Thin Solid Films, Vol.518, No.4, 1326-1331, 2009
Annealing effects on the structural, electrical and H-2 sensing properties of transparent ZnO thin films, grown by pulsed laser deposition
Transparent zinc oxide thin films were grown by reactive pulsed laser deposition on glass substrates. The substrates were kept at 200 degrees C constant temperature. Post-deposition heat treatment, applied to further promote crystallization and overcome any oxygen deficiency, yielded transparent thin films. Structural investigations carried out by atomic force microscopy (AFM) and X-ray diffraction (XRD), have shown a strong influence of deposition technique parameters and post-annealing on the crystallinity of the zinc oxide films. The gas sensing characteristics of these films were investigated towards different hydrogen concentrations (5000-30,000 ppm) at a selected operating temperature within the 150-230 degrees C range. (C) 2009 Elsevier B.V. All rights reserved.
Keywords:Zinc oxide (ZnO);Pulsed laser deposition (PLD);Heat treatment;Hall effect;Atomic force microscopy (AFM);Structural properties;Sensors;Hydrogen