1 - 3 |
AgBiS2 single crystal grown using slow cooling method and its characterization Nakamura M, Nakamura H, Ohsawa T, Imura M, Shimamura K, Ohashi N |
4 - 11 |
Microstructure evaluation of nanocrystalline MgO powders using the advanced X-ray line profile analysis Soleimanian V, Abedi M, Aghdaee SR |
12 - 18 |
Dislocation generation at near-coincidence site lattice grain boundaries during silicon directional solidification Autruffe A, Hagen VS, Arnberg L, Di Sabatino M |
19 - 23 |
Growth and characterization of 2,6-Di-tert-butyl-4-(dimethylaminomethyl)phenol single crystal by the vertical Bridgman method Solanki SSB, Perumal RN, Ahamed MB |
24 - 29 |
Nucleation of ammonium aluminum sulfate dodecahydrate from unseeded aqueous solution You SW, Zhang YF, Zhang Y |
30 - 33 |
Measurement of the diffusivity of CdTe in liquid Te at crystal growth temperatures Roszmann J, Sekhon M, Dost S |
34 - 37 |
Compositional homogeneity and X-ray topographic analyses of CdTexSe1-x grown by the vertical Bridgman technique Roy UN, Bolotnikov AE, Camarda GS, Cui Y, Hossain A, Lee K, Lee W, Tappero R, Yang G, Cui Y, Burger A, James RB |
38 - 44 |
Microscopic crystalline structure of a thick AlN film grown on a trench-patterned AlN/alpha-Al2O3 template Khan DT, Takeuchi S, Nakamura Y, Nakamura K, Arauchi T, Miyake H, Hiramatsu K, Imai Y, Kimura S, Sakai A |
45 - 48 |
Effect of reaction mixture composition and silica source on size distribution of zeolite X crystals Tekin R, Bac N, Warzywoda J, Sacco A |
49 - 55 |
Applicability of the three-dimensional Alexander-Haasen model for the analysis of dislocation distributions in single-crystal silicon Gao B, Jiptner K, Nakano S, Harada H, Miyamura Y, Sekiguchi T, Kakimoto K |
56 - 62 |
Stable vicinal step orientations in m-plane GaN Kelchner KM, Kuritzky LY, Nakamura S, DenBaars SP, Speck JS |
63 - 70 |
Investigating the effect of carbon on oxygen behavior in n-type Czochralski silicon for PV application Zhang S, Juel M, Ovrelid EJ, Tranell G |
71 - 75 |
Growth of wurtzite GaP in InP/GaP core-shell nanowires by selective-area MOVPE Ishizaka F, Hiraya Y, Tomioka K, Fukui T |
76 - 80 |
Characterization of semi-polar GaN on GaAs substrates Saengkaew P, Sanorpim S, Yordsri V, Thanachayanont C, Onabe K |
81 - 87 |
Physical properties of vapour grown indium monotelluride platelets Kunjomana AG, Chandrasekharan KA, Teena M |
88 - 95 |
Quantitative analysis by in situ synchrotron X-ray radiography of the evolution of the mushy zone in a fixed temperature gradient Salloum-Abou-Jaoude G, Reinhart G, Combeau H, Zaloznik M, Lafford TA, Nguyen-Thi H |
96 - 105 |
Existence and static stability of the meniscus in horizontal ribbon growth Oliveros GA, Sridhar S, Ydstie BE |
106 - 109 |
MOVPE growth of semipolar (11(2)over-bar2) Al1-xInxN across the alloy composition range (0 <= x <= 0.55) Hatui N, Frentrup M, Rahman AA, Kadir A, Subramanian S, Kneissl M, Bhattacharya A |