Low dimensional nanostructures of YTaO4:Nb thin films were deposited on Si (100) substrate using pulsed laser deposition (lambda= 193 nm) at room temperature. X-ray Diffraction, Scanning Electron Microscopy and Transmission Electron Microscopy analysis revealed the nanocrystalline nature of YTaO4:Nb film consisting of grains of 20-40 nm in size. The photoluminescence spectra measured on the films confirmed the luminescence characteristics of YTaO4:Nb powders, the emission peak appeared shifted as compared to the luminescence spectrum of the bulk target. The spectral shift is about 15 nm and is correlated to the nanocrystalline nature of the film. (C) 2008 Elsevier B.V. All rights reserved.