Electrochemical and Solid State Letters

Electrochemical and Solid State Letters, Vol.12, No.10 Entire volume, number list

ISSN: 1099-0062 (Print)

In this Issue (26 articles)

C25 - C27	Breakdown Kinetics at Nanostructure Defects of Passive Films Seyeux A, Maurice V, Marcus P
D77 - D79	"Electroless" E-Coating: An Innovative Surface Treatment for Magnesium Alloys Song GL
D80 - D83	The Effect of Precursor Ligands on the Deposition Characteristics of Ru Films by MOCVD Kawano K, Kosuge H, Oshima N, Funakubo H
F29 - F30	Absolute Potentials of the Hydrogen Electrode and of AqueousRedox Couples Heyrovska R
G57 - G60	Crystallographic Effects on Nanoscale Electrical Properties of Ultrathin Lanthanum Aluminate Films Liang YC
G61 - G64	Multiferroic and Fatigue Behavior of (Bi0.90La0.10)FeO3/CoFe2O4/(Bi0.90La0.10)FeO3 Sandwich Structure Wu JG, Wang J
G65 - G68	Room-Temperature Cosputtered HfO2-Al2O3 Multicomponent Gate Dielectrics Pei ZL, Pereira L, Goncalves G, Barquinha P, Franco N, Alves E, Rego AMB, Martins R, Fortunato E
J93 - J95	Coplanar ZnO Thin-Film Transistor Using Boron Ion Doped Source/Drain Contacts Avis C, Kim SH, Hur JH, Jang J, Milne WI
J96 - J99	Structural Properties and Sensing Characteristics of Thin Nd2O3 Sensing Films for pH Detection Pan TM, Lin CW, Lin JC, Wu MH
A199 - A201	Electrospinning Preparation of Nanosilicon/Disordered Carbon Composite as Anode Materials in Li-Ion Battery Fan X, Zou L, Zheng YP, Kang FY, Shen WC
B141 - B143	Analysis of the Electronic and Ionic Conductivity of Calcium-Doped Lanthanum Ferrite Zink PA, Yoon KJ, Pal UB, Gopalan S
B144 - B145	Scanning Probe Microscopy at 650 degrees C in Air Hansen KV, Jacobsen T, Norgaard AM, Ohmer N, Mogensen M
B146 - B149	Determination of Chromium Concentration in Solid Oxide Fuel Cell Cathodes: (La,Sr)MnO3 and (La,Sr)FeO3 Horita T, Xiong YP, Yoshinaga M, Kishimoto H, Yamaji K, Brito ME, Yokokawa H
H353 - H356	Methane Exposure on the Aluminum Nitride Gate Dielectric in Pentacene-Based Organic Thin-Film Transistors Chou CW, Zan HW, Wang CH, Chen WT, Tsai LS, Wang WC, Hwang JC
H357 - H360	AlInGaN Metal-Insulator-Semiconductor Photodetectors at UV-C 280 nm Lee HC, Su YK, Lin JC, Cheng YC, Wu SL, Jhou YD
H361 - H364	Electrical Characteristics of High Performance SPC and MILC p-Channel LTPS-TFT with High-kappa Gate Dielectric Ma MW, Chiang TY, Yeh CR, Chao TS, Lei TF
H365 - H368	InGaN-Based Light-Emitting Diodes with a Multiple-Air-Gap Layer Lin CF, Yang CC, Lin CM, Chen KT, Hu CW, Tsay JD
H369 - H372	GaN MSM Photodetectors with a Semi-Insulating AlInN Cap Layer and Sputtered ITO Transparent Electrodes Weng WY, Chuang RW, Chang SJ, Lai WC, Hsueh TJ, Shei SC, Zeng XF, Wu SL
H373 - H375	Mechanism of Thermal Silicon Oxide Direct Wafer Bonding Ventosa C, Morales C, Libralesso L, Fournel F, Papon AM, Lafond D, Moriceau H, Penot JD, Rieutord F
H376 - H377	The Effect of NH3 on the Interface of HfO2 and Al2O3 Films on GaAs(100) Surfaces Suh DC, Cho YD, Lee Y, Ko DH, Chung KB, Cho MH
H378 - H380	Ge2Sb2Te5 Charge Trapping Nanoislands with High-k Blocking Oxides for Charge Trap Memory Eom T, Choi BJ, Choi S, Park TJ, Kim JH, Seo M, Rha SH, Hwang CS
H381 - H384	Perfect Conformal Deposition of Electroless Cu for High Aspect Ratio Through-Si Vias Inoue F, Harada Y, Koyanagi M, Fukushima T, Yamamoto K, Tanaka S, Wang Z, Shingubara S
H385 - H387	Improvement in the Performance of Tin Oxide Thin-Film Transistors by Alumina Doping Huh MS, Yang BS, Oh S, Lee J, Yoon K, Jeong JK, Hwang CS, Kim HJ
H388 - H391	High Efficiency Silicon Solar Cells with Bilayer Passivation Structure Sun WC, Chang WL, Chen CH, Du CH, Wang TY, Wang T, Lan CW
H392 - H394	CVD Selective Epitaxial Lateral Overgrowth Technique for 3D Stacked SRAM Cell on SOI-Like Silicon Films Jung SM, Lim H, Kim K
H395 - H397	Interface Characterization of Cobalt Contacts on Bismuth Selenium Telluride for Thermoelectric Devices Gupta RP, Iyore OD, Xiong K, White JB, Cho K, Alshareef HN, Gnade BE