177 - 186 |
Mechanisms of crystallization of bulk GaN from the solution under high N-2 pressure Grzegory I, Bockowski M, Lucznik B, Krukowski S, Romanowski Z, Wroblewski M, Porowski S |
187 - 193 |
Bulk AlN crystal growth: self-seeding and seeding on 6H-SiC substrates Edgar JH, Liu L, Liu B, Zhuang D, Chaudhuri J, Kuball M, Rajasingam S |
194 - 206 |
Directional crystallization of GaN on high-pressure solution grown substrates by growth from solution and HVPE Bockowski M, Grzegory I, Krukowski S, Lucznik B, Romanowski Z, Wroblewski M, Borysiuk J, Weyher J, Hageman P, Porowski S |
207 - 214 |
Growth and separation related, properties of HVPE-GaN free-standing films Paskova T, Darakchieva V, Paskov P, Sodervall U, Monemar B |
215 - 222 |
Thick and high-quality GaN growth on GaAs (111) substrates for preparation of freestanding GaN Kumagai Y, Murakamia H, Seki H, Koukitu A |
223 - 229 |
Growth and characterization of low defect GaN by hydride vapor phase epitaxy Xu XP, Vaudo RP, Loria C, Salant A, Brandes GR, Chaudhuri J |
230 - 236 |
Surface polarity dependence of decomposition and growth of GaN studied using in situ gravimetric monitoring Koukitu A, Mayumi M, Kumagai Y |
237 - 243 |
Recrystallization prospects for freestanding low-temperature GaN grown using ZnO buffer layers Butcher KSA, Afifuddin P, Chen PT, Godlewski M, Szczerbakow A, Goldys EM, Tansley TL, Freitas JA |
244 - 251 |
Use of high temperature hydrogen annealing to remove sub-surface damage in bulk GaN Myers TH, VanMil BL, Holbert LJ, Peng CY, Stinespring CD, Alam J, Freitas JA, Dmitriev VA, Pechnikov A, Shapovalova Y, Ivantsov V |
252 - 258 |
Piezoresponse force microscopy for piezoelectric measurements of III-nitride materials Rodriguez BJ, Gruverman A, Kingon AI, Nemanich RJ |
259 - 270 |
Comparison between structural properties of bulk GaN grown in liquid Ga under high N pressure and GaN grown by other methods Lihental-Weber Z, Jasinski J, Washburn J |
271 - 280 |
Synchrotron white beam topography characterization of physical vapor transport grown AlN and ammonothermal GaN Raghothamachar B, Vetter WM, Dudley M, Dalmau R, Schlesser R, Sitar Z, Michaels E, Kolis JW |
281 - 286 |
Vacancies as compensating centers in bulk GaN: doping effects Saarinen K, Ranki V, Suski T, Bockowski M, Grzegory I |
287 - 298 |
Some effects of oxygen impurities on AlN and GaN Slack GA, Schowalter LJ, Morelli D, Freitas JA |
299 - 306 |
Optical characterization of bulk GaN grown by a Na-Ga melt technique Skromme BJ, Palle K, Poweleit CD, Yamane H, Aoki M, DiSalvo FJ |
307 - 314 |
Donors in hydride-vapor-phase epitaxial GaN Freitas JA, Moore WJ, Shanabrook BV, Braga GCB, Lee SK, Park SS, Han JY, Koleske DD |
315 - 319 |
Do we know the fundamental energy gap of InN? Bechstedt F, Furthmuller J |
320 - 324 |
Band structure effects on the transient electron transport in wurtzite InN de Vasconcelos TF, Maia FF, Caetano EWS, Freire VN, da Costa JAP, da Silva EF |
325 - 340 |
Excitons of the structure in wurtzite InxGa1-xN and their properties Alexandrov D |
341 - 346 |
Strong exciton energy blue shift in graded wurtzite and zincblende GaN/Al0.2Ga0.8N single quantum wells Caetano EWS, Freire VN, Farias GA |
347 - 354 |
Calculations of electronic and optical properties in p-doped AlGaN/GaN superlattices and quantum wells Rodrigues SCP, Sipahi GM |
VII - VII |
Bulk nitride semiconductors 2002 - Proceedings of the International Workshop on Bulk Nitride Semiconductors, Amazonas, Brazil, 18-23 May 2002 - Preface Babcock SE, Kuech TF, Freitas Jr JA |