Thin Solid Films, Vol.518, No.13, 3526-3530, 2010
SiO2 film deposition on the inner wall of a narrow polymer tube by a capacitively coupled mu plasma
SiO2 thin films were deposited on the inner wall of a narrow commercial poly(propylene) tube with inner/outer diameters of 1.0 mm/3.0 mm by plasma-enhanced chemical vapor deposition using He or Ar carrier gases and tetraethoxysilane (TEOS)/O-2 feedstock gases at high pressures from 30 kPa to atmospheric pressure and at room temperature. A glow miasma was generated inside the tube by a radio frequency (RF 13.56 MHz) capacitively coupled discharge. X-ray photoelectron spectra and infrared spectra revealed that the inner surface of the plasma-treated tube was covered by a SiO2 film. Scanning electron microscopy images indicated that the film produced by He/TEOS/O-2 mu plasma had a smooth surface whereas the surface of the film produced by Ar/TEOS/O-2 mu plasma appeared granulated. Typical deposition rates of approximately 300 nm/min were obtained by He/TEOS/O-2 mu plasma at atmospheric pressure and a RF power of 11 W. (C) 2009 Elsevier B.V. All rights reserved.
Keywords:Plasma processing and deposition;mu plasma;High pressure plasma;SiO2 films;Poly(propylene) tube