B35 - B37 |
Anomalous corrosion behavior of stainless steels under SOFC interconnect exposure conditions Yang ZG, Walker MS, Singh P, Stevenson JW |
B38 - B41 |
Al2O3 film dissolution in aqueous chloride solutions Boxley CJ, Watkins JJ, White HS |
B42 - B45 |
Growth and characterization of a porous aluminum oxide film formed on an electrically insulating support Miney PG, Colavita PE, Schiza MV, Priore RJ, Haibach FG, Myrick ML |
E23 - E26 |
Scanning electrochemical microscopy for investigating gas bubble/liquid interfaces Gabrielli C, Huet F, Keddam M, Rousseau P, Vivier V |
E27 - E29 |
Effects of cationic species on strain changes of polypyrrole doped with perchlorate anions Joo J, Pyo M |
E30 - E33 |
Constrained variation calculations of electron-transfer transition states using the Lagrange method Kostadinov LN, Anderson AB |
F31 - F33 |
Inductively coupled plasma deposited silicon oxycarbide interlayers Tsai KC, Shieh JM, Dai BT |
F34 - F36 |
Characterization of temperature dependence for HfO2 gate dielectrics treated in NH3 plasma Wang JC, Shie DC, Lei TF, Lee CL |
H21 - H23 |
Fabrication of nanoporous WO3 membranes and their electrochromic properties Nishio K, Iwata K, Masuda H |
A207 - A209 |
Effect of surface carbon structure on the electrochemical performance of LiFePO4 Doeff MM, Hu YQ, McLarnon F, Kostecki R |
A210 - A213 |
Capacitive characteristics of binary manganese-nickel oxides prepared by anodic deposition Chen YS, Hu CC |
A214 - A217 |
Highly mesoporous carbon electrodes for electric double-layer capacitors Tamai H, Kouzu M, Morita M, Yasuda H |
A218 - A220 |
Electrodeposited Sn-Ni alloy film as a high capacity anode material for lithium-ion secondary batteries Mukaibo H, Sumi T, Yokoshima T, Momma T, Osaka T |
C141 - C142 |
Effect of iodine and cobalt on MOCVD Cu film growth Ko YK, Seo BS, Park DS, Yang HJ, Lee WH, Reucroft PJ, Lee JG |
C143 - C145 |
Seedless superfill: Copper electrodeposition in trenches with ruthenium barriers Josell D, Wheeler D, Witt C, Moffat TP |
C146 - C148 |
High-field FMR investigation of epitaxially grown Fe4N films on a MgO(001) substrate Nakamura T, Takahashi T, Takahashi N, Kato T, Furukawa K, Smith GM, Oates CJ, Riedi PC |
G117 - G118 |
Technique for large elevation of source/drain using implantation mediated selective etching Huda MQ, Sakamoto K, Tanoue H |
G119 - G121 |
Effects of oxide thickness and gate length on DC performance of submicrometer MgO/GaN MOSFETs Cho H, Lee KP, Gila BP, Abernathy CR, Pearton SJ, Ren F |
G122 - G125 |
High thermal stability of Ni monosilicide from Ni-Ta alloy films on Si(100) Kim MJ, Choi HJ, Ko DH, Ku JH, Choi SY, Fujihara K, Yang CW |
G126 - G129 |
Removal of shallow and deep scratches and pits from polished copper films Hegde S, Babu SV |