama N |
431 - 434 |
Hetero-epitaxial growth of ZnO thin films by atmospheric pressure CVD method Kashiwaba Y, Katahira F, Haga K, Sekiguchi T, Watanabe H |
435 - 439 |
Role of ZnS buffer layers in growth of zincblende ZnO on GaAs substrates by metalorganic molecular-beam epitaxy Ashrafi AA, Ueta A, Kumano H, Suemune I |
440 - 443 |
Homoepitaxial YBa2Cu3Ox films grown on single-crystal YBa2Cu3Ox substrates by metalorganic chemical vapor deposition using beta-diketonates Zama H, Tanaka N, Morishita T |
444 - 449 |
Novel Sb-based materials for uncooled infrared photodetector applications Lee JJ, Razeghi M |
450 - 455 |
MOVPE of AlGaAsSb using TTBAl as an alternative aluminum precursor Giesen C, Szymakowski A, Rushworth S, Heuken M, Heime K |
456 - 460 |
High nitrogen composition GaAsN by atmospheric pressure metalorganic vapor-phase epitaxy Toivonen J, Hakkarainen T, Sopanen M, Lipsanen H |
461 - 466 |
Observation of compositional fluctuations in GaNAs alloys grown by metalorganic vapor-phase epitaxy Takahashi M, Moto A, Tanaka S, Tanabe T, Takagishi S, Karatani K, Nakayama M, Matsuda K, Saiki T |
467 - 474 |
Spatial distribution of deep level traps in GaNAs crystals Tanaka S, Moto A, Takahashi M, Tanabe T, Takagishi S |
475 - 480 |
AFM study and optical properties of GaAsN/GaAs epilayers grown by MOVPE Auvray L, Dumont H, Dazord J, Monteil Y, Bouix J, Bru-Chevalier C |
481 - 484 |
Optical characterization of metalorganic vapor-phase epitaxy-grown GaAs1-xNx alloys using spectroscopic ellipsometry Matsumoto S, Yaguchi H, Kashiwase S, Hashimoto T, Yoshida S, Aoki D, Onabe K |
485 - 490 |
Hydrogen and carbon incorporation in GaInNAs Moto A, Takahashi M, Takagishi S |
491 - 495 |
Effects of thermal annealing procedure and a strained intermediate layer on a highly-strained GaInNAs/GaAs double-quantum-well structure Kitatani T, Kondow M, Tanaka T |
496 - 502 |
Effect of growth conditions and strain compensation on indium incorporation for diode lasers emitting above 1050 nm Bugge F, Zeimer U, Gramlich S, Rechenberg I, Sebastian J, Erbert G, Weyers M |
503 - 508 |
Critical layer thickness of 1.2-mu m highly strained GaInAs/GaAs quantum wells Schlenker D, Miyamoto T, Chen ZB, Kawaguchi M, Kondo T, Gouardes E, Koyama F, Iga K |
509 - 514 |
Characterization of InGaP/GaAs heterointerfaces grown by metal organic vapour phase epitaxy Sharma TK, Arora BM, Gokhale MR, Rajgopalan S |
515 - 519 |
Ordering-induced electron accumulation at GaInP/GaAs hetero-interfaces Tanaka T, Takano K, Tsuchiya T, Sakaguchi H |
520 - 524 |
Rapid high-resolution X-ray diffraction measurement and analysis of MOVPE pHEMT structures using a high-brilliance X-ray source and automatic pattern fitting Lafford T, Taylor M, Wall J, Loxley N |
525 - 529 |
MOVPE growth and properties of P-I-N InGaAs/GaAs strained multi-quantum well structures on (111)A GaAs substrates Kim J, Cho S, Sanz-Hervas A, Majerfeld A, Kim BW |
530 - 534 |
Growth and optical properties of highly strained GaInAs/GaAs quantum wells on (311)B GaAs by MOCVD Nishiyama N, Arai M, Shinada S, Miyamoto T, Koyama F, Iga K |
535 - 539 |
Influence of compressive strain on the arsenic incorporation in MOVPE-grown InAsP/InP single quantum wells Venkataraghavan R, Gokhale MR, Shah AP, Bhattacharya A, Chandrasekaran KS, Arora BM |
540 - 545 |
OMVPE fabrication of continuous transitions between GaAs/AlGaAs quantum wells and V-groove quantum wires Lelarge F, Kaufman D, Dwir B, Mautino S, Rudra A, Kapon E |
546 - 550 |
Formation of wire-like surfaces and lateral composition modulation in GaAsN grown by metalorganic molecular-beam epitaxy Suemune I, Morooka N, Uesugi K, Ok YW, Seong TY |
551 - 555 |
Origin of disorder in self-ordered GaAs/AlGaAs quantum wires grown by OMVPE on V-grooved substrate Lelarge F, Otterburg T, Oberli DY, Rudra A, Kapon E |
556 - 560 |
Flow rate modulation epitaxy of high-quality V-shaped AlGaAs/GaAs quantum wires using tertiarybutylarsine as the arsenic source Wang XL, Ogura M |
561 - 565 |
GaInNAs/GaAs quantum dots grown by chemical beam epitaxy Makino S, Miyamoto T, Kageyama T, Nishiyama N, Koyama F, Iga K |
566 - 570 |
Size control of self-assembled quantum dots Johansson J, Seifert W |
571 - 575 |
Growth of self-assembled GaxIn1-xP quantum islands on GaP Porsche J, Scholz F |
576 - 580 |
Formation of uniform 10-nm-scale InGaN quantum dots by selective MOCVD growth and their micro-photoluminescence intensity images Tachibana K, Someya T, Ishida S, Arakawa Y |
581 - 585 |
Surface flattening during MOCVD of thin GaAs layers covering InGaAs quantum dots Sellin R, Heinrichsdorff F, Ribbat C, Grundmann M, Pohl UW, Bimberg D |
586 - 591 |
Low-index facet formation in InGaAs islands on GaAs (n11)B substrates Lee JS, Nishi K, Masumoto Y |
592 - 598 |
Optimizing the growth procedure for InAs quantum dot stacks by optical in situ techniques Steimetz E, Wehnert T, Kirmse H, Poser F, Zettler JT, Neumann W, Richter W |
599 - 604 |
Position and number control of self-assembled InAs quantum dots by selective area metalorganic vapor-phase epitaxy Hahn CK, Motohisa J, Fukui T |
605 - 610 |
Magnetic and optical properties of Mn-including InAs dots grown by metalorganic molecular beam epitaxy Zhou YK, Asahi H, Asakura J, Okumura S, Asami K, Gonda S |
611 - 615 |
Thin GaSb insertions and quantum dot formation in GaAs by MOCVD Muller-Kirsch L, Pohl UW, Heitz R, Kirmse H, Neumann W, Bimberg D |
616 - 621 |
Performance of multiwafer reactor GaN MOCVD system Tokunaga H, Tan H, Inaishi Y, Arai T, Yamaguchi A, Hidaka J |
622 - 628 |
Fundamental models of the metalorganic vapor-phase epitaxy of gallium nitride and their use in reactor design Pawlowski RP, Theodoropoulos C, Salinger AG, Mountziaris TJ, Moffat HK, Shadid JN, Thrush EJ |
629 - 634 |
Uniformity control of group-III nitrides grown on 5 x 3 inch Al2O3 substrates in Planetary Reactors((R)) Protzmann H, Luenenbuerger M, Bremser M, Heuken M, Juergensen H |
635 - 639 |
A study of cylinder design for solid OMVPE sources Timmons M, Rangarajan P, Stennick R |
640 - 645 |
Properties of GaN-based laser diodes with a buried-ridge structure Asatsuma T, Nakajima H, Hashimoto S, Yamaguchi T, Yoshida H, Tomiya S, Asano T, Hino T, Ozawa M, Miyajima T, Kobayashi T, Ikeda M |
646 - 651 |
AlGaInN high-power lasers grown on an ELO-GaN layer Takeya M, Yanashima K, Asano T, Hino T, Ikeda S, Shibuya K, Kijima S, Tojyo T, Ansai S, Uchida S, Yabuki Y, Aoki T, Asatsuma T, Ozawa M, Kobayashi T, Morita E, Ikeda M |
652 - 656 |
High-power ohmic-electrodes dispersive AlGaInP double-hetero structure yellowish-green light-emitting diodes Hosokawa Y, Nabekura W, Hoshina T, Takeuchi R, Sakaue K, Udagawa T |
657 - 662 |
Low threshold current densities in red VCSELs Butendeich R, Graef D, Schwarz J, Ballmann T, Schweizer H, Scholz F |
663 - 667 |
Optimization of MOVPE growth for 650 nm-emitting VCSELs Bhattacharya A, Zorn M, Oster A, Nasarek M, Wenzel H, Sebastian J, Weyers M, Trankle G |
668 - 673 |
InAlGaP microcavity LEDs on Ge-substrates Modak P, Delbeke D, Moerman I, Baets R, Van Daele P, Demeester P |
674 - 678 |
InP 1.3 mu m microcavity LEDs with high quantum efficiency Depreter B, Moerman I, Baets R, Van Daele P, Demeester P |
679 - 682 |
High-power electrically injected mid-infrared interband lasers grown by LP-MOCVD Lane B, Razeghi M |
683 - 687 |
MOVPE growth of lattice-mismatched Al0.88In0.12As on GaAs (100) for space solar cell applications Sinharoy S, Stan MA, Pal AM, Weizer VG, Smith MA, Wilt DM, Reinhardt K |
688 - 692 |
Low-temperature growth of GaAs polycrystalline films on glass substrates for space solar cell application Imaizumi M, Adachi M, Fujii Y, Hayashi Y, Soga T, Jimbo T, Umeno M |
693 - 698 |
Polarization-insensitive InGaAsP/InP vertical coupler filter with deep grating by five-step MOVPE growth Horita M, Yazaki T, Tanaka S, Matsushima Y |
699 - 703 |
Microcavities with distributed Bragg reflectors based on ZnSe/MgS superlattice grown by MOVPE Tawara T, Yoshida H, Yogo T, Tanaka S, Suemune I |
704 - 712 |
MOVPE overgrowth of metallic features for realisation of 3D metal-semiconductor quantum devices Wernersson LE, Borgstrom M, Gustafson B, Gustafsson A, Jarlskog L, Malm JO, Litwin A, Samuelson L, Seifert W |
713 - 716 |
Metal-organic VPE growth of electron mobility enhanced GaInP/GaInAs pseudomorphic two-dimensional FET structure Kimura M, Okano T, Okuyama M, Udagawa T, Azuhata H, Sawada A, Takamasu T |
717 - 721 |
Low tensile strain GaInAs : uid/GaAs : C superlattice heterostructures grown by LP MOCVD: application to GaInP/GaAs heterojunction bipolar transistor base layer di Forte-Poisson MA, Bernard S, Teisseire L, Brylinski C, Cassette S, di Persio J |
722 - 729 |
InAlAs/InGaAs/InP heterostructures for RTD and HBT device applications grown by LP-MOVPE using non-gaseous sources Velling P, Agethen M, Prost W, Tegude FJ |
730 - 733 |
The growth of AlGaN/GaN heterojunction bipolar transistors by metalorganic chemical vapor deposition Lambert DJH, Huang JJ, Shelton BS, Wong MM, Chowdhury U, Zhu TG, Kwon HK, Liliental-Weber Z, Benarama M, Feng M, Dupuis RD |
734 - 738 |
Electrical transport properties of highly Mg-doped GaN epilayers grown by MOCVD Cheong MG, Kim KS, Namgung NW, Han MS, Yang GM, Hong CH, Suh EK, Lim KY, Lee HJ, Yoshikawa A |
739 - 742 |
Large electron field emission from high-quality heavily Si-doped AlN grown by MOVPE Kasu M, Kobayashi N |
743 - 750 |
Thermodynamic analysis of the MOVPE growth of InGaAlN quaternary alloy Koukitu A, Kumagai Y, Seki H |
751 - 757 |
Gas-phase chemistry of metalorganic and nitrogen-bearing compounds Watwe RM, Dumesic JA, Kuech TF |
758 - 764 |
Detailed thermal boundary conditions in the 3D fluid-dynamic modelling of horizontal MOVPE reactors Mucciato R, Lovergine N |
765 - 771 |
Regional density functional theory for crystal growth in GaN Nakamura K, Hayashi T, Tachibana A, Matsumoto K |