301 - 315 |
Study of CeO2 XPS spectra by factor analysis: reduction of CeO2 Holgado JP, Alvarez R, Munuera G |
316 - 322 |
Correlation between surface forces and surface reactivity in the setting of plaster by atomic force microscopy Finot E, Lesniewska E, Goudonnet JP, Mutin JC |
323 - 327 |
Measurement of the velocity distribution of ground state Mn atoms using resonance ionization Hasegawa S, Yamasaki A, Suzuki A |
328 - 332 |
Observation of an enhanced N 1s shake-up satellite on nitrided Si(100) and correlation with N bonding geometry Bater C, Sanders M, Craig JH, Pannell KH, Wang PW |
333 - 339 |
TPD characterization of surface adsorption sites of model Ziegler-Natta polymerization catalysts Kim SH, Somorjai GA |
340 - 346 |
Effect of indium tin oxide substrate roughness on the morphology, structural and optical properties of CdS thin films Castro-Rodriguez R, Oliva AI, Sosa V, Caballero-Briones F, Pena JL |
347 - 354 |
Synchrotron radiation studies on the growth of TSe2 (T = Ta, Ti) thin films on Ta substrates: intercalation and de-intercalation of Na Papageorgopoulos DC, Saltas V, Papageorgopoulos CA, Tonti D, Pettenkofer C, Jaergermann W |
355 - 364 |
The role of oxide structure on copper wire to the rubber adhesion Su YY, Shemenski RM |
365 - 374 |
Effects of copper content and heat treatment on the electrical properties of Ge15Te85-xCux thin films Dongol M, Abou Zied M, Gamal GA, El-Denglawey A |
375 - 384 |
Stress-modified electrochemical reactivity of metallic surfaces: atomic force microscopy imaging studies of nickel and alloyed aluminum Hahm J, Sibener SJ |
385 - 395 |
Titanium isopropoxide as a precursor for atomic layer deposition: characterization of titanium dioxide growth process Aarik J, Aidla A, Uustare T, Ritala M, Leskela M |
396 - 405 |
SILAR deposition of CdxZn1-xS thin films Laukaitis G, Lindroos S, Tamulevicius S, Leskela M, Rackaitis M |
406 - 416 |
SO2 adsorption and thermal stability and reducibility of sulfates formed on the magnesium-aluminate spinel sulfur-transfer catalyst Wang JA, Li CL |
417 - 425 |
Study of zirconocene and MAO interaction with SiO2 surfaces Juan A, Damiani D, Pistonesi C |
426 - 433 |
Wet oxidation of AlAsSb alloys catalyzed by methanol Salesse A, Hanfoug R, Rouillard Y, Genty F, Almuneau G, Chusseau L, Baranov A, Alibert C, Kieffer J, Lebeau E, Luck JM |
434 - 442 |
Oxidation of sintered silicon carbide under microwave-induced CO2 plasma at high temperature: active-passive transition Balat M, Berjoan R |
443 - 447 |
Electroplex emission from a layer of a mixture of a europium complex and tris(8-quinolinolato) aluminum Cao H, Gao XC, Huang CH |
448 - 451 |
Growth and structural studies of Fe3O4/MgO superlattices Chang CL, Chern G, Chean YR, Chen CL |
452 - 458 |
Surface and interface microstructural properties of Ru thin films grown on InSb (111) substrates at room temperature Kim TW, Lee DU, Lee JH, Yoon YS, Lee JY, Park HL |
459 - 464 |
Modification of tin dioxide thin films by ion implantation Tao Z, Junda H, Hong L |
465 - 480 |
Static SIMS: towards unfragmented mass spectra - the G-SIMS procedure Gilmore IS, Seah MP |
481 - 496 |
Selective adsorption of fluorocarbons and its effects on the adhesion of plasma polymer protective coatings Moffitt CE, Reddy CM, Yu QS, Wieliczka DM, Yasuda HK |
497 - 507 |
Interaction of potassium with Fe3O4(111) at elevated temperatures Shaikhutdinov SK, Weiss W, Schlogl R |
508 - 514 |
Observations of local electron states on the edges of the circular pits on hydrogen-etched graphite surface by scanning tunneling spectroscopy Klusek Z, Waqar Z, Denisov EA, Kompaniets TN, Makarenko IV, Titkov AN, Bhatti AS |