CexY1-xTiTaO6 ceramics were prepared through the solid-state ceramic route. The materials were sintered in the range 1520-1580 degrees C. The structure of the system was analyzed by X-ray diffraction and Raman spectroscopic methods. The cell parameters of solid solutions were calculated using the least square method. The microstructure was analyzed using scanning electron microscopy. The dielectric constant (epsilon(r)), temperature coefficient of resonant frequency (tau(f)) and the unloaded quality factor (Q(u)) are measured in the microwave frequency region using cavity resonator method. The dielectric constant increases with higher concentrations of Ce in the solid solutions. Nearly zero temperature coefficient of resonant frequency (tau(f)) was obtained for Ce0.24Y0.76TiTaO6. The samples are of high quality factor and are useful electronic materials for microwave applications. (C) 2008 Elsevier Ltd. All rights reserved.