193 - 199 |
XPS analysis of surface compositional changes in InSb1-xBix (111) due to low-energy Ar+ ion bombardment Iwanowski RJ, Heinonen MH, Raczynska J, Fronc K |
200 - 210 |
Relief gratings on Er/Yb-doped borosilicate glasses and waveguides by excimer laser ablation Pissadakis S, Reekie L, Hempstead M, Zervas MN, Wilkinson JS |
211 - 217 |
Copper electroless deposition on NiTi shape memory alloy: an XPS study of Sn-Pd-Cu growth Silvain JF, Chazelas J, Trombert S |
218 - 222 |
Protonic conductivity of Pt/Al2O3 in hydrogen- and water-containing atmospheres Stoica M, Caldararu M, Ionescu NI, Auroux A |
223 - 234 |
Study of atomic layer epitaxy of zinc oxide by in-situ quartz crystal microgravimetry Yousfi EB, Fouache J, Lincot D |
235 - 239 |
The presence of droplets in pulsed laser deposition of aluminum with capillary ablation targets Andreic Z, Aschke L, Kunze HJ |
240 - 244 |
Detection of As2O3 arsenic oxide on GaAs surface by Raman scattering Quagliano LG |
245 - 258 |
Lead deposition onto fractured vitreous carbon: influence of electrochemical pretreated electrode Sosa E, Carreno G, Ponce-De-Leon C, Oropeza MT, Morales M, Gonzalez I, Batina N |
259 - 267 |
The effect of CO and O-2 on hydrogen permeation through a palladium membrane Amandusson H, Ekedahl LG, Dannetun H |
268 - 274 |
Spin-lattice relaxation of Si-29 near porous silicon surface Tsuboi T, Sakka T, Mabuchi M, Ogata YH |