Thin Solid Films, Vol.517, No.1, 110-112, 2008
Impact of Ge fraction modulation upon electrical characteristics of hole resonant tunneling diodes with Si/Strained Si(1-x)Ge(x)/Si(100) heterostructure
In order to improve p-type resonant tunneling diodes (RTD) with Si/strained Si(0.8)Ge(0.2) heterostructures epitaxially grown on Si(100), effectiveness of Ge fraction modulation in the quantum well and a part of spacers was investigated. It was found that increase of the Ge fraction up to x=0.30-0.42 effectively improves RTD characteristics even at high temperatures around 200 K (C) 2008 Elsevier B.V. All rights reserved.
Keywords:Resonant tunneling diode (RTD);Quantum well;SiGe;Si;Strain;Heterostructure;Negative differential conductance (NDC)