F5 - F7 |
Highly Zr4+ Ion-Conducting Solid Electrolytes Tamura S, Itano T, Nunotani N, Imanaka N |
G9 - G12 |
Deuterium Trapping at the Pt/HfO2 Interface Driemeier C, Kanter MM, Miotti L, Soares GV, Baumvol IJR |
S7 - S7 |
Anion Exchange Membrane Fuel Cells: Experimental Comparison of Hydroxide and Carbonate Conductive Ions (vol 12, B27, 2009) Unlu M, Zhou JF, Kohl PA |
A61 - A65 |
Reversible Insertion Properties of Zinc Ion into Manganese Dioxide and Its Application for Energy Storage Xu CJ, Du HD, Li BH, Kang FY, Zeng YQ |
A66 - A68 |
Electrochemical Properties of a Copper Fluorophosphate Electrode Material Fabricated By Mechanochemical Synthesis Skrzypczak A, Badway F, Amatucci GG |
A69 - A72 |
Lithium Difluoro(oxalato)borate as Additive to Improve the Thermal Stability of Lithiated Graphite Chen ZH, Qin Y, Liu J, Amine K |
A73 - A75 |
Reinvestigation of Li1-xTiyV1-yS2 Electrodes in Suitable Electrolyte: Highly Improved Electrochemical Properties Kim Y, Goodenough JB |
A76 - A80 |
Hierarchical and Resilient Conductive Network of Bridged Carbon Nanotubes and Nanofibers for High-Energy Si Negative Electrodes Lestriez B, Desaever S, Danet J, Moreau P, Plee D, Guyomard D |
A81 - A83 |
Advantages of Simultaneous Substitution of Co in Li[Ni1/3Mn1/3Co1/3]O-2 by Ni and Al Zhou F, Zhao XM, Jiang JW, Dahn JR |
A84 - A87 |
Organically Soluble Bifunctional Polyaniline-Magnetite Composites for Sensing and Supercapacitor Applications Radhakrishnan S, Prakash S, Rao CRK, Vijayan M |
A88 - A90 |
Thermal and Electrochemical Performance of Binary Molten Salt Electrolyte Based on LiTFSI and CF3SO3K Ma CA, Tu XH, Chu YQ, Zhao FM, Zhu YH |
A91 - A94 |
Crystallite Size Control and Resulting Electrochemistry of Magnetite, Fe3O4 Zhu SL, Marschilok AC, Takeuchi ES, Takeuchi KJ |
B53 - B56 |
Optimal Effective Diffusion Coefficient of Oxygen in the Cathode Catalyst Layer of Polymer Electrode Membrane Fuel Cells Kulikovsky AA |
B57 - B60 |
Series Connection of Thick-Film (< 20 mu m) Electrolyte-Supported Solid Oxide Fuel Cells Joo JH, Choi GM |
D19 - D21 |
Effect of Organosilane Underlayers on the Effectiveness of NiB Barrier Layers in ULSI Metallization Yoshino M, Aramaki H, Matsuda I, Okinaka Y, Osaka T |
D22 - D26 |
Stain Etching with Fe(III), V(V), and Ce(IV) to Form Microporous Silicon Dudley ME, Kolasinski KW |
D27 - D31 |
Suppressor Effects during Copper Superfilling of Sub-100 nm Lines Huang Q, Baker-O'Neal BC, Kelly JJ, Broekmann P, Wirth A, Emnet C, Martin M, Hahn M, Wagner A, Mayer D |
G13 - G15 |
Atomic Layer Deposition of Lanthanum-Based Ternary Oxides Wang HT, Wang JJ, Gordon R, Lehn JSM, Li HZ, Hong D, Shenai DV |
H89 - H91 |
n-Type Cu2O by Electrochemical Doping with Cl Han XF, Han KH, Tao M |
H92 - H94 |
Pt Nanocrystals Embedded in Remote Plasma Atomic-Layer-Deposited HfO2 for Nonvolatile Memory Devices Kim H, Woo S, Kim H, Bang S, Kim Y, Choi D, Jeon H |
H95 - H97 |
Characteristics and Cleaning of Dry-Etching-Damaged Layer of Amorphous Oxide Thin-Film Transistor Kim CJ, Park J, Kim S, Song I, Kim S, Park Y, Lee E, Anass B, Park JS |
H98 - H100 |
Structure and Optical Properties of ZnO/NiSi/Si Ren W, Hao G, Chi DZ |
J37 - J39 |
No-Bias-Bend Liquid-Crystal Display with an Intermediate Angle on Blended Polyimide via Ion-Beam Irradiation Park HG, Oh BY, Kim YH, Kim BY, Han JM, Hwang JY, Seo DS |
J40 - J43 |
Fabrication of Mesostructured Cobalt Oxide Sensor and Its Application for CO Detector Liu CY, Chen CF, Leu JP |
J44 - J46 |
CaAl2O4:Eu2+,Nd3+,Sr2+: A White-Light Phosphor with Yellow-Green Long Afterglow Xu XH, Wang YH, Gong Y, Li YQ |
J47 - J49 |
Molybdenum-Doped Zinc Oxide Electrodes for Organic Light-Emitting Devices Chun JY, Han JW, Seo DS |
K21 - K24 |
Enhanced Microwave Absorption in Nickel-Filled Multiwall Carbon Nanotubes in the S Band Narayanan TN, Sunny V, Shaijumon MM, Ajayan PM, Anantharaman MR |
K25 - K28 |
Atomic Layer Deposition of ZrO2 and HfO2 Nanotubes by Template Replication Gu DF, Baumgart H, Namkoong G, Abdel-Fattah TM |
K29 - K32 |
Rapid Thermal Annealing of Sputtered Silicon-Rich Oxide/SiO2 Superlattice Structure Silalahi STH, Yang HY, Pita K, Yu MB |
H101 - H104 |
High-Quality 150 mm InP-to-Silicon Epitaxial Transfer for Silicon Photonic Integrated Circuits Liang D, Bowers JE, Oakley DC, Napoleone A, Chapman DC, Chen CL, Juodawlkis PW, Raday O |
H105 - H108 |
Stress Adjustment and Bonding of H-Implanted 2 in. Freestanding GaN Wafer: The Concept of Double-Sided Splitting Moutanabbir O, Senz S, Scholz R, Christiansen S, Reiche M, Avramescu A, Strauss U, Gosele U |
H109 - H112 |
Fabrication of p-Type ZnO Thin Films Using rf-Magnetron Sputter Deposition Kim JK, Lim JW, Kim HT, Kim SH, Yun SJ |
H113 - H116 |
Size and Thickness Effect on the Local Strain Relaxation in Patterned Strained Silicon-on-Insulator Gu DF, Zhu MY, Celler GK, Baumgart H |
H117 - H119 |
Evaluation and Control of Strain in Si Induced by Patterned SiN Stressor Ogura A, Saitoh H, Kosemura D, Kakemura Y, Yoshida T, Takei M, Koganezawa T, Hirosawa I, Kohno M, Nishita T, Nakanishi T |
H120 - H122 |
Simultaneous Control of the Work Function and Interfacial Oxide Thickness Using Ni/Hf Stacked Electrode on HfO2 Lee MS, An CH, Park K, Kim H |
H123 - H126 |
Performance Improvement of Metal-Insulator-Metal Capacitors Using Postmetallization-Annealed Treatment on the Al2O3/TiO2/Al2O3 Film Huang CC, Cheng CH, Lee K, Liou BH |
H127 - H130 |
Method for Quantifying the Degree of Agglomeration in Highly Stable Chemical Mechanical Polishing Slurries Chang FC, Singh RK |
H131 - H134 |
Effects of Anneal and Silicon Interface Passivation Layer Thickness on Device Characteristics of In0.53Ga0.47As Metal-Oxide-Semiconductor Field-Effect Transistors Zhu F, Zhao H, Ok I, Kim HS, Yum J, Lee JC, Goel N, Tsai W, Gaspe CK, Santos MB |
H135 - H137 |
Influence of Crystalline Constituent on Resistive Switching Properties of TiO2 Memory Films Chang WY, Ho YT, Hsu TC, Chen F, Tsai MJ, Wu TB |
H138 - H141 |
Low Temperature Wafer Bonding by Copper Nanorod Array Wang PI, Lee SH, Parker TC, Frey MD, Karabacak T, Lu JQ, Lu TM |
H142 - H144 |
Low-Defect-Density Ge Epitaxy on Si(001) Using Aspect Ratio Trapping and Epitaxial Lateral Overgrowth Park JS, Curtin M, Hydrick JM, Bai J, Li JT, Cheng Z, Carroll M, Fiorenza JG, Lochtefeld A |
H145 - H148 |
Dual-Gate InGaZnO Thin-Film Transistors with Organic Polymer as a Dielectric Layer Choi JH, Seo HS, Myoung JM |
H149 - H150 |
InP Layer Transfer with Masked Implantation Chen WN, Bandaru P, Tang CW, Lau KM, Kuech TF, Lau SS |
H151 - H154 |
Structural Stability and Phase-Change Characteristics of Ge2Sb2Te5/SiO2 Nano-Multilayered Films Jang MH, Park SJ, Lim DH, Cho MH, Kim YK, Yi HJ, Kim HS |
H155 - H159 |
Electric-Field-Induced Mass Movement of Ge2Sb2Te5 in Bottleneck Geometry Line Structures Nam SW, Lee D, Kwon MH, Kang DM, Kim C, Lee TY, Heo S, Park YW, Lim K, Lee HS, Wi JS, Yi KW, Khang Y, Kim KB |