131 - 138 |
Surface morphologies of MOCVD-grown GaN films on sapphire studied by scanning tunneling microscopy Zhou J, Reddic JE, Sinha M, Ricker WS, Karlinsey J, Yang JW, Khan MA, Chen DA |
139 - 149 |
Factors inducing degradation of properties after long term oxidation of Si3N4-TiN electroconductive composites Bracisiewicz M, Medri V, Bellosi A |
150 - 159 |
Oxidation state of chromium associated with cell surfaces of Shewanella oneidensis during chromate reduction Neal AL, Lowe K, Daulton TL, Jones-Meehan J, Little BJ |
160 - 182 |
Atomistic simulations of surface coverage effects in anisotropic wet chemical etching of crystalline silicon Gosalvez MA, Foster AS, Nieminen RM |
183 - 198 |
Surface compositional changes in GaAs subjected to argon plasma treatment Surdu-Bob CC, Sullivan JL, Saied SO, Layberry R, Aflori M |
199 - 205 |
Spectroscopic investigations of hydrogen termination, oxide coverage, roughness, and surface state density of silicon during native oxidation in air Henrion W, Rebien M, Angermann H, Roseler A |
206 - 210 |
Drift mobility measurements in a-C : H films by time-resolved electroluminescence Foulani A |
211 - 217 |
Fabrication of fine mullite powders by alpha-Al(OH)(3)-SiO2 core-shell structure precursors Tang YF, Lu YN, Li AD, Li XY, Shi SZ, Ling ZD |
218 - 222 |
The surface potential of the Si nanostructure on a Si (111) 7 x 7 surface generated by contact of a cantilever tip Shiota T, Nakayama K |
223 - 231 |
Deposition of copper sulfide on modified low-density polyethylene surface: morphology and electrical characterization Kunita MH, Girotto EM, Radovanovic E, Goncalves MC, Ferreira OP, Muniz EC, Rubira AF |
232 - 240 |
Thermal desorption from surfaces with laser-induced defects Szabelski P, Panczyk T, Rudzinski W |
241 - 251 |
Nano-dot formation using self-assembled 3-mercaptopropionic acid thin films prepared by facile atmospheric-vapor-adsorption method on Au(111) Nakamura T, Kimura R, Sakai H, Abe M, Kondoh H, Ohta T, Matsumoto M |
252 - 260 |
Characterization of complex (B + C) diffusion layers formed on chromium and nickel-based low-carbon steel Pertek A, Kulka M |
261 - 265 |
X-ray photoelectron spectroscopy studies of Ag-doped thin amorphous GexSb40-xS60 films Debnath RK, Fitzgerald AG, Christova K |
266 - 271 |
Characteristics of ZnO/Si prepared by Zn3P2 diffusion Ko YD, Jung J, Bang KH, Park MC, Huh KS, Myoung JM, Yun I |
272 - 282 |
Femtosecond laser irradiation of indium phosphide in air: Raman spectroscopic and atomic force microscopic investigations Bonse J, Wrobel JM, Brzezinka KW, Esser N, Kautek W |
283 - 288 |
The adsorption of nitrogen oxides and water on rare-earth ion-exchanged ZSM-5: a density functional study Luo Y, Wan XH, Ito Y, Takami S, Kubo M, Miyamoto A |
289 - 294 |
Field electron emission from LaB6 and TiN emitter arrays fabricated by transfer mold technique Nakamoto M, Fukuda K |
295 - 300 |
Investigation of preparation and characterization of GaN films on sapphire (0001) substrates Yang YG, Ma HL, Xue CS, Zhuang HZ, Hao XT, Ma J |