Influence of front TCO thickness, surface texture and different back reflectors on short-circuit current density and fill factor of thin film silicon solar cells were investigated. For the front TCO studies, we used ZnO layers of different thickness and applied wet chemical etching in diluted HCl. This approach allowed us to adjust ZnO texture and thickness almost independently. Additionally, we used optical modeling to calculate optical absorption losses in every layer. Results show that texture and thickness reduction of front ZnO increase quantum efficiency over the whole spectral range. The major gain is in the red/IR region. However, the higher sheet resistance of the thin ZnO causes a reduction in fill factor. In the back reflector studies, we compared four different back reflectors: ZnO/Ag, Ag, ZnO/Al and Al. ZnO/Ag yielded the best, Al the worst light trapping properties. Furthermore, the Ag back contact turned out to be superior to ZnO/Al for microcrystalline cells. Finally, the smooth ZnO/Ag back contact showed a higher reflectivity than the rough one. We prepared pin cells with rough and smooth ZnO/Ag interface, leaving the roughness of all other interfaces unchanged. (C) 2004 Elsevier B.V. All rights reserved.