Single crystal-like CdTe thin film has been grown by metalorganic chemical vapor deposition on cube-textured Ni(100) substrate. Using X-ray pole figure measurements we observed the epitaxial relationship of {111}(CdTe)//{001}(Ni) with [1 (1) over bar0](CdTe)//[010](Ni) and [11 (2) over bar](CdTe)//[100](Ni). The 12 diffraction peaks in the (111) pole figure of CdTe film and their relative positions with respect to the four peak positions in the (111) pole figure of Ni substrate are consistent with four equivalent orientational domains of CdTe with three to four superlattice match of about 1.6% in the [1 (1) over bar0] direction of CdTe and the [010] direction of Ni. The electron backscattered diffraction images show that the CdTe domains are 30 degrees oriented from each other. These high structural quality films may find applications in low cost optoelectronic devices. (C) 2011 Elsevier B.V. All rights reserved.