1 - 4 |
Influence of lattice misfit on diffusion coefficients in thin films polycrystalline Pd-Ag and Pd-Au systems Vasilyeva AD, Bekrenev AN |
5 - 10 |
Photoluminescence excitation spectroscopy obtained for spark-processed Si Chang SS |
11 - 19 |
The role of ambient ageing on porous silicon photoluminescence: evidence of phonon contribution Elhouichet H, Oueslati M |
20 - 25 |
Anomalous field emission from Al2O3 coated Si tips Zhirnov VV, Alimova AN, Hren JJ |
26 - 43 |
Surface chemistry of water atomised aluminium alloy powders Krajnikova AV, Gastel M, Ortner HM, Likutin VV |
44 - 51 |
Interaction of Sc and O on W Shih A, Yater JE, Hor C, Abrams R |
52 - 60 |
Electron transmission studies of diamond films Yater JE, Shih A, Butler JE, Pehrsson PE |
61 - 66 |
Planar waveguides in BiB3O6 and Nd : YVO4 crystals by ion implantation Chen F, Wang XL, Wang KM, Lu QM, Teng B, Shen DY |
67 - 73 |
Corrosion study at Cu-Al interface in microelectronics packaging Tan CW, Daud AR, Yarmo MA |
74 - 84 |
Evaluation of the wettability of metal surfaces by micro-pure water by means of atomic force microscopy Wang RG, Cong L, Kido M |
85 - 93 |
Optical properties and structural changes of thermally co-evaporated CuInSe films Moharram AH, Al-Mekkawy IM, Salem A |
94 - 105 |
A comparison of fractal dimensions determined from atomic force microscopy and impedance spectroscopy of anodic oxides on Zr-2.5Nb McRae GA, Maguire MA, Jeffrey CA, Guzonas DA, Brown CA |
106 - 117 |
Characterising the quality of chemical tin coatings on copper by electrochemical current noise method Huttunen-Saarivirta E, Tiainen T |
118 - 122 |
Scaling behavior of (001) and (111) Cu surfaces Lukaszew RA, Clarke R |
123 - 127 |
Multifractal spectra of atomic force microscope images of amorphous electroless Ni-Cu-P alloy Yu HS, Sun X, Luo SF, Wang YR, Wu ZQ |
128 - 137 |
An X-ray photoelectron spectroscopic study of electrochemically deposited Fe-P thin films on copper substrate Aravinda CL, Bera P, Jayaram V, Mayanna SM |
138 - 147 |
Structural, optical and electrical properties of In2Se3 thin films formed by annealing chemically deposited Se and vacuum evaporated In stack layers Bindu K, Kartha CS, Vijayakumar KP, Abe T, Kashiwaba Y |
148 - 152 |
AFM surface imaging of thermally oxidized hydrogenated crystalline silicon Szekeres A, Lytvyn P, Alexandrova S |
153 - 165 |
Surface analysis of thermionic dispenser cathodes Cortenraad R, van der Gon AWD, Brongersma HH, Gartner G, Manenschijn A |
166 - 170 |
Thermodynamic characterization of a regenerated activated carbon surface Gonzalez-Martin ML, Gonzalez-Garcia CM, Gonzalez JF, Ramiro A, Sabio E, Bruque JM, Encinar JM |
171 - 175 |
High-vacuum electron-beam co-evaporation of Si nanocrystals embedded in Al2O3 matrix Wan Q, Zhang NL, Xie XY, Wang TH, Lin CL |
176 - 180 |
Valence reduction process from sol-gel V2O5 to VO2 thin films Yuan NY, Li JH, Lin CL |
181 - 187 |
Annealing and doping effects on structure and optical properties of sol-gel derived ZrO2 thin films Liu WC, Wu D, Li AD, Ling HQ, Tang YF, Ming NB |
188 - 195 |
The effects of the time-dependent and exposure time to air on Au/n-GaAs schottky barrier diodes Ozdemir AF, Kokce A, Turut A |
196 - 204 |
Growth and characterisation of InAs/InGaAs quantum dots like structure on GaAs/Si substrate by AP-MOCVD Thilakan P, Kazi ZI, Egawa T |
205 - 210 |
Organizing nanoclusters on functionalized surfaces Bardotti L, Prevel B, Jensen P, Treilleux M, Melinon P, Perez A, Gierak J, Faini G, Mailly D |
211 - 217 |
A photoemission study: the influence of heating process and Au buffer layers on the Fe/GaAs(100) structure Zhang T, Spangenberg M, Takahashi N, Shen TH, Greig D, Matthew JAD, Seddon EA |
218 - 222 |
Transport properties in iron-passivated porous silicon Zhu DL, Chen QW, Zhang YH |
223 - 239 |
Optimization of the chemical vapor deposition process for carbon nanotubes fabrication Grujicic M, Cao G, Gersten B |
240 - 246 |
The combining analysis of height and phase images in tapping-mode atomic force microscopy: a new route for the characterization of thiol-coated gold nanoparticle film on solid substrate Jiang P, Xie SS, Pang SJ, Gao HJ |
247 - 253 |
Molecular interaction of ozone with silicon nanocrystallites: a new method to excite visible luminescence Kuznetsov SN, Saren AA, Pikulev VB, Gardin YE, Gurtov VA |
254 - 260 |
Investigation of surface composition of electrodeposited black chrome coatings by X-ray photoelectron spectroscopy Anandan C, Grips VKW, Rajam KS, Jayaram V, Bera P |
261 - 265 |
Atomic and electronic structures of barium oxide on Si(001) studied by metastable impact electron spectroscopy (MIES) and coaxial impact collision ion scattering spectroscopy (CAICISS) Ikeuchi T, Souda R, Yamamoto S |
266 - 272 |
Electron beam induced oxidation of Al-Mg alloy surfaces Palasantzas G, van Agterveld DTL, De Hosson JTM |
273 - 279 |
Influence of substrate dc bias on chemical bonding, adhesion and roughness of carbon nitride films Li JJ, Zheng WT, Jin ZS, Lu XY, Gu GR, Mei XX, Dong C |
280 - 285 |
Properties of Ag doped ZnTe thin films by an ion exchange process Aqili AKS, Maqsood A, Ali Z |
286 - 299 |
Structural and energetic heterogeneities of hybrid carbon-mineral adsorbents Gun'ko VM, Leboda R, Turov VV, Charmas B, Skubiszewska-Zieba J |
300 - 312 |
The characterisation of non-evaporable getters by Auger electron spectroscopy: analytical potential and artefacts Prodromides AE, Scheuerlein C, Taborelli M |
313 - 318 |
Thickness dependence of properties of SnO2 : Sb films deposited on flexible substrates Ma HL, Hao XT, Ma J, Yang YG, Huang J, Zhang DH, Xu XG |
319 - 327 |
Light assisted formation of porous silicon investigated by X-ray diffraction and reflectivity Chamard V, Setzu S, Romestain R |
328 - 333 |
Ultrafast intense laser "explosion" of hardwood Theberge F, Petit S, Iwasaki A, Kasaai MR, Chin SL |
334 - 337 |
Feed gas dependence of the surface nanophase on HFCVD grown diamond films studied by surface enhanced Raman spectroscopy Roy M, George VC, Dua AK, Raj P, Schulze S, Tenne DA, Salvan G, Zahn DRT |
338 - 343 |
Relief of the internal stress in ternary boron carbonitride thin films He DY, Cheng WJ, Qin J, Yue JS, Xie EQ, Chen GH |
344 - 351 |
Surface diffusion and electron stimulated desorption of chlorine from InP(110) and GaAs(110) Jacka M, Kale A |
352 - 361 |
Attempt to apply the fractal geometry for characterisation of dealuminated ZSM-5 zeolite Rozwadowski M, Kornatowski J, Wloch J, Erdmann K, Golembiewski R |
362 - 367 |
Characterisation of polysilicon gate microstructures for 0.5 mu m CMOS devices using transmission electron microscopy and atomic force microscopy images Ahmad I, Omar A, Hussain A, Mikdad A |
368 - 374 |
Analysis of the pore structure of the MCM-41 materials Wloch J, Rozwadowski M, Lezanska M, Erdmann K |