Structural and microstructural characterization of Bi2Te3 films deposited by the close space vapor transport method using scanning electron microscopy and X-ray diffraction techniques

Cruz-Gandarilla F; Vigil-Galan O; Cabanas-Moreno JG; Sastre-Hernandez J; Roy F

Thin Solid Films, Vol.520, No.11, 3865-3870, 2012

DOI10.1016/j.tsf.2012.01.023 Export Citation

Structural and microstructural characterization of Bi2Te3 films deposited by the close space vapor transport method using scanning electron microscopy and X-ray diffraction techniques

Cruz-Gandarilla F, Vigil-Galan O, Cabanas-Moreno JG, Sastre-Hernandez J, Roy F

We report the structural and microstructural features of Bi2Te3 films deposited by close space vapor transport (CSVT) technique on soda-lime glass substrates. Different phases are obtained depending on the substrate temperature, as well as changes in the thermoelectric properties of the CSVT-Bi2Te3 films. The relationship between the structural and electrical properties of the films is present. (c) 2012 Elsevier B.V. All rights reserved.

Keywords:Close space vapor transport;Bismuth telluride;Crystal microstructure;Texture;Thermoelectric properties;X-ray diffraction