Time-resolved microscopic optical second harmonic generation (TRM-SHG) imaging was employed to study a transient charge accumulation in top-contact pentacene field effect transistor (FET) with Ag electrodes. It was demonstrated that the SHG signal at the edge of the Ag electrode decayed but remained in a steady state depending on biasing condition. An electric field formed in pentacene layer below Ag electrode activates the SHG, indicating the insufficient accumulation of injected carriers in the FET channel. By using the TRM-SHG technique transient change of the carrier density in the OFET is obtained. (C) 2009 Elsevier B.V. All rights reserved.