Applied Surface Science

Applied Surface Science, Vol.179, No.1-4 Entire volume, number list

ISSN: 0169-4332 (Print)

In this Issue (51 articles)

1 - 7	Synthesis and characterization of nanoscaled and nanostructured carbon containing materials produced by thermal plasma technology Klotz HD, Mach R, Oleszak F, Maneck HE, Goering H, Brzezinka KW
8 - 12	Evaluation of AFM tips using nanometer-sized structures induced by ion sputtering Frost F, Hirsch D, Schindler A
13 - 19	Structural characterisation of hardening of Ti-Al-V alloys after nitridation by plasma immersion ion implantation Berberich F, Matz W, Kreissig U, Richter E, Schell N, Moller W
20 - 24	Improved sputter depth resolution in Auger thin film analysis using in situ low angle cross-sections Scheithauer U
25 - 29	AES depth profiling multilayers of 3d transition metals Baunack S, Menzel S, Bruckner W, Elefant D
30 - 37	Depth profiling of electrically non-conductive layered samples by RF-GDOES and HFM plasma SNMS Hodoroaba VD, Unger WES, Jenett H, Hoffmann V, Hagenhoff B, Kayser S, Wetzig K
38 - 44	Kossel and pseudo Kossel CCD pattern in comparison with electron backscattering diffraction diagrams Dabritz S, Langer E, Hauffe W
45 - 48	Lattice constant determination from Kossel patterns observed by CCD camera Langer E, Dabritz S, Schurig C, Hauffe W
49 - 54	Carbon-induced reconstructions on Si(111) investigated by RHEED and molecular dynamics Koitzsch C, Conrad D, Scheerschmidt K, Scharmann F, Maslarski P, Pezoldt J
55 - 60	Deposition and characterization of Ge-Sb-Te layers for applications in optical data storage Kyrsta S, Cremer R, Neuschutz D, Laurenzis M, Bolivar PH, Kurz H
61 - 67	Analysis of nanoscale multilayers by EDXS and EELS in the STEM Thomas J, Fliervoet T, Wetzig K
68 - 72	Optical studies on thin copper films on Si(111) Masten A, Wissmann P
73 - 78	Composition and morphology studies of ultrathin CaF2 epitaxial films on silicon Bohne W, Rohrich J, Schmidt M, Schopke A, Selle B, Wurz R
79 - 87	Chemical structure and morphology of ultrathin combustion CVD layers on zinc coated steel Schinkinger B, Petzold R, Tiller HJ, Grundmeier G
88 - 94	Characterization of sputter deposited cBN-films by low energy electron loss spectroscopy LEELS Oechsner H, Westermeyr S, Ye J
95 - 101	Evolution of surface topography of fused silica by ion beam sputtering Flamm D, Frost F, Hirsch D
XI - XII	11th Conference on Applied Surface Analysis - AOFA 11 - Leipzig, 24-28 September, 2000 Boehlig H, Streubel P, Szargan R
102 - 108	Angle-resolved XPS measurements on copper phthalocyanine thin films Adolphi B, Berger O, Fischer WJ
109 - 112	Standard operating procedure (SOP) for the quantitative determination of organic silicon compounds at the surface of elastomeric sealants Gross T, Treu D, Unger W
113 - 117	Raman spectroscopy: a powerful tool for characterisation of Ag/3,4,9,10-perylene-tetracarboxylic-dianhydride/GaAs heterostructures Salvan G, Tenne DA, Kampen TU, Scholz R, Jungnickel G, Frauenheim T, Zahn DRT
118 - 121	Application of temperature-programmed oxidation, multinuclear MAS NMR and DRIFT spectroscopy to the surface characterization of modified silica nanoparticles Bauer F, Freyer A, Ernst H, Glasel HJ, Mehnert R
122 - 128	Investigation of the structure and properties of a-C : H coatings with metal and silicon containing interlayers Nothe M, Breuer U, Koch F, Penkalla HJ, Rehbach WP, Bolt H
129 - 132	Auger spectroscopy study of MgLi melt affected carbon/pyrocarbon fibres Kudela S, John A, Baunack S, Kudela S, Wetzig K
133 - 137	SIMS investigation of chemical solution-deposited SrTiO3/LaNiO3 Pollak C, Reichmann K, Hutter H
138 - 142	Reaction paths in the system Al2O3-hBN-Y Reichert K, Oreshina O, Cremer R, Neuschutz D
143 - 149	Analytical TEM for the investigation of thin functional layers Wetzig K, Thomas J, Bauer HD
150 - 155	Influence of BN fiber coatings on the interfacial structure of sapphire fiber reinforced NiAl composites Reichert K, Wen K, Cremer R, Hu W, Neuschutz D, Gottstein G
156 - 160	Macroscopic and microstructural properties of CSixNy thin films deposited by RF nitrogen-plasma-assisted pulsed laser deposition Tharigen T, Lorenz A
161 - 166	Visualization of 3D-SIMS measurements Hutter H, Nowikow K, Gammer K
167 - 180	Applied surface analysis in magnetic storage technology Windeln J, Bram C, Eckes HL, Hammel D, Huth J, Marien J, Rohl H, Schug C, Wahl M, Wienss A
181 - 190	Characterization of ITO- and TiOxNy films by spectroscopic ellipsometry, spectraphotometry and XPS Bartella J, Schroeder J, Witting K
191 - 195	Structure and luminescence of GaN layers Barfels T, Fitting HJ, Jansons J, Tale I, Veispals A, von Czarnowski A, Wulff H
196 - 202	In situ characterization of the nitridation of AIII-BV semiconductor surfaces by means of X-ray photoelectron spectroscopy Hecht JD, Frost F, Chasse T, Hirsch D, Neumann H, Schindler A, Bigl F
203 - 208	Conductivity type conversion of p-type CuInSe2 due to hydrogenation Otte K, Lippold G, Hirsch D, Gebhardt RK, Chasse T
209 - 212	Time-resolved photoluminescence characterisation of thin PTCDA films on Si(100) Kobitski AY, Salvan G, Wagner HP, Zahn DRT
213 - 221	Auger depth profile analysis and EFTEM analysis of annealed Ti/Al-contacts on Si-doped GaN Pidun M, Karduck P, Mayer J, Heime K, Schineller B, Walther T
222 - 229	Surface states and reactivity of pyrite and marcasite Uhlig I, Szargan R, Nesbitt HW, Laajalehto K
230 - 233	Raman spectroscopy on Psaronius sp.: a contribution to the understanding of the permineralization process Dietrich D, Witke K, Rossler R, Marx G
234 - 239	In situ FT-IR study on the reaction path of skeletal isomerization of n-butene over different zeolites Ivanov P, Papp H
240 - 244	Characterization of the 3D-distribution of the components in Al-alloyed high speed steels with SIMS Gammer K, Musser S, Hutter H
245 - 250	AES analysis of failures in Cu based electromigration test samples Baunack S, Kotter TG, Wendrock H, Wetzig K
251 - 256	Activation of nickel-anodes for alkaline fuel cells Schulze M, Gulzow E, Steinhilber G
257 - 262	Black spots on carbon steel after contact to lubricating oil with extreme pressure additives: an XPS study Mayer T
263 - 268	SIMS depth profile analysis of wear resistant coatings on cutting tools and technical components Willich P, Steinberg C
269 - 274	SIMS investigation of MoS2 based sputtercoatings Heinisch C, Piplits K, Kubel F, Schintlmeister A, Pfluger E, Hutter H
275 - 280	Characterisation of Cr intermediate layers in Cu-C-system with SIMS method Mayerhofer KE, Neubauer E, Eisenmenger-Sittner C, Hutter H
281 - 291	Activation of galvanized steel surfaces before zinc phosphating - XPS and GDOES investigations Wolpers M, Angeli J
292 - 300	The influence of surface effects on the hydrogen absorption investigated on the V-H model system Muller KH, Paulus H, Kiss G
301 - 306	XPS investigations of surface segregation of doping elements in SnO2 Szczuko D, Werner J, Oswald S, Behr G, Wetzig K
307 - 315	Binding state information from XPS depth profiling: capabilities and limits Oswald S, Reiche R
316 - 323	XPS and factor analysis for investigation of sputter-cleaned surfaces of metal (Re, Ir, Cr)-silicon thin films Reiche R, Oswald S, Wetzig K