1 - 1 |
Characterization of artificial nanostructures and nanomaterials Fujita D, Kido G, Tosa M, Yoshitake M, Yamauchi Y |
2 - 8 |
Mechanical distinction and manipulation of atoms based on noncontact atomic force microscopy Morita S, Yi I, Sugimoto Y, Oyabu N, Nishi R, Custance O, Abe M |
9 - 13 |
Cross-sectional scanning tunneling microscopy observation of atomic arrangement in triple period-A type ordered AlInAs alloy Ohkouchi S, Furuhashi T, Gomyo A, Makita K, Suzuki T |
14 - 17 |
Conductance of Pd single-atom contacts Minowa T, Fujii A, Takeda M, Kurokawa S, Sakai A |
18 - 22 |
Nanometer-scale mapping of local work function-with a photon-assisted STM technique Nakayama Y, Kondoh H, Ohta T |
23 - 27 |
Non-contact atomic force microscopy study of the Sn/Si(111) mosaic phase Sugimoto Y, Abe M, Yoshimoto K, Custance O, Yi I, Morita S |
28 - 32 |
STM-induced light emission from the surface of H2TBP porphyrin/PFP porphyrin/Cu(100) Guo XL, Dong ZC, Trifonov AS, Miki K, Kimura K, Mashiko S |
33 - 37 |
Growth and characterization of isolated nanoclusters on mixed self-assembled monolayers Sakotsubo Y, Ohgi T, Fujita D, Ootuka Y |
38 - 42 |
Fabrication of Ti-nanowires in sapphire single crystals Nakamura A, Matsunaga K, Yamamoto T, Ikuhara Y |
43 - 48 |
Scanning tunneling microscopy and spectroscopy studies of graphite edges Niimi Y, Matsui T, Kambara H, Tagami K, Tsukada M, Fukuyama H |
49 - 55 |
Metal-induced nanostructures on surfaces of layered chalcogenides Hollensteiner S, Spiecker E, Jager W |
56 - 60 |
Selective growth and characterization of nanostructures with transmission electron microscopes Shimojo M, Bysakh S, Mitsuishi K, Tanaka M, Song M, Furuya K |
61 - 67 |
Electron energy-loss spectroscopic study of the surface of ceria abrasives Gilliss SR, Bentley J, Carter CB |
68 - 74 |
TEM in situ observation of fracture behavior in ceramic materials Ii S, Iwamoto C, Matsunaga K, Yammoto T, Ikuhara Y |
75 - 79 |
HRTEM study on grain boundary atomic structures related to the sliding behavior in alumina bicrystals Matsunaga K, Nishimura H, Hanyu S, Muto H, Yamamoto T, Ikuhara Y |
80 - 86 |
Surface damage induced by focused-ion-beam milling. in a Si/Si p-n junction cross-sectional specimen Wang ZG, Kato T, Hirayama T, Kato N, Sasaki K, Saka H |
87 - 90 |
HRTEM and EELS characterization of atomic and electronic structures in Cu/alpha-Al2O3 interfaces Sasaki T, Mizoguchi T, Matsunaga K, Tanaka S, Yamamoto T, Kohyama M, Ikuhara Y |
91 - 95 |
Characterization of metal, nanoparticles fabricated in ordered array pores of anodic porous alumina by electron-beam-induced selective deposition Xie GQ, Song MH, Mitsuishi K, Furuya K |
96 - 101 |
Structure variation of nanometer-sized Xe particles embedded in Al crystals Song M, Mitsuishi K, Furuya K, Allen CW, Birtcher RC, Donnelly SE |
102 - 106 |
Reduction mechanism of surface oxide films and characterization of formations on pulse electric-current sintered Al-Mg alloy powders Xie GQ, Ohashi O, Song MH, Mitsuishi K, Furuya K |
107 - 112 |
Characterization of nanometer-sized dendritic form structures fabricated on insulator substrates with an electron-beam-induced deposition in a TEM Song M, Mitsuishi K, Takeguchi M, Furuya K |
113 - 121 |
Characterization of nanolayers by sputter depth profiling Hofmann S |
122 - 126 |
Quantitative evaluation of surface damage onSiO(2)/Si specimen caused by electron beam irradiation Tanuma S, Kimura T, Nishida K, Hashimoto S, Inoue M, Ogiwara T, Suzuki M, Miura K |
127 - 130 |
Electron irradiation effect on depth profiling of a SiO2/Si(100) surface by Auger electron spectroscopy Yakabe T, Fujita D, Yoshihara K |
131 - 134 |
Development of imaging energy analyzer using multipole Wien filter Niimi H, Kato M, Tsutsumi T, Kawasaki T, Matsudaira H, Suzuki S, Chun WJ, Kitajima Y, Kudo M, Asakura K |
135 - 140 |
X-ray photoelectron spectroscopic analysis of HfO2/Hf/SiO2/Si structure Tan RQ, Azuma Y, Kojima I |
141 - 145 |
Metastable-atom-stimulated desorption from dodecanethiolate self-assembled monolayers Yamauchi Y, Noro T, Kurahashi A, Suzuki T, Ju X |
146 - 149 |
Characterization of alkanethiol/ZnO structures by X-ray photoelectron spectroscopy Ogata K, Hama T, Hama K, Koike K, Sasa S, Inoue M, Yano M |
150 - 156 |
Chiral metal surfaces from the adsorption of chiral and achiral molecules Humblot V, Raval R |
157 - 163 |
Fabrication of nano-pits and the measurement of their local surface potentials Yoshitake M, Bose C, Yagyu S |
164 - 168 |
Effects of surface cleaning on oxidation of NiAl(110) Song WJ, Yoshitake M |
169 - 173 |
Estimation of adsorbed hydrogen on Ni(111) surface by slow-positron beam Oishi Y, Wada T, Kanazawa I, Fukutani K, Murata Y, Ito Y, Nozawa K, Komori F |
174 - 178 |
Pattern formation induced by Ar+ sputtering on Au(111) Bose AC, Yoshitake M |
179 - 182 |
Effect of evaporation on surface morphology of epitaxial ZnO films during postdeposition annealing Kim IW, Doh SJ, Kim CC, Je JH, Tashiro J, Yoshimoto M |
183 - 188 |
Thermal stability of succinate and acetate on a Cu(110) surface Yagyu S, Yoshitake M, Chikyow T |
189 - 193 |
Tunneling-current-induced reaction of mercaptobutanol on Au(111) Tsukamoto K, Nozoye H |
194 - 198 |
Characterization and control of molecular ordering on adsorbate-induced reconstructed surfaces Pai WW, Hsu CL, Lin KC, Sin LY, Tang TB |
199 - 204 |
X-ray absorption near edge structure of small FePt atomic clusters Alam S, Ahmed J, Masui Y |
205 - 208 |
Preparation of Coumarin 6 and ZnTPP micro dots on PBMA films by laser molecular implantation Pihosh Y, Oishi T, Goto M, Kasahara A, Tosa M |
209 - 212 |
Characterization of binary gold/platinum nanoparticles prepared by sonochemistry technique Nakanishi M, Takatani H, Kobayashi Y, Hori F, Taniguchi R, Iwase A, Oshima R |
213 - 217 |
Optical monitoring of nanoparticle formation during negative 60 keV Cu ion implantation into LiNbO3 Plaksin OA, Takeda Y, Amekura H, Umeda N, Kono K, Okubo N, Kishimoto N |
218 - 222 |
Size-controlled synthesis of nickel nanoparticles Hou Y, Kondoh H, Ohta T, Gao S |
223 - 226 |
Silicon microstructure fabricated by laser micro-patterning method combined with wet etching process Oishi T, Goto A, Pihosh Y, Kasahara A, Tosa A |
227 - 230 |
Particle size distribution analysis for nano-SiO2 powder by ultra-small angle X-ray scattering (USAXS) using synchrotron radiation Hashimoto H, Nagumo T, Inaba T, Furukawa Y, Okui M, Fukushima S |
231 - 235 |
Microstructures and IR spectra of long amorphous SiO2/Si nanowires Noda T, Suzuki H, Araki H, Yang W, Shi Y, Tosa A |
236 - 240 |
In situ synthesis and characterization of pure SiC nanowires on silicon wafer Yang W, Araki H, Thaveethavorn S, Suzuki H, Noda T |
241 - 245 |
Fabrication of a gold pattern with a nanoscale edge by using heptanethiol self-assembled monolayers and a metastable helium beam Ju X, Kurahashi M, Suzuki T, Yamauchi Y |
246 - 249 |
B-C-N hybrid synthesis by high-temperature ion implantation Uddin MN, Shimoyama I, Baba Y, Sekiguchi T, Nath KG, Nagano M |
250 - 255 |
Formation of epitaxial Al2O3/NiAl(110) films: aluminium deposition Lykhach Y, Moroz V, Yoshitake M |
256 - 260 |
First steps in the growth of Cu thin films on the five-fold surface of the icosahedral Al-Cu-Fe quasicrystal Sharma HR, Shimoda M, Fournee V, Ross AR, Lograsso TA, Tsai AP |
261 - 265 |
Effect of ultra-thin buffer on the structure of highly mismatched epitaxial ZnO during sputter growth Kim IW, Kim HS, Kwon YB, Doh SJ, Kim CC, Je JH, Ruterana P, Nouet G |
266 - 269 |
Formation of isotope controlled SiC thin film by plasma chemical vapor deposition and its characterization Suzuki H, Araki H, Yang W, Noda T |