Applied Surface Science

Applied Surface Science, Vol.187, No.3-4 Entire volume, number list

ISSN: 0169-4332 (Print)

In this Issue (22 articles)

173 - 178	Analysis of electric field-induced fabrication on Au and Ti with an STM in air Hu XD, Yu J, Chen JP, Hu XT
179 - 186	Photodissolution of cleaved CdTe(110): atomic force microscopic and Auger electron spectroscopic study Rhee CK, Ryu HR, Kim YJ
187 - 191	Investigation of interface in silicon-on-insulator by fractal analysis Liu XH, Chen J, Chen M, Wang X
192 - 198	Effect of implantation voltage on phase composition and surface roughness of alpha-Fe surface layer implanted by nitrogen ion Li WL, Sun Y, Fei WD
199 - 206	The role of passivation in titanium oxidation: thin film and temperature effects Vergara LI, Passeggi MCG, Ferron J
207 - 217	The electronic structure and bonding of H pairs at Sigma=5 BCCFe grain boundary Gesari SB, Pronsato ME, Juan A
218 - 234	Surface topography of gibbsite crystals grown from aqueous sodium aluminate solutions Sweegers C, Plomp M, de Coninck HC, Meekes H, van Enckevort WJP, Hiralal IDK, Rijkeboer A
235 - 238	Study of the luminescence characteristics of cadmium sulfide quantum dots in a sulfonic group polyaniline (SPAn) film Ma XY, Lu GX, Yang BJ
239 - 247	Laser ablation of polymer-based silver nanocomposites Zeng R, Rong MZ, Zhang MQ, Liang HC, Zeng HM
248 - 252	Deep levels in silicon carbide Schottky diodes Castaldini A, Cavallini A, Polenta L, Nava F, Canali C, Lanzieri C
253 - 260	Interaction of polymeric Si : C : H films with copper substrates and with deposited Cu adatoms Tong J, Martini D, Magtoto N, Pritchett M, Kelber J
261 - 265	Hydrogen-bond studies of thin film water using near-infrared spectroscopy in the 970 nm spectral region Suzuki T
266 - 274	A study of thin film Au-Al alloy oxidation in ambient air by X-ray photoelectron spectroscopy (XPS), X-ray absorption near edge structure (XANES), and secondary ion mass spectrometry (SIMS) Piao H, Fuller MS, Miller D, McIntyre NS
275 - 278	Measurement of the reaction energy of binary components in tri-phase thin films using the hollow cathode discharge technique Yang YS, Lee SC, Tsao CYA
279 - 290	Corrosion and corrosion inhibition of Al and some alloys in sulphate solutions containing halide ions investigated by an impedance technique Rehim SSA, Hassan HH, Amin MA
291 - 296	Induced stresses and structural changes in silicon wafers as a result of laser micro-machining Amer MS, Dosser L, LeClair S, Maguire JF
297 - 304	Pulsed laser deposition of TiO2 for MOS gate dielectric Paily R, DasGupta A, DasGupta N, Bhattacharya P, Misra P, Ganguli T, Kukreja LM, Balamurugan AK, Rajagopalan S, Tyagi AK
305 - 312	Structural and CO sensing characteristics of Ti-added SnO2 thin films Chen JS, Li HL, Huang JL
313 - 318	Adhesion of neural cells on silicon wafer with nano-topographic surface Fan YW, Cui FZ, Chen LN, Zhai Y, Xu QY, Lee IS
319 - 325	Structure and morphology of concave-shaped surfaces on 6H-Si(0001) after H-2 etching Dulot F, Mansour L, Leycuras A, Wulfhekel W, Sander D, d'Avitaya FA, Hanbucken M
326 - 338	Surface investigation of plasma HMDSO membranes post-treated by CF4/Ar plasma Finot E, Roualdes S, Kirchner M, Rouessac V, Berjoan R, Durand J, Goudonnet JP, Cot L
339 - 346	Effect of surface roughness on the optical properties of multilayer polymer films Larena A, Millan F, Perez G, Pinto G