In this paper recent progress in micro/nano-particle manipulation and particle-substrate adhesion studies is reviewed. Various particle manipulation and particle-substrate adhesion measurement techniques are summarized. An atomic force microscope (AFM) is the most commonly used tool for particle manipulation, and there are also some custom-made devices that employ different interactions such as van der Waals, electrostatic and capillary forces to manipulate micro/nano-particles. In particle-substrate adhesion study, the contact-based measurement techniques such as pull-off test and lateral push test explore the adhesion between a single particle and a substrate, while non-contact adhesion measurement techniques such as electric field detachment and centrifugal detachment methods simultaneously explore the adhesion properties of a group of particles. Also reviewed are recent studies on factors that affect the particle-substrate adhesion, including surface roughness, electrostatic charge and relative humidity. (C) Koninklijke Brill NV, Leiden, 2008.