1 - 14 |
The chemical composition changes of silicon and phosphorus in the process of native oxide formation of heavily phosphorus doped silicon Ying WB, Mizokawa Y, Kamiura Y, Kawamoto K, Yang WY |
15 - 18 |
Influence of deep level impurities on the conductance technique for the determination of series resistance of a Schottky contact Sanyal S, Chattopadhyay P |
19 - 27 |
Analysis of the topography of a Bragg grating in chalcogenide glass Messaddeq SH, Li MS, Werner U, Messaddeq Y, Lezal D, Aegerter MA |
28 - 34 |
Reduction of surface roughening due to copper contamination prior to ultra-thin gate oxidation Peterson CA, Vermeire B, Sarid D, Parks HG |
35 - 50 |
Study of mechanism of electroless copper coating of fly-ash cenosphere particles Shukla S, Seal S, Akesson J, Oder R, Carter R, Rahman Z |
51 - 60 |
Electrochemical synthesis and characterization of homopolymers of polyfuran and polythiophene and bipolymer films polyfuran/polythiophene and polythiophene/polyfuran Talu M, Kabasakaloglu M, Yildirim F, Sari B |
61 - 67 |
Effect of sulphide layers on the tribological behavior of steels under boundary lubrication conditions Zhang N, Zhuang DM, Liu JJ, Fang XD, Guan MX |
68 - 77 |
XPS profile analysis on Cds thin film modified with Ag by an ion exchange Ristova M, Ristov M |
78 - 93 |
Effects of surface pretreatments on interface structure during formation of ultra-thin yttrium silicate dielectric films on silicon Chambers JJ, Busch BW, Schulte WH, Gustafsson T, Garfunkel E, Wang S, Maher DM, Klein TM, Parsons GN |
94 - 102 |
Reflection high-energy electron diffraction (RHEED) study of MBE growth of ZnSe on GaAs(111)B surfaces Gard FS, Riley JD, Leckey R, Usher BF |
103 - 110 |
Comparative study of Sr and Ba adsorption on Si(100) Hu XM, Yu Z, Curless JA, Droopad R, Eisenbeiser K, Edwards JL, Ooms WJ, Sarid D |
111 - 120 |
Estimating pre-exponential factors for desorption from semiconductors: consequences for a priori process modeling Wang Z, Seebauer EG |
121 - 127 |
X-ray photoelectron spectroscopic studies of surface modified single-walled carbon nanotube material Lee WH, Kim SJ, Lee WJ, Lee JG, Haddon RC, Reucroft PJ |
128 - 138 |
Dielectric relaxation in polycrystalline thin films of In2Te3 Seyam MAM |
139 - 144 |
Contamination of Si surfaces in ultrahigh vacuum and formation of SiC islands Xie F, von Blanckenhagen P, Wu J, Liu JW, Zhang QZ, Chen YC, Wang EG |
145 - 148 |
Property studies of optical waveguide formed by MeV He+ ion implanted into Nd : NaY(WO4)(2) crystal Chen F, Hu H, Wang KM, Cheng ZX, Chen HC, Lu QM, Shen DY |
149 - 159 |
Chemical mapping of hot-embossed and UV-laser- ablated microchannels in poly(methyl methacrylate) using carboxylate specific fluorescent probes Johnson TJ, Waddell EA, Kramer GW, Locascio LE |
160 - 165 |
Thermal stability of a partly Fe-intercalated GaSe film Zerrouki M, Lacharme JP, Ghamnia M, Sebenne CA, Abidri B |
166 - 172 |
Microstructure evolution of electroless Ni-P and Ni-Cu-P deposits on Cu in the presence of additives Lin KL, Chang YL, Huang CC, Li FI, Hsu JC |
173 - 178 |
Self-assembled (SA) bilayer molecular coating on magnetic nanoparticles Fu L, Dravid VP, Johnson DL |