Previous Article Next Article Table of Contents Advanced Materials, Vol.25, No.40, 5719-5719, 2013 DOI10.1002/adma.201300958 Export Citation Mapping of Trap Densities and Hotspots in Pentacene Thin-Film Transistors by Frequency-Resolved Scanning Photoresponse Microscopy Westermeier C, Fiebig M, Nickel B Please enable JavaScript to view the comments powered by Disqus.
