| 327 - 330 |
Thermal stability of cluster arrays of group III elements on Si(III) surface
Li JC, Jiang Q |
| 331 - 334 |
Surface roughness of GaN and thin AlGaN layers grown by molecular beam epitaxy
Liu XY, Andersson TG |
| 335 - 340 |
Microcontact printing with octadecanethiol
Bass RB, Lichtenberger AW |
| 341 - 346 |
High temperature Si(001) surface defect evolution during extended annealing: experimental results and modelling
Barge D, Pichaud B, Joly JP |
| 347 - 354 |
Pulsed laser deposition of PLZT films: structural and optical characterization
Gaidi M, Amassian A, Chaker M, Kulishov M, Martinu L |
| 355 - 370 |
Structural characterization for Er3+-doped oxide materials potentially useful as optical devices
Mignotte C |
| 371 - 377 |
Surface evolution and dynamic scaling of sputter-deposited Al thin films on Ti(100) substrates
Liu ZJ, Shen YG, He LP, Fu T |
| 378 - 386 |
Texture analysis of Al-doped ZnO thin films prepared by in-line reactive MF magnetron sputtering
Hong RJ, Helming K, Jiang X, Szyszka B |
| 387 - 392 |
Carbon nanometer films prepared by plasma-based ion implantation on single crystalline Si wafer
Liao JX, Liu WM, Xu T, Xue QJ |
| 393 - 404 |
TiO2 atomic layer deposition on ZrO2 particles using alternating exposures of TiCl4 and H2O
Ferguson JD, Yoder AR, Weimer AW, George SM |
| 405 - 411 |
Structural properties of Cu clusters on the O-terminated ZnO (000(1)over-bar) surface
Ay M, Nefedov A, Remhof A, Zabel H |
| 412 - 421 |
Characterization of diamond-like carbon (DLC) films deposited by a magnetron-sputter-type negative ion source (MSNIS)
Paik N |
| 422 - 426 |
Reduction and morphology of silver nanoparticles via liquid-liquid method
Cai MM, Chen JL, Zhou J |
