Applied Surface Science

Applied Surface Science, Vol.188, No.3-4 Entire volume, number list

ISSN: 0169-4332 (Print)

In this Issue (53 articles)

231 - 231	Preface Tsukada M
232 - 237	Atomic corrugation in nc-AFM of alkali halides Bennewitz R, Pfeiffer O, Schar S, Barwich V, Meyer E, Kantorovich LN
238 - 244	Atomic resolution imaging and force versus distance measurements on KBr (001) using low temperature scanning force microscopy Hoffmann R, Lantz MA, Hug HJ, van Schendel PJA, Kappenberger P, Martin S, Baratoff A, Guntherodt HJ
245 - 251	Dynamic force microscopy with atomic resolution at low temperatures Schwarz A, Schwarz UD, Langkat S, Holscher H, Allers W, Wiesendanger R
252 - 256	Imaging of surface oxygen atoms and their defect structures on CeO2(111) by noncontact atomic force microscopy Fukui K, Namai Y, Iwasawa Y
257 - 264	Molecule-dependent topography determined by noncontact atomic force microscopy: carboxylates on TiO2 (110) Onishi H, Sasahara A, Uetsuka H, Ishibashi TA
265 - 271	A needle-like organic molecule imaged by noncontact atomic force microscopy Sasahara A, Uetsuka H, Ishibashi TA, Onishi H
272 - 278	Atomic resolution imaging of Si(100) 1 x 1 : 2H dihydride surface with noncontact atomic force microscopy (NC-AFM) Araragi S, Yoshimoto A, Nakata N, Sugawara Y, Morita S
279 - 284	Observation of Si(100) surface with noncontact atomic force microscope at 5 K Uozumi T, Tomiyoshi Y, Suehira N, Sugawara Y, Morita S
285 - 291	Atom manipulation and image artifact on Si(111)7 x 7 surface using a low temperature noncontact atomic force microscope Sugawara Y, Sano Y, Suehira N, Morita S
292 - 300	Germanium islands grown on a Si(111)7 x 7 surface observed by noncontact atomic force microscopy with simultaneous imaging on damping Arai T, Tomitori M
301 - 305	Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(100)(2 x 1) with small oscillation amplitudes Ozer HO, Atabak M, Ellialtioglu RM, Oral A
306 - 318	Quantitative modelling in scanning force microscopy on insulators Foster AS, Shluger AL, Nieminen RM
319 - 324	STM-AFM image formation on TiO2(110) 1 X 1 and 1 x 2 surfaces Ke SH, Uda T, Terakura K
325 - 330	Tip-surface interactions in atomic force microscopy: reactive vs. metallic surfaces Stich I, Dieska P, Perez R
331 - 334	Theoretical study on atomic and electronic structures of Ag-adsorbed SiNC-AFM tips Motoda Y, Sasaki N, Watanabe S
335 - 340	Effect of temperature on noncontact atomic force microscopy images Kang M, Kaburagi M
341 - 348	Stability analysis of an oscillating tip-cantilever system in NC-AFM Couturier G, Nony L, Boisgard R, Aime JP
349 - 354	Simulation of fluctuation and dissipation in dynamic force microscopy Nanjo H, Nony L, Yoneya M, Sanada N, Iijima T, Aime JP
355 - 362	Dynamic AFM using the FM technique with constant excitation amplitude Gotsmann B, Fuchs H
363 - 371	Analysis of mechanisms inducing damping in dynamic force microscopy: surface viscoelastic behavior and stochastic resonance process Boisgard R, Aime JP, Couturier G
372 - 376	Molecular dynamics study of mechanical extension of polyalanine by AFM cantilever Masugata K, Ikai A, Okazaki S
377 - 380	Monte Carlo simulation of pyridine base adsorption on heulandite (010) Yokoi Y, Yelken G, Oumi Y, Kobayashi Y, Kubo M, Miyamoto A, Komiyama M
381 - 385	The elimination of the'artifact' in the electrostatic force measurement using a novel noncontact atomic force micro scope/electrostatic force microscope Okamoto K, Sugawara Y, Morita S
386 - 390	Potential profile around step edges of Si surface measured by nc-AFM Hasegawa Y, Eguchi T
391 - 398	Local structures and electrical properties of organic molecular films investigated by non-contact atomic force microscopy Yamada H, Fukuma T, Umeda K, Kobayashi K, Matsushige K
399 - 402	Surface potential analysis on doping superlattice by electrostatic force microscope Katano Y, Doi T, Ohno H, Yoh K
403 - 410	Surface potential microscopy for organized molecular systems Sugimura H, Hayashi K, Saito N, Nakagiri N, Takai O
411 - 415	Investigation on hydrogen annealing effect for various ferroelectric films by electrostatic force microscope Shin S, Pi UH, Kim DJ, Kang BS, Noh TW, Khim ZG
416 - 420	Magnetic imaging and dissipation force microscopy of vortices on superconducting Nb films Roseman M, Grutter P
421 - 424	Observation of ferroelectric nano-domains using scanning nonlinear dielectric imaging and piezoresponse imaging Matsuura K, Cho Y
425 - 429	Dynamic-mode AFM using the piezoelectric cantilever: investigations of local optical and electrical properties Satoh N, Kobayashi K, Watanabe S, Fujii T, Horiuchi T, Yamada H, Matsushige K
430 - 434	Dynamic force microscopy using FM detection in various environments Kobayashi K, Yamada H, Matsushige K
435 - 439	High-temperature needle-sensor investigations on thin Au-55 layers Radu G, Memmert U, Hartmann U
440 - 444	Noncontact atomic force microscopy in liquid environment with quartz tuning fork and carbon nanotube probe Kageshima M, Jensenius H, Dienwiebel M, Nakayama Y, Tokumoto H, Jarvis SP, Oosterkamp TH
445 - 449	Evaluation of a force sensor based on a quartz tuning fork for operation at low temperatures and ultrahigh vacuum Hembacher S, Giessibl FJ, Mannhart J
450 - 455	Non-contact atomic force microscope with a PZT cantilever used for deflection sensing, direct oscillation and feedback actuation Miyahara Y, Deschler M, Fujii T, Watanabe S, Bleuler H
456 - 459	A study of friction by carbon nanotube tip Ishikawa M, Yoshimura M, Ueda K
460 - 466	Force interactions and adhesion of gold contacts using a combined atomic force microscope and transmission electron microscope Erts D, Lohmus A, Lohmus R, Olin H, Pokropivny AV, Ryen L, Svensson K
467 - 473	New AFM imaging for observing a high aspect structure Hosaka S, Morimoto T, Kuroda H, Minomoto Y, Kembo Y, Koyabu H
474 - 480	DNA molecules sticking on a vicinal Si(111) surface observed by noncontact atomic force microscopy Arai T, Tomitori M, Saito M, Tamiya E
481 - 485	Magnesium concentration effects on cruciform extrusion in supercoiled DNA examined by atomic force microscopy Chasovskikh S, Dritschilo A
486 - 488	Exploratory study of RNA polymerase II using dynamic atomic force microscopy Rhodin T, Umemura K, Gad M, Jarvis S, Ishikawa M, Fu JH
489 - 492	Non-destructive force measurement in liquid using atomic force microscope Sekiguchi H, Arakawa H, Okajima T, Ikai A
493 - 498	Quantification of cell adhesion interactions by AFM: effects of LPS/PMA on the adhesion Of C-6 glioma cell to collagen type I Kim H, Arakawa H, Osada T, Ikai A
499 - 505	Tapping and contact mode imaging of native chromosomes and extraction of genomic DNA using AFM tips Sun YC, Arakawa H, Osada T, Ikai A
506 - 512	Intra- and intermolecular mechanics of proteins and polypeptides studied by AFM: with applications Ikai A, Idiris A, Sekiguchi H, Arakawa H, Nishida S
513 - 518	Force microscopy contrasts due to adhesion force difference between organosilane self-assembled monolayers Hayashi K, Sugimura H, Takai O
519 - 523	Comparative study on surface morphology by photo- and thermal-polymerization of a diacetylene with a tapping-mode AFM Yaji T, Izumi K, Isoda S
524 - 533	Dynamic force microscopy analysis of block copolymers: beyond imaging the morphology Leclere P, Dubourg F, Kopp-Marsaudon S, Bredas JL, Lazzaroni R, Aime JP
534 - 538	Two-dimensional phase separation of block copolymer and homopolymer blend studied by scanning near-field optical microscopy Aoki H, Kunai Y, Ito S, Yamada H, Matsushige K
539 - 544	The effect of deposition process parameters and post-deposition treatments on the poly- and amorphous-silicon morphology Edrei R, Shauly EN, Roizin Y, Hoffman A
545 - 549	Physical properties of spinel nano-structure epitaxially grown on MgO(100) Kubo T, Nozoye H