1 - 8 |
Improvement in the optical quality and energy resolution of CsSrBr3: Eu scintillator crystals Gokhale SS, Stand L, Lindsey A, Koschan M, Zhuravleva M, Melcher CL |
9 - 14 |
Single crystal growth and X-ray structure analysis of non-peripheral octahexyl phthalocyanine Ohmori M, Nakano C, Higashi T, Miyano T, Tohnai N, Fujii A, Ozaki M |
15 - 23 |
Obtaining phase-pure CZTS thin films by annealing vacuum evaporated CuS/SnS/ZnS stack Sanchez TG, Mathew X, Mathews NR |
24 - 29 |
High uniform growth of 4-inch GaN wafer via flow field optimization by HVPE Cheng YT, Liu P, Wu JJ, Xiang Y, Chen XJ, Ji C, Yu TJ, Zhang GY |
30 - 36 |
TEM study of defect structure of GaN epitaxial films grown on GaN/Al2O3 substrates with buried column pattern Mynbaeva MG, Kremleva AV, Kirilenko DA, Sitnikova AA, Pechnikov AI, Mynbaev KD, Nikolaev VI, Bougrov VE, Lipsanen H, Romanov AE |
37 - 41 |
Influence of the pulling rate on the properties of ZnGeP2 crystal grown by vertical Bridgman method Shen L, Wu D |
42 - 46 |
Morphology and magnetic properties of CoFe2O4 nanocables fabricated by electrospinning based on the Kirkendall effect Zhang ZM, Yang GJ, Wei JX, Bian HQ, Gao JM, Li JY, Wang T |
47 - 52 |
Effect of heating conditions on flow patterns during the seeding stage of Kyropoulos sapphire crystal growth Timofeev VV, Kalaev VV, Ivanov VG |
53 - 57 |
Effect of ramping on oxygen precipitates and Cu-vacancy complex in Czochralski silicon Xu J, Lv YC, Guo WB, Xie TT |
58 - 62 |
New CVD-based method for the growth of high-quality crystalline zinc oxide layers Huber F, Madel M, Reiser A, Bauer S, Thonke K |
63 - 64 |
Comment on "Experimental study of the orientation dependence of indium incorporation in GaInN" [J. Cryst. Growth 433 (2016) 7-12] Monavarian M |
65 - 72 |
Very low temperature epitaxy of Ge and Ge rich SiGe alloys with Ge2H6 in a Reduced Pressure - Chemical Vapour Deposition tool Aubin J, Hartmann JM, Bauer M, Moffatt S |
73 - 77 |
The orientational relationship between monoclinic beta-Ga2O3 and cubic NiO Nakagomi S, Kubo S, Kokubun Y |
78 - 83 |
Wafer-scale crack-free AlGaN on GaN through two-step selective-area growth for optically pumped stimulated emission Ko YH, Bae SB, Kim SB, Kim DC, Leem YA, Cho YH, Nam ES |
84 - 89 |
Growth, structural, thermal, electrical and nonlinear optical properties of Yb3+ doped KTiOPO4 Sadhasivam S, Perumal RN, Ramasamy P |
90 - 100 |
Directional melting and solidification of gallium in a traveling magnetic field as a model experiment for silicon processes Dadzis K, Lukin G, Meier D, Bonisch P, Sylla L, Patzold O |
101 - 107 |
Ca10Li(VO4)(7):Nd3+, a promising laser material: growth, structure and spectral characteristics of a Czochralski-grown single crystal Kosmyna MB, Nazarenko BP, Puzikov VM, Shekhovtsov AN, Paszkowicz W, Behrooz A, Romanowski P, Yasukevich AS, Kuleshov NV, Demesh MP, Wierzchowski W, Wieteska K, Paulmann C |
108 - 109 |
Reply to "Comments on'Experimental study of the orientation dependence of indium incorporation in GaInN'" by Morteza Monavarian Bhat R, Guryanov GM |
110 - 114 |
The effects of zinc-doping on the composition of InGaAsP layers grown by MOCVD Salehzadeh O, He C, Benyon W, SpringThorpe AJ |