171 - 176 |
Structural stability of ultrathin silicon oxynitride film improved by incorporated nitrogen Suzuki M, Saito Y |
177 - 183 |
Phase transitions in excimer laser irradiated zirconia thin films Starbova K, Mankov V, Starbov N, Popov D, Nihtianova D, Kolev K, Laude LD |
184 - 192 |
Composition of the surface layer of GaAs after laser annealing of the Al-GaAs system Demireva D, Ziffudin L |
193 - 202 |
XPS investigation of Upilex-S polyimide ablated by 355 nm Nd : YAG laser irradiation Yung KC, Zeng DW, Yue TM |
203 - 207 |
Stability of an ultra-thin Fe film on a Cu(100) surface studied by positron-annihilation induced Auger electron spectroscopy (PAES) Kim JH, Lee KH, Yang G, Koymen AR, Weiss AH |
208 - 220 |
Studies of pore structure, temperature-programmed reduction performance, and micro-structure of CuO/CeO2 catalysts Jiang XY, Lu GL, Zhou RX, Mao JX, Chen Y, Zheng XM |
221 - 232 |
Electrochemical intercalation of perchlorate ions in HOPG: an SFM/LFM and XPS study Schnyder B, Alliata D, Kotz R, Siegenthaler H |
233 - 241 |
TiC and TaC deposition by pulsed laser ablation: a comparative approach Teghil R, D'Alessio L, Zaccagnino M, Ferro D, Marotta V, De Maria G |
242 - 251 |
Evaporated copper on surface modified polyaniline films Ma ZH, Tan KL, Chua WS, Kang ET, Neoh KG |
252 - 261 |
Analysis of the laser-induced reduction mechanisms of medieval pigments Pouli P, Emmony DC, Madden CE, Sutherland I |
262 - 269 |
The growth of sodium rough films on mica(0001) as determined by helium atom scattering Gerlach R, Balzer F, Rubahn HG |
270 - 281 |
Surface morphology and electronic structure of Ge/Si(111) 7 x 7 system Lobo A, Gokhale S, Kulkarni SK |
282 - 289 |
Phase transformation of diamond films during electron field emission Sun Z, Chen JS, Li YJ, Tay BK, Lau SP, Chen GY |
290 - 295 |
Low grain size TiN thin films obtained by low energy ion beam assisted deposition Lopez JM, Gordillo-Vazquez FJ, Bohme O, Albella JM |
296 - 306 |
Specific defect sites creation by doping MgO with lithium and titanium Balint I, Aika K |
307 - 312 |
Investigation of the structural and electrical properties of Sr1-xBi2.2Ta2O9 thin films with deficient Sr contents Li AD, Ling HQ, Wu D, Yu T, Wang M, Yin XB, Liu ZG, Ming NB |
313 - 317 |
Preparation of silicon carbide nitride thin films by sputtering of silicon nitride target Peng XF, Song LX, Meng J, Zhang YZ, Hu XF |
318 - 326 |
Interfacial layer formation in Gd2O3 films deposited directly on Si(001) Gupta JA, Landheer D, Sproule GI, McCaffrey JP, Graham MJ, Yang KC, Lu ZH, Lennard WN |
327 - 338 |
Surface oxidation of Al-Cr-Fe alloys characterized by X-ray photoelectron spectroscopy Demange V, Anderegg JW, Ghanbaja J, Machizaud F, Sordelet DJ, Besser M, Thiel PA, Dubois JM |
339 - 351 |
Surface modification of silicon and silica in biological environment: an X-ray photoelectron spectroscopy study Seal S, Barr TL, Krezoski S, Petering D |
352 - 361 |
Effects of substrate temperature on the film characteristics and gas-sensing properties of copper phthalocyanine films Lee YL, Tsai WC, Maa JR |
362 - 367 |
Study on the relation between surface roughness and the light emission spectrum of an Au-Al2O3-Al tunnel junction Wang MX, Zhang YW, Cheng HW, Sun CX |
368 - 379 |
The electronic structure and location of H pairs in bcc Fe edge dislocation Pronsato ME, Brizuela G, Juan A |