We have measured the X-ray resonant magnetic scattering at the 2p edge of Mn in diluted magnetic semiconductor Mn(0.06)Ge(0.94)/Ge(001)2 x 1 thin films. Large magnetic effects in the resonant reflectivity were observed over a wide temperature range. The asymmetry ratio of the magnetic scattering increases with increasing temperature, in accordance to the temperature dependence of the magnetization obtained from SQUID measurements. This is attributed to the contribution of ferromagnetic Mn(5)Ge(3) nanoclusters present in the Mn(0.06)Ge(0.94) film. (C) 2008 Elsevier B.V. All rights reserved.