Journal of Adhesion Science and Technology, Vol.14, No.14, 1801-1812, 2000
Determining the interphase thickness and properties in polymer matrix composites using phase imaging atomic force microscopy and nanoindentation
In polymer matrix composites, the interface between the reinforcing phase and the bulk phase is paramount to the overall performance of the composite as a structural material. This interface is now thought to be a distinct, three-dimensional phase surrounding the reinforcing phase called the interphase. The developments of the atomic force microscope and nanoindentation devices have facilitated the investigation of the interphase. Previously, force modulation atomic force microscopy (AFM) and nanoindentation were the primary methods used to determine the size of the interphase and its stiffness relative to the bulk phase. The present investigation utilized phase imaging AFM and nanoindentation to examine the interphase in a glass fiber-reinforced epoxy matrix composite. Nanoindentation experiments indicated that the relatively stiff fiber might have caused a gradient in the modulus across the interphase region. Specifically, the modulus next to the fiber approached that of the fiber and decreased to that of the bulk polymer as the distance away from the fiber increased. Once the fiber was removed by chemical etching, this gradient reversed itself; hence, nanoindentation, due to the fiber bias, was not found to be adequate for measuring actual interphase properties. It was found that phase imaging AFM was a highly useful tool for probing the interphase, because it involves much lower interaction forces between the probe and the sample than force modulation or nanoindentation. The interphase in the model composite investigated was found to be softer than the bulk phase with a thickness of 2.4-2.9 mum, and was independent of fiber silane pretreatment, for silane pretreatments between 0.1% and 5.0% (initial aqueous concentration).
Keywords:interphase;polymer matrix composites;atomic force microscopy (AFM);phase imaging;nanoindentation