The thermal conductivity at (220 to 480) K of anodic alumina film of (1.4 to 5) mu m thick and about 30 % porosity, which is grown from aluminum foil, is reported. A laser flash technique was employed to carry out measurements of thermal diffusivity of layered anodic aluminum specimen, while the effective thermal conductivity of anodic alumina film was determined using a two-layered model, which is 1.22 W.m(-1).K(-1) at 220 K and 1.71 W.m(-1).K(-1) at 480 K. Agreement in the overlapping temperature range (220 to 300) K with the measurements of Chen is found. The results showed that the thermal conductivity of anodic alumina films has a temperature dependence of amorphous solids, and the apparent thickness dependence of thermal conductivity is not found for anodic alumina films.